Patents by Inventor Nicole S. Nembhard

Nicole S. Nembhard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Characterization of dielectric materials
    Patent number: 9689822
    Abstract: A system and a method for characterizing a dielectric material are provided. The system and method generally include applying an excitation signal to electrodes on opposing sides of the dielectric material to evaluate a property of the dielectric material. The method can further include measuring the capacitive impedance across the dielectric material, and determining a variation in the capacitive impedance with respect to either or both of a time domain and a frequency domain. The measured property can include pore size and surface imperfections. The method can still further include modifying a processing parameter as the dielectric material is formed in response to the detected variations in the capacitive impedance, which can correspond to a non-uniformity in the dielectric material.
    Type: Grant
    Filed: January 22, 2015
    Date of Patent: June 27, 2017
    Assignee: UT-Battelle, LLC
    Inventors: Danny J. King, Susan Babinec, Patrick L. Hagans, Lonnie C. Maxey, Edward A. Payzant, Claus Daniel, Adrian S. Sabau, Ralph B. Dinwiddie, Beth L. Armstrong, Jane Y. Howe, David L. Wood, III, Nicole S. Nembhard
  • CHARACTERIZATION OF DIELECTRIC MATERIALS
    Publication number: 20160216224
    Abstract: A system and a method for characterizing a dielectric material are provided. The system and method generally include applying an excitation signal to electrodes on opposing sides of the dielectric material to evaluate a property of the dielectric material. The method can further include measuring the capacitive impedance across the dielectric material, and determining a variation in the capacitive impedance with respect to either or both of a time domain and a frequency domain. The measured property can include pore size and surface imperfections. The method can still further include modifying a processing parameter as the dielectric material is formed in response to the detected variations in the capacitive impedance, which can correspond to a non-uniformity in the dielectric material.
    Type: Application
    Filed: January 22, 2015
    Publication date: July 28, 2016
    Inventors: Danny J. King, Susan Babinec, Patrick L. Hagans, Lonnie C. Maxey, Edward A. Payzant, Claus Daniel, Adrian S. Sabau, Ralph B. Dinwiddie, Beth L. Armstrong, Jane Y. Howe, David L. Wood, III, Nicole S. Nembhard