Abstract: A heat-assisted magnetic recording head includes a slider body, a laser, a submount, and a laser heater. The slider body is configured to contain components of the heat-assisted magnetic recording head. The laser is configured to emit electromagnetic radiation. The submount is configured to couple the laser to the slider body. The laser heater is configured to apply heat to the laser. The laser heater disposed on a surface of the slider body.

Abstract: An apparatus comprises a slider configured for heat-assisted magnetic recording comprising an air bearing surface (ABS). The slider comprises a write pole at or near the ABS, and a near-field transducer (NFT) at or near the ABS and proximate the write pole. A main waveguide is configured to receive light from a laser source and communicate the light to the NFT. An optical power sensor comprises a tap waveguide optically coupled to the main waveguide and comprising a first end and an opposing second end. The optical power sensor also comprises a bolometer optically coupled to the tap waveguide and configured to receive a portion of the light extracted from the main waveguide by the tap waveguide.

Abstract: An apparatus comprises a slider configured for heat-assisted magnetic recording comprising an air bearing surface (ABS). The slider comprises a write pole at or near the ABS, and a near-field transducer (NFT) at or near the ABS and proximate the write pole. A main waveguide is configured to receive light from a laser source and communicate the light to the NFT. An optical power sensor comprises a tap waveguide optically coupled to the main waveguide and comprising a first end and an opposing second end. The optical power sensor also comprises a bolometer optically coupled to the tap waveguide and configured to receive a portion of the light extracted from the main waveguide by the tap waveguide.

Abstract: An apparatus comprises a slider configured for heat-assisted magnetic recording comprising an air bearing surface (ABS). The slider comprises a write pole at or near the ABS, and a near-field transducer (NFT) at or near the ABS and proximate the write pole. A main waveguide is configured to receive light from a laser source and communicate the light to the NFT. An optical power sensor comprises a tap waveguide optically coupled to the main waveguide and comprising a first end and an opposing second end. The optical power sensor also comprises a bolometer optically coupled to the tap waveguide and configured to receive a portion of the light extracted from the main waveguide by the tap waveguide.

Abstract: An apparatus includes a write pole, a waveguide adjacent to the write pole, the waveguide having a truncated end, and a blocking layer positioned adjacent the truncated end and extending from one side of the waveguide across a portion of an aperture at the truncated end. The waveguide can be a solid immersion mirror or a channel waveguide.

Abstract: An apparatus includes a write pole, a waveguide adjacent to the write pole, the waveguide having a truncated end, and a blocking layer positioned adjacent the truncated end and extending from one side of the waveguide across a portion of an aperture at the truncated end. The waveguide can be a solid immersion minor or a channel waveguide.

Abstract: An apparatus includes: a first layer having a near field transducer positioned in a waveguide cladding; a second layer having a magnetic pole piece; a third layer including a solid immersion mirror; a first lapping guide positioned in the first layer; a second lapping guide positioned in the second layer; and a third lapping guide positioned in the third layer.

Abstract: An apparatus comprises a waveguide, an optical transducer for coupling electromagnetic radiation from the waveguide to a point adjacent to an air bearing surface to heat a portion of a storage medium, and a first wire positioned adjacent to the air bearing surface, wherein current in the wire produces a magnetic field in the heated portion of the storage medium.

Abstract: A method includes: fabricating a wafer having a plurality of layers, each including a feature of interest and a lapping guide positioned at a known location relative to the feature of interest, wherein the feature of interest and the lapping guide cross a common plane; lapping the wafer to the common plane to expose portions of the lapping guides; and measuring dimensions of the lapping guides and an offset of the lapping guides with respect to each other. An apparatus constructed using the method is also included.

Abstract: An apparatus comprises a ferromagnetic free layer having a first magnetic moment and having a magnetization that rotates in response to an external magnetic field, a first ferromagnetic reference layer positioned adjacent to a first side of the ferromagnetic free layer and having a second magnetic moment that is greater than the first magnetic moment of the ferromagnetic free layer, a second ferromagnetic reference layer positioned adjacent to a second side of the ferromagnetic free layer and having a third magnetic moment that is greater than the first magnetic moment of the ferromagnetic free layer, a first non-magnetic spacer layer positioned between the ferromagnetic free layer and the first ferromagnetic reference layer, a second non-magnetic spacer layer positioned between the ferromagnetic free layer and the second ferromagnetic reference layer, and a source of magnetic field for biasing the first and second ferromagnetic reference layers.

Abstract: An apparatus includes a magnetically biased multilayer structure having a reference layer and a free layer separated by a spacer layer; a DC current source connected to the multilayer structure; an AC current source connected to the multilayer structure; and a phase detector for measuring a phase difference between an AC current and a voltage across the multilayer structure. A method performed by the apparatus is also provided.

Abstract: An apparatus includes a magnetically biased multilayer structure having a reference layer and a free layer separated by a spacer layer; a DC current source connected to the multilayer structure; an AC current source connected to the multilayer structure; and a phase detector for measuring a phase difference between an AC current and a voltage across the multilayer structure. A method performed by the apparatus is also provided.