Abstract: A method for controlling the position of a microscope lens comprising receiving a reference signal corresponding to a reference position of the microscope lens; receiving a measurement signal corresponding to an actual position of the microscope lens; receiving a deviation signal characteristic of a predetermined positional deviation from the reference position; and using the measurement signal, the deviation signal and the reference signal to generate a positional control signal for use in setting the position of the microscope lens.

Abstract: A method for controlling the position of a microscope lens comprising receiving a reference signal corresponding to a reference position of the microscope lens; receiving a measurement signal corresponding to an actual position of the microscope lens; receiving a deviation signal characteristic of a predetermined positional deviation from the reference position; and using the measurement signal, the deviation signal and the reference signal to generate a positional control signal for use in setting the position of the microscope lens.

Abstract: A method of forming a conductive pattern on a substrate. The method comprising providing a substrate carrying a conductive layer; forming a first portion of the conductive pattern by exposing the conductive layer to a laser and controlling the laser to remove conductive material around the edge(s) of desired conductive region(s) of the first portion; and laying down an etch resistant material on the conductive layer, the etch resistant material defining a second portion of the conductive pattern, removing conductive material from those areas of the second portion not covered by the etch resistant material, and then removing the etch resistant material.

Abstract: A method of determining the location of an optical feature in an image projection system, the method comprising: 1) projecting a first image of the feature onto a detector with a lens in a first position; 2) sensing, with the detector, the position of the first image of the feature; 3) projecting a second image of the feature onto a detector with a lens in a second position laterally spaced from the first position; 4) sensing, with the detector, the position of the second image of the feature; and 5) deducing the location of the defect from the difference between the positions sensed in steps 2) and 4).

Abstract: A digital imaging device has a CCD array fixed to a housing. A focussing lens is mounted via a mounting assembly to the housing to focus an image onto the detector array. The mounting assembly is operable to move the lens relative to the housing and detector array whereby the image can be displaced relative to the detector array.

Abstract: An automatic scanning system has a scanner having a detector with a detector dynamic range, the detector being arranged to monitor a dynamic range of a scan area. An exposure controller is arranged to compare the dynamic range of the scan area with the detector dynamic range of the scanner. The exposure controller determines a minimum scan exposure time based upon the comparison, such that the dynamic range of the scan area is equal to or lies within the detector dynamic range of the scanner.