Abstract: Certain embodiments described herein are directed to devices and system that can be used to fill a sample cell. In some examples, the system can be configured with a pressure device configured to provide a negative pressure to accelerate filling of the cell with the sample. In some embodiments, the negative pressure can be used to fill a flow cell at a selected fill rate.

Abstract: The present invention relates to methods for calibrating and controlling a polarization modulator, for example a photoelastic modulator (PEM) device on a CD measurement instrument, the method comprising scanning the control input voltage (Vin) at a fixed wavelength (?meas); and recording the CD scan, wherein the control input voltage (Vin) determines the peak retardation (?) at the fixed wavelength (?meas), and wherein the method is repeated for one or more fixed wavelengths. An augmented drive function allows the PEM to be operated with greater accuracy over the full wavelength range, and measurement of resonant frequency provides a means to continually correct for temperature related drift of retardation.

Abstract: Certain embodiments described herein are directed to devices and system that can be used to fill a sample cell. In some examples, the system can be configured with a pressure device configured to provide a negative pressure to accelerate filling of the cell with the sample. In some embodiments, the negative pressure can be used to fill a flow cell at a selected fill rate.

Abstract: Certain embodiments described herein are directed to devices and system that can be used to fill a sample cell. In some examples, the system can be configured with a pressure device configured to provide a negative pressure to accelerate filling of the cell with the sample. In some embodiments, the negative pressure can be used to fill a flow cell at a selected fill rate.

Abstract: The present invention relates to methods for calibrating and controlling a polarization modulator, for example a photoelastic modulator (PEM) device on a CD measurement instrument, the method comprising scanning the control input voltage (Vin) at a fixed wavelength (?meas); and recording the CD scan, wherein the control input voltage (Vin) determines the peak retardation (?) at the fixed wavelength (?meas), and wherein the method is repeated for one or more fixed wavelengths. An augmented drive function allows the PEM to be operated with greater accuracy over the full wavelength range, and measurement of resonant frequency provides a means to continually correct for temperature related drift of retardation.

Abstract: This invention relates to a device for calibrating circular or linear dichroism spectrometers, or other photoelastic modulator (PEM) based devices or instruments. In preferred embodiments, the present invention features a device for calibrating circular dichroism or linear dichroism spectrometers comprising at least one waveplate (Q) providing (n±¼) waves of retardation at a defined set of wavelengths, and at least one isotropic plate (P). The invention also features methods for using the device, for example, for calibrating circular dichroism spectrometers or linear dichroism spectrometers.

Abstract: This invention relates to a device for calibrating circular or linear dichroism spectrometers, or other photoelastic modulator (PEM) based devices or instruments. In preferred embodiments, the present invention features a device for calibrating circular dichroism or linear dichroism spectrometers comprising at least one waveplate (Q) providing (n±¼) waves of retardation at a defined set of wavelengths, and at least one isotropic plate (P). The invention also features methods for using the device, for example, for calibrating circular dichroism spectrometers or linear dichroism spectrometers.

Abstract: Certain embodiments described herein are directed to devices and system that can be used to fill a sample cell. In some examples, the system can be configured with a pressure device configured to provide a negative pressure to accelerate filling of the cell with the sample. In some embodiments, the negative pressure can be used to fill a flow cell at a selected fill rate.

Abstract: Certain embodiments described herein are directed to devices and system that can be used to fill a sample cell. In some examples, the system can be configured with a pressure device configured to provide a negative pressure to accelerate filling of the cell with the sample. In some embodiments, the negative pressure can be used to fill a flow cell at a selected fill rate.

Abstract: Certain embodiments described herein are directed to devices and system that can be used to fill a sample cell. In some examples, the system can be configured with a pressure device configured to provide a negative pressure to accelerate filling of the cell with the sample. In some embodiments, the negative pressure can be used to fill a flow cell at a selected fill rate.