Patents by Inventor Niels de Jonge
Niels de Jonge has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12032582Abstract: A method and apparatus for estimating the cardinality of graph pattern queries using graph statistics and metadata is presented. In various embodiments, node and edge labels are used to compute estimates for graph patterns (bi-grams) and the estimates for these patterns as composed to provide cardinality estimates of longer paths. The computation of bi-grams is low cost and requires only minimal changes to the existing query planner in the existing database machinery to be useful. The resulting estimates are used during query execution to minimize the amount of work needed to complete a query and return a faithful and accurate answer to the user. The apparatus includes modules containing computer-executable instructions to perform the above method.Type: GrantFiled: July 13, 2023Date of Patent: July 9, 2024Assignee: Neo4j Sweden ABInventors: Niels de Jong, James Webber
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Publication number: 20240012824Abstract: A method and apparatus for estimating the cardinality of graph pattern queries using graph statistics and metadata is presented. In various embodiments, node and edge labels are used to compute estimates for graph patterns (bi-grams) and the estimates for these patterns as composed to provide cardinality estimates of longer paths. The computation of bi-grams is low cost and requires only minimal changes to the existing query planner in the existing database machinery to be useful. The resulting estimates are used during query execution to minimize the amount of work needed to complete a query and return a faithful and accurate answer to the user. The apparatus includes modules containing computer-executable instructions to perform the above method.Type: ApplicationFiled: July 13, 2023Publication date: January 11, 2024Inventors: Niels de Jong, James Webber
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Patent number: 11748362Abstract: A method and apparatus for estimating the cardinality of graph pattern queries using graph statistics and metadata is presented. In various embodiments, node and edge labels are used to compute estimates for graph patterns (bi-grams) and the estimates for these patterns as composed to provide cardinality estimates of longer paths. The computation of bi-grams is low cost and requires only minimal changes to the existing query planner in the existing database machinery to be useful. The resulting estimates are used during query execution to minimize the amount of work needed to complete a query and return a faithful and accurate answer to the user. The apparatus includes modules containing computer-executable instructions to perform the above method.Type: GrantFiled: December 1, 2022Date of Patent: September 5, 2023Assignee: Neo4j Sweden ABInventors: Niels de Jong, James Webber
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Publication number: 20230111646Abstract: A method and apparatus for estimating the cardinality of graph pattern queries using graph statistics and metadata is presented. In various embodiments, node and edge labels are used to compute estimates for graph patterns (bi-grams) and the estimates for these patterns as composed to provide cardinality estimates of longer paths. The computation of bi-grams is low cost and requires only minimal changes to the existing query planner in the existing database machinery to be useful. The resulting estimates are used during query execution to minimize the amount of work needed to complete a query and return a faithful and accurate answer to the user. The apparatus includes modules containing computer-executable instructions to perform the above method.Type: ApplicationFiled: December 1, 2022Publication date: April 13, 2023Inventors: Niels de Jong, James Webber
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Patent number: 11544280Abstract: A method and apparatus for estimating the cardinality of graph pattern queries using graph statistics and metadata is presented. In various embodiments, node and edge labels are used to compute estimates for graph patterns (bi-grams) and the estimates for these patterns as composed to provide cardinality estimates of longer paths. The computation of bi-grams is low cost and requires only minimal changes to the existing query planner in the existing database machinery to be useful. The resulting estimates are used during query execution to minimize the amount of work needed to complete a query and return a faithful and accurate answer to the user. The apparatus includes modules containing computer-executable instructions to perform the above method.Type: GrantFiled: December 18, 2019Date of Patent: January 3, 2023Assignee: Neo4j Sweden ABInventors: Niels de Jong, James Webber
