Patents by Inventor NICOLE MAASS

NICOLE MAASS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220113809
    Abstract: A command communication facility is described. The command communication facility includes a sensor unit for detecting a movement of an operator; a fixing unit for securing the sensor unit to the operator; an evaluation unit for evaluating the detected movement of the operator and for identifying a command based upon the detected movement; and a command communication unit for transmitting a control command to a medical facility that is to be operated based upon the identified command. A command communication system is also described. An operating system is also described. A command communication method is also described.
    Type: Application
    Filed: October 5, 2021
    Publication date: April 14, 2022
    Applicant: Siemens Healthcare GmbH
    Inventors: Volker DIETZ, Tobias LEIS, Marcel RUF, Jennifer JONES, Steffen DITTRICH, Milena LIMPERT, Nicole MAASS, Steffen RIESS
  • Patent number: 10194884
    Abstract: A method for reducing image artifacts caused, for example, by beam hardening includes acquiring at least two projections of a transirradiated object are acquired from different perspectives by an X-ray emitter and an X-ray detector defining a projection plane. A correction model that is linear in parameters and is valid for the at least two projections is determined. At least two epipolar lines corresponding to a common epipolar plane are identified in the projection planes of the at least two projections. The parameters of the correction model are determined by optimization, taking account of data terms that are independent of the parameters. The data terms quantify a consistency condition of the at least two projections that applies to the epipolar lines. Artifact-reduced image data is determined based on the determined parameters.
    Type: Grant
    Filed: January 10, 2018
    Date of Patent: February 5, 2019
    Assignee: Siemens Healthcare GmbH
    Inventors: Nicole Maaß, Andreas Maier, Tobias Würfl
  • Publication number: 20180192985
    Abstract: A method for reducing image artifacts caused, for example, by beam hardening includes acquiring at least two projections of a transirradiated object are acquired from different perspectives by an X-ray emitter and an X-ray detector defining a projection plane. A correction model that is linear in parameters and is valid for the at least two projections is determined. At least two epipolar lines corresponding to a common epipolar plane are identified in the projection planes of the at least two projections. The parameters of the correction model are determined by optimization, taking account of data terms that are independent of the parameters. The data terms quantify a consistency condition of the at least two projections that applies to the epipolar lines. Artifact-reduced image data is determined based on the determined parameters.
    Type: Application
    Filed: January 10, 2018
    Publication date: July 12, 2018
    Inventors: Nicole Maass, Andreas Maier, Tobias Würfl
  • Patent number: 10012602
    Abstract: A mathematical scattered radiation model with a number of parameters is specified. A test object is scanned with an X-ray system to generate a first raw dataset. The test object is scanned again to generate a second raw dataset, this time with an intermediary X-ray mask having at least one X-ray transparent region and at least one X-ray non-transparent region between the X-ray source and the test object. Parameter values are determined based on the first raw dataset and on the second raw dataset, and the scattered radiation model is calibrated with the parameter values. An examination object is scanned with the X-ray system to generate a third raw dataset and the third raw dataset is processed with the calibrated scattered radiation model to generate a corrected third raw dataset. A set of X-ray image data is generated from the examination object based on the corrected third raw dataset.
    Type: Grant
    Filed: October 16, 2017
    Date of Patent: July 3, 2018
    Assignee: Siemens Healthcare GmbH
    Inventors: Thomas Lang, Nicole Maass, Frank Dennerlein
  • Publication number: 20180106734
    Abstract: A mathematical scattered radiation model with a number of parameters is specified. A test object is scanned with an X-ray system to generate a first raw dataset. The test object is scanned again to generate a second raw dataset, this time with an intermediary X-ray mask having at least one X-ray transparent region and at least one X-ray non-transparent region between the X-ray source and the test object. Parameter values are determined based on the first raw dataset and on the second raw dataset, and the scattered radiation model is calibrated with the parameter values. An examination object is scanned with the X-ray system to generate a third raw dataset and the third raw dataset is processed with the calibrated scattered radiation model to generate a corrected third raw dataset. A set of X-ray image data is generated from the examination object based on the corrected third raw dataset.
    Type: Application
    Filed: October 16, 2017
    Publication date: April 19, 2018
    Inventors: THOMAS LANG, NICOLE MAASS, FRANK DENNERLEIN