Abstract: An improved system for infrared (IR) imaging of terrain is disclosed wherein or or more IR cameras may be used at one or more locations to record images at multiple focal planes. The images are all taken of the same field of view but at varied focal planes. Global Positioning Satellite (GPS) may be used to track each camera location and each camera captures images of the object. Information regarding the orientation of the camera may also be measured. The digital information from the images from each camera at varying focal planes, the distance from the object to each camera, orientation of camera and the GPS location of each camera is transferred to a computer where the data is processed through the use of merging and photogrammetry software utilizing appropriate algorithms to convert the multiple images into a two-dimensional or three-dimensional image with improved depth of field.

Abstract: An improved system for visual inspection of substrates coated with paints and polymers is disclosed. Painted substrates can be inspected for environmental and physical damage such as corrosion and cracks without removing the paint. The present invention provides the ability to maximize paint thickness penetration. This is accomplished with a spectral bandpass filter that rejects reflected light from the coating opaque bands, while allowing light in the paint window to pass to an IR detector such as an IR camera focal plane. The narrow bandpass range enhances the ability for IR imaging to see through thicker paint layers and improves the contrast over standard commercial IR mid-wave cameras. The bandpass may be adjusted to coincide with the full spectral window of the paint, consistent with the ability of the imaging focal plane to detect light in the spectral region.

Abstract: A system for visual inspection of coated substrates is disclosed. Painted substrates can be inspected for environmental and physical damage such as corrosion and cracks without removing the paint through the use of infrared imaging. The present invention provides the ability to view abnormalities or defects in the substrate at an increased depth of field. This is accomplished by taking multiple images of the substrate at different focal planes then using computer software to merge the images. The merged image is in focus across the different focal planes and may also be viewed in three-dimensions.