Patents by Inventor Nigel D. Browning
Nigel D. Browning has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230011739Abstract: A beam control method is provided that can be implemented with any hardware system for imaging and/or cutting such as SEM/FIB/HIM or charged particle lithography which alleviates the deposited energy overlap between pixels to increase resolution and precision while reducing damage. The method includes scanning a workpiece with e-beam lithography, proton lithography, ion beam lithography, optical lithography, ion beam imaging or FIB in a reduced or sub-sampled pattern, to reduce beam overlap, which can include the step of scanning the beam ensuring that there is the largest difference in time and space between consecutive beam locations.Type: ApplicationFiled: April 20, 2022Publication date: January 12, 2023Inventors: Nigel D Browning, Daniel Nicholls
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Publication number: 20220408033Abstract: A method uses inpainting, whereby the ability to optimize the reconstruction of images at high resolution and sensitivity with minimal pixels is hard wired into the IRFPA. By combining several of these systems, or by selecting different pixels in the array to form images of different colors, hyperspectral images and 3-D tomograms can also be obtained with a significantly smaller number of pixels.Type: ApplicationFiled: May 9, 2022Publication date: December 22, 2022Inventors: RIchard Edward Pimpinella, Christopher Frank Buurma, Nigel D. Browning
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Publication number: 20220408035Abstract: A hyperspectral infrared imaging system includes optical components, multi-color focal plane array or arrays, readout electronics, control electronics, and a computing system. The system measures a limited number of spatial and spectral points during image capture and the full dataset is computationally generated.Type: ApplicationFiled: May 9, 2022Publication date: December 22, 2022Inventors: RIchard Edward Pimpinella, Christopher Frank Buurma, Nigel D. Browning
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Patent number: 10656287Abstract: A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.Type: GrantFiled: April 3, 2019Date of Patent: May 19, 2020Assignee: Battelle Memorial InstituteInventors: David W. Gotthold, Andrew J. Stevens, Nigel D. Browning, Eric Jensen, Nathan L. Canfield, Alan G. Joly
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Patent number: 10580614Abstract: Mask-modulated spectra are incident to a sensor and are summed during a frame time. After the frame time, a compressed spectrum is read out based on the sum and decompressed to obtain spectra for some or all specimen locations. The mask-modulated spectrum that are summed are associated with different modulations produced by a common mask.Type: GrantFiled: April 7, 2017Date of Patent: March 3, 2020Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning
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Patent number: 10541109Abstract: Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.Type: GrantFiled: July 26, 2017Date of Patent: January 21, 2020Assignee: BATTELLE MEMORIAL INSTITUTEInventors: Bryan A. Stanfill, Sarah M. Reehl, Margaret C. Johnson, Lisa M. Bramer, Nigel D. Browning, Andrew J. Stevens, Libor Kovarik
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Patent number: 10500228Abstract: Compositions are provided that can include nanoscale particles including metal cations such as cerium having an average particle size of less than 10 nm. The nanoscale particles can include cerium and oxygen. Methods for forming nanoparticles are provided. The methods can include exposing a metal cation within a solution to radiation to form metal nanoparticles that can include metal cations. The methods can include exposing a cerium salt solution to radiation to form the nanoparticles. The methods can include exposing solvated metal cations to radiation to precipitate nanoparticles that include metal cations such as Ce. The methods can include exposing the homogeneous solution to radiation to precipitate nanoparticles. The methods can include: providing an aqueous solution comprising metal cations; and increasing the pH of the aqueous solution with radiation to form nanoparticles that include metal cations. Nanoparticle generators are provided.Type: GrantFiled: April 26, 2017Date of Patent: December 10, 2019Assignee: Battelle Memorial InstituteInventors: Jay W. Grate, Nigel D. Browning, Patricia Abellan
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Patent number: 10431419Abstract: Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.Type: GrantFiled: July 7, 2017Date of Patent: October 1, 2019Assignee: Battelle Memorial InstituteInventors: Libor Kovarik, Andrew J. Stevens, Andrey V. Liyu, Nigel D. Browning
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Publication number: 20190227181Abstract: A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.Type: ApplicationFiled: April 3, 2019Publication date: July 25, 2019Applicant: Battelle Memorial InstituteInventors: David W. Gotthold, Andrew J. Stevens, Nigel D. Browning, Eric Jensen, Nathan L. Canfield, Alan G. Joly
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Patent number: 10295677Abstract: A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.Type: GrantFiled: May 8, 2017Date of Patent: May 21, 2019Assignee: Battelle Memorial InstituteInventors: David W. Gotthold, Andrew J. Stevens, Nigel D. Browning, Eric Jensen, Nathan L. Canfield, Alan G. Joly
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Patent number: 10256072Abstract: Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyzes thereof.Type: GrantFiled: August 1, 2017Date of Patent: April 9, 2019Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Andrey V. Liyu, Nigel D. Browning
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Patent number: 10224175Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: GrantFiled: March 18, 2016Date of Patent: March 5, 2019Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu, Xin Yuan, Lawrence Carin
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Publication number: 20190043690Abstract: Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyses thereof.Type: ApplicationFiled: August 1, 2017Publication date: February 7, 2019Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Andrew J. Stevens, Libor Kovarik, Andrey V. Liyu, Nigel D. Browning
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Patent number: 10170274Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: GrantFiled: October 5, 2016Date of Patent: January 1, 2019Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning
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Publication number: 20180321390Abstract: A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.Type: ApplicationFiled: May 8, 2017Publication date: November 8, 2018Applicant: Battelle Memorial InstituteInventors: David W. Gotthold, Andrew J. Stevens, Nigel D. Browning, Eric Jensen, Nathan L. Canfield, Alan G. Joly
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Patent number: 10109453Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: GrantFiled: March 18, 2016Date of Patent: October 23, 2018Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu
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Publication number: 20180033591Abstract: Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.Type: ApplicationFiled: July 26, 2017Publication date: February 1, 2018Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Bryan A. Stanfill, Sarah M. Reehl, Margaret C. Johnson, Lisa M. Bramer, Nigel D. Browning, Andrew J. Stevens, Libor Kovarik
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Publication number: 20180025887Abstract: Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.Type: ApplicationFiled: July 7, 2017Publication date: January 25, 2018Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Libor Kovarik, Andrew J. Stevens, Andrey V. Liyu, Nigel D. Browning
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Publication number: 20170316916Abstract: Mask-modulated spectra are incident to a sensor and are summed during a frame time. After the frame time, a compressed spectrum is read out based on the sum and decompressed to obtain spectra for some or all specimen locations. The mask-modulated spectrum that are summed are associated with different modulations produced by a common mask.Type: ApplicationFiled: April 7, 2017Publication date: November 2, 2017Applicant: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning
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Publication number: 20170025247Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: ApplicationFiled: October 5, 2016Publication date: January 26, 2017Applicant: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning