Patents by Inventor Niladri Sen

Niladri Sen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12639971
    Abstract: A machine learning based computing method for extracting data from electronic documents, is disclosed. The machine learning based computing method includes steps of: receiving the electronic documents from data sources; converting formats of the electronic documents into first images associated with the electronic documents; classifying the first images associated with the electronic documents as second images including tabular data, and third images including non-tabular data, based on a CNN based machine learning model; determining tabular regions in tabular data associated with the second images by identifying bounding box coordinates indicating tabular regions in tabular data, based on a YOLO architecture based machine learning model; extracting first data from the tabular regions; extracting second data from non-tabular regions; and providing an output of the first data and the second data to second users on a user interface associated with electronic devices.
    Type: Grant
    Filed: December 27, 2023
    Date of Patent: May 26, 2026
    Inventors: Lohit Vankina, Nilotpal Sarkar, Niladri Sen, Gummadi Sai Dheeraj, Ansumun Gouda, Pratyush Amrit, Sumit Gupta
  • Publication number: 20250218205
    Abstract: A machine learning based computing method for extracting data from electronic documents, is disclosed. The machine learning based computing method includes steps of: receiving the electronic documents from data sources; converting formats of the electronic documents into first images associated with the electronic documents; classifying the first images associated with the electronic documents as second images including tabular data, and third images including non-tabular data, based on a CNN based machine learning model; determining tabular regions in tabular data associated with the second images by identifying bounding box coordinates indicating tabular regions in tabular data, based on a YOLO architecture based machine learning model; extracting first data from the tabular regions; extracting second data from non-tabular regions; and providing an output of the first data and the second data to second users on a user interface associated with electronic devices.
    Type: Application
    Filed: December 27, 2023
    Publication date: July 3, 2025
    Inventors: Lohit Vankina, Nilotpal Sarkar, Niladri Sen, Gummadi Sai Dheeraj, Ansumun Gouda, Pratyush Amrit, Sumit Gupta
  • Publication number: 20250117575
    Abstract: The present invention is related to data processing methods and systems thereof. According to an embodiment, the present invention provides a method of processing documents using a machine learning model. The process begins by accessing data files and extracting information from them, which is subsequently stored. This document information, along with the machine learning model trained on various document formats, is used to classify the data files and generate tabular data. From this tabular data, data objects are created and included in an output data file. The information from the output file is then used to update the data of the machine learning model, optimizing it for improved future document processing. There are other embodiments as well.
    Type: Application
    Filed: October 4, 2023
    Publication date: April 10, 2025
    Inventors: Lohit Vankina, Nilotpal Sarkar, Niladri Sen, Kunal Choudhury, Nupoor Chourasia, Gautam Singh, Archishman Bandyopadhyay, Sumit Gupta
  • Patent number: 11561480
    Abstract: A computer-implemented defect prediction method for a device manufacturing process involving processing a pattern onto a substrate. Non-correctable error is used to help predict locations where defects are likely to be present, allowing improvements in metrology throughput. In an embodiment, non-correctable error information relates to imaging error due to limitations on, for example, the lens hardware, imaging slit size, and/or other physical characteristics of the lithography system. In an embodiment, non-correctable error information relates to imaging error induced by lens heating effects.
    Type: Grant
    Filed: December 12, 2019
    Date of Patent: January 24, 2023
    Assignee: ASML Netherlands B.V.
    Inventors: Ivo Liebregts, Niladri Sen, Koen Thuijs, Ronaldus Johannes Gysbertus Goossens
  • Publication number: 20200209761
    Abstract: A computer-implemented defect prediction method for a device manufacturing process involving processing a pattern onto a substrate. Non-correctable error is used to help predict locations where defects are likely to be present, allowing improvements in metrology throughput. In an embodiment, non-correctable error information relates to imaging error due to limitations on, for example, the lens hardware, imaging slit size, and/or other physical characteristics of the lithography system. In an embodiment, non-correctable error information relates to imaging error induced by lens heating effects.
    Type: Application
    Filed: December 12, 2019
    Publication date: July 2, 2020
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Ivo LIEBREGTS, Niladri Sen, Koen Thuijs, Ronaldus Johannes Gysbertus Goossens