Patents by Inventor Nikulin Ivan

Nikulin Ivan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8026990
    Abstract: A method of compensating performance of a thin film transistor including a gate electrode, source and drain electrodes that are spaced apart from each other and insulated from the gate electrode, and an active layer to form a channel between the source and drain electrodes, includes applying a negative voltage to the gate electrode to compensate deterioration of the active layer.
    Type: Grant
    Filed: October 10, 2008
    Date of Patent: September 27, 2011
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Tae-Hyung Hwang, Hyung-Il Jeon, Nikulin Ivan
  • Publication number: 20090190057
    Abstract: A method of compensating performance of a thin film transistor including a gate electrode, source and drain electrodes that are spaced apart from each other and insulated from the gate electrode, and an active layer to form a channel between the source and drain electrodes, includes applying a negative voltage to the gate electrode to compensate deterioration of the active layer.
    Type: Application
    Filed: October 10, 2008
    Publication date: July 30, 2009
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Tae-Hyung HWANG, Hyung-Il JEON, Nikulin IVAN
  • Publication number: 20090078972
    Abstract: A sensor thin film transistor includes a gate electrode, a gate insulation layer formed on the gate electrode, a semiconductor layer having a portion positioned above the gate electrode and on a side of the gate insulation layer opposite the gate electrode, and a source electrode and drain electrode having spaced apart ends positioned on the semiconductor layer, wherein the sensor thin film transistor is operative such that a signal-to-noise ratio is equal to or greater than about 200 when the gate-off voltage applied to the gate electrode is equal to or less than about 0V.
    Type: Application
    Filed: August 29, 2008
    Publication date: March 26, 2009
    Inventors: Tae-Hyung HWANG, Hyung-Il JEON, Nikulin IVAN