Patents by Inventor Nigel Lightfoot
Nigel Lightfoot has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11187639Abstract: Method of characterizing particles suspended in a fluid dispersant by light diffraction, comprising: obtaining measurement data from a detector element, the detector element being arranged to measure the intensity of scattered light; identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant; processing the measurement data to remove or separate the measurement contribution arising from light scattered by inhomogeneities in the dispersant; calculating a particle size distribution from the processed measurement. The detector element is one of a plurality of detector elements from which the measurement data is obtained. The detector elements are arranged to measure the intensity of scattered light at a plurality of scattering angles, the plurality of scattering angles distributed over a plurality of angles about an illumination axis.Type: GrantFiled: June 13, 2019Date of Patent: November 30, 2021Assignee: Malvern Panalytical LimitedInventors: Rhys Poolman, David Stringfellow, Nigel Lightfoot, Jason Cecil William Corbett
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Publication number: 20190383718Abstract: Method of characterizing particles suspended in a fluid dispersant by light diffraction, comprising: obtaining measurement data from a detector element, the detector element being arranged to measure the intensity of scattered light; identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant; processing the measurement data to remove or separate the measurement contribution arising from light scattered by inhomogeneities in the dispersant; calculating a particle size distribution from the processed measurement. The detector element is one of a plurality of detector elements from which the measurement data is obtained. The detector elements are arranged to measure the intensity of scattered light at a plurality of scattering angles, the plurality of scattering angles distributed over a plurality of angles about an illumination axis.Type: ApplicationFiled: June 13, 2019Publication date: December 19, 2019Applicant: Malvern Panalytical LimitedInventors: Rhys POOLMAN, David STRINGFELLOW, Nigel LIGHTFOOT, Jason Cecil William CORBETT
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Patent number: 10422734Abstract: Method of characterizing particles suspended in a fluid dispersant by light diffraction, comprising: obtaining measurement data from a detector element, the detector element being arranged to measure the intensity of scattered light; identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant; processing the measurement data to remove or separate the measurement contribution arising from light scattered by inhomogeneities in the dispersant; calculating a particle size distribution from the processed measurement. The detector element is one of a plurality of detector elements from which the measurement data is obtained. The detector elements are arranged to measure the intensity of scattered light at a plurality of scattering angles, the plurality of scattering angles distributed over a plurality of angles about an illumination axis.Type: GrantFiled: August 3, 2017Date of Patent: September 24, 2019Assignee: Malvern Panalytical LimitedInventors: Rhys Poolman, David Stringfellow, Nigel Lightfoot, Jason Cecil William Corbett
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Publication number: 20180038782Abstract: Method of characterizing particles suspended in a fluid dispersant by light diffraction, comprising: obtaining measurement data from a detector element, the detector element being arranged to measure the intensity of scattered light; identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant; processing the measurement data to remove or separate the measurement contribution arising from light scattered by inhomogeneities in the dispersant; calculating a particle size distribution from the processed measurement. The detector element is one of a plurality of detector elements from which the measurement data is obtained. The detector elements are arranged to measure the intensity of scattered light at a plurality of scattering angles, the plurality of scattering angles distributed over a plurality of angles about an illumination axis.Type: ApplicationFiled: August 3, 2017Publication date: February 8, 2018Applicant: Malvern Instruments LimitedInventors: Rhys POOLMAN, David STRINGFELLOW, Nigel LIGHTFOOT, Jason Cecil William CORBETT
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Patent number: 7869038Abstract: In one general aspect, a particle characterization instrument is disclosed that includes a first spatially coherent light source with a beam output aligned with an optical axis. A focusing optic is positioned along the optical axis after the coherent light source, and a sample cell is positioned along the optical axis after the focusing optic. The instrument also includes a diverging optic positioned along the optical axis after the sample cell, and a detector positioned outside of the optical axis to receive scattered light within a first range of scattering angles from the diverging optic. In another general aspect, an instrument can direct at least a portion of a first beam and at least a portion of a second beam along a same optical axis and a can receive scattered light from the sample cell resulting from interaction between the sample and either the first beam or the second beam.Type: GrantFiled: August 15, 2008Date of Patent: January 11, 2011Assignee: Malvern Instruments, Ltd.Inventors: Lewis Jones, Nigel Lightfoot, David Spriggs, David Stringfellow
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Publication number: 20090122313Abstract: In one general aspect, a particle characterization instrument is disclosed that includes a first spatially coherent light source with a beam output aligned with an optical axis. A focusing optic is positioned along the optical axis after the coherent light source, and a sample cell is positioned along the optical axis after the focusing optic. The instrument also includes a diverging optic positioned along the optical axis after the sample cell, and a detector positioned outside of the optical axis to receive scattered light within a first range of scattering angles from the diverging optic. In another general aspect, an instrument can direct at least a portion of a first beam and at least a portion of a second beam along a same optical axis and a can receive scattered light from the sample cell resulting from interaction between the sample and either the first beam or the second beam.Type: ApplicationFiled: August 15, 2008Publication date: May 14, 2009Inventors: Lewis Jones, Nigel Lightfoot, David Spriggs, David Stringfellow