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Patent number: 11499967Abstract: The present invention relates to a specific protein marker and to a method for identifying the statistical distribution of protein stoichiometry. Novel specific protein markers and methods for their detection are needed in order to clarify important biological questions. This objective is established by means of a specific protein marker comprising two (separate) units, of which the first unit comprises a molecule for specifically binding to a protein and at least one chemically coupled molecule for binding to the second unit, and the second unit comprises a surface-modified nanoparticle, said surface-modified nanoparticle having a surface coating comprising at least one molecule for binding to the first unit.Type: GrantFiled: June 12, 2015Date of Patent: November 15, 2022Assignee: LEIBNIZ-INSTITUT FUER NEUE MATERIALIEN GEMEINNUETZIGE GESELLSCHAFT MIT BESCHRAENKTER HAFTUNGInventors: Niels De Jonge, Diana B. Peckys
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Publication number: 20210191932Abstract: A method and apparatus for estimating the cardinality of graph pattern queries using graph statistics and metadata is presented. In various embodiments, node and edge labels are used to compute estimates for graph patterns (bi-grams) and the estimates for these patterns as composed to provide cardinality estimates of longer paths. The computation of bi-grams is low cost and requires only minimal changes to the existing query planner in the existing database machinery to be useful. The resulting estimates are used during query execution to minimize the amount of work needed to complete a query and return a faithful and accurate answer to the user. The apparatus includes modules containing computer-executable instructions to perform the above method.Type: ApplicationFiled: December 18, 2019Publication date: June 24, 2021Inventors: Niels de Jong, James Webber
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Patent number: 10319559Abstract: The disclosed subject matter relates to testing a sample by means of a particle beam microscope in which the sample is scanned in a point-wise manner by a focused beam of charged particles thereby generating imaging signals. The particle beam dose applied per scanning point is changed during scanning.Type: GrantFiled: September 6, 2016Date of Patent: June 11, 2019Inventors: Tim Dahmen, Niels de Jonge
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Patent number: 9966223Abstract: The invention relates to a device for correlative scanning transmission electron microscopy (STEM) and light microscopy. In order to create a device for correlative microscopy which enables an improved combination of light microscopy and STEM methods, a STEM detector (7) according to the invention is combined with a photo-optical lens (8). This detection device combines the efficient detection by means of STEM microscopy of materials having a high atomic number, for example specific nanoparticle markers in a specimen in a liquid, such as a cell, with simultaneous light microscopy.Type: GrantFiled: March 10, 2015Date of Patent: May 8, 2018Assignee: Leibniz-Institut Fuer Neue Materialien gemeinnuetzige GmbHInventor: Niels De Jonge
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Patent number: 9857320Abstract: The present invention relates to a device and a method for the stoichiometric analysis of samples. In order to study the spatial distribution of different proteins in the plasma membrane of a complete cell within a short time frame, a device and a method are proposed for the stoichiometric analysis of samples.Type: GrantFiled: June 18, 2015Date of Patent: January 2, 2018Assignee: LEIBNIZ-INSTITUT FUER NEUE MATERIALIEN GEMEINNUETZIGE GESELLSCHAFT MIT BESCHRAENKTER HAFTUNGInventors: Niels De Jonge, Diana B. Peckys
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Publication number: 20170154754Abstract: The disclosed subject matter relates to testing a sample by means of a particle beam microscope in which the sample is scanned in a point-wise manner by a focused beam of charged particles thereby generating imaging signals. The particle beam dose applied per scanning point is changed during scanning.Type: ApplicationFiled: September 6, 2016Publication date: June 1, 2017Inventors: Tim Dahmen, Niels de Jonge
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Patent number: 9207196Abstract: In one aspect, the present invention relates to a microfluidic chamber. In one embodiment, the microfluidic chamber has a first sub-chamber and at least one second sub-chamber. The first sub-chamber has a first window and a second window. Both the first window and the second window are transparent to electrons of certain energies. The second window is positioned substantially parallel and opposite to the first window defining a first volume therebetween. The first window and the second window are separated by a distance that is sufficiently small such that an electron beam that enters from the first window can propagate through the first sub-chamber and exit from the second window. The at least one second sub-chamber is in fluid communication with the first sub-chamber and has a second volume that is greater than the first volume of the first sub-chamber.Type: GrantFiled: November 17, 2011Date of Patent: December 8, 2015Assignee: VANDERBILT UNIVERSITYInventor: Niels De Jonge
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Publication number: 20120120226Abstract: In one aspect, the present invention relates to a microfluidic chamber. In one embodiment, the microfluidic chamber has a first sub-chamber and at least one second sub-chamber. The first sub-chamber has a first window and a second window. Both the first window and the second window are transparent to electrons of certain energies. The second window is positioned substantially parallel and opposite to the first window defining a first volume therebetween. The first window and the second window are separated by a distance that is sufficiently small such that an electron beam that enters from the first window can propagate through the first sub-chamber and exit from the second window. The at least one second sub-chamber is in fluid communication with the first sub-chamber and has a second volume that is greater than the first volume of the first sub-chamber.Type: ApplicationFiled: November 17, 2011Publication date: May 17, 2012Applicant: VANDERBILT UNIVERSITYInventor: Niels de Jonge
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Patent number: 7777185Abstract: A confocal scanning transmission electron microscope which includes an electron illumination device providing an incident electron beam propagating in a direction defining a propagation axis, and a precision specimen scanning stage positioned along the propagation axis and movable in at least one direction transverse to the propagation axis. The precision specimen scanning stage is configured for positioning a specimen relative to the incident electron beam. A projector lens receives a transmitted electron beam transmitted through at least part of the specimen and focuses this transmitted beam onto an image plane, where the transmitted beam results from the specimen being illuminated by the incident electron beam. A detection system is placed approximately in the image plane.Type: GrantFiled: September 25, 2007Date of Patent: August 17, 2010Assignee: UT-Battelle, LLCInventor: Niels de Jonge
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Publication number: 20090078868Abstract: A confocal scanning transmission electron microscope which includes an electron illumination device providing an incident electron beam propagating in a direction defining a propagation axis, and a precision specimen scanning stage positioned along the propagation axis and movable in at least one direction transverse to the propagation axis. The precision specimen scanning stage is configured for positioning a specimen relative to the incident electron beam. A projector lens receives a transmitted electron beam transmitted through at least part of the specimen and focuses this transmitted beam onto an image plane, where the transmitted beam results from the specimen being illuminated by the incident electron beam. A detection system is placed approximately in the image plane.Type: ApplicationFiled: September 25, 2007Publication date: March 26, 2009Inventor: Niels de Jonge
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Patent number: 7288773Abstract: The invention provides an electron source suitable for use in a charged-particle apparatus, in which source a beam of electrons can be extracted from an electrode that is subjected to at least one of an electric potential, thermal excitation and photonic excitation, whereby at least part of the electrode comprises semiconductor material having a conduction band that is quantized into discrete energy levels. Such a source enjoys a relatively low energy spread, typically much smaller than that of a Cold Field Emission Gun (CFEG). The semiconductor material may, for example, comprise a semiconductor nanowire including InAs and GaInAs.Type: GrantFiled: September 22, 2005Date of Patent: October 30, 2007Assignees: FEI Company, Koninklijke Philips Electronics N.V.Inventors: Niels de Jonge, Erik Petrus Antonius Maria Bakkers, Louis Felix Feiner, Antonio Maria Calvosa
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Publication number: 20060076504Abstract: The invention provides an electron source suitable for use in a charged-particle apparatus, in which source a beam of electrons can be extracted from an electrode that is subjected to at least one of an electric potential, thermal excitation and photonic excitation, whereby at least part of the electrode comprises semiconductor material having a conduction band that is quantized into discrete energy levels. Such a source enjoys a relatively low energy spread, typically much smaller than that of a Cold Field Emission Gun (CFEG). Said semiconductor material may, for example, comprise a semiconductor nanowire. Examples of suitable semiconductor materials for such a nanowire include InAs and GaInAs.Type: ApplicationFiled: September 22, 2005Publication date: April 13, 2006Applicant: FEI CompanyInventors: Niels de Jonge, Erik Petrus Antonius Maria Bakkers, Louis Felix Feiner, Antonio Maria Calvosa