Patents by Inventor Nils Schlemminger

Nils Schlemminger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Determining categories for memory fail conditions
    Patent number: 9620244
    Abstract: Embodiments of the present invention provide methods, program products, and systems for testing a memory cell arrangement. Embodiments of the present invention can determine categories of memory fail conditions by checking memory cells of with a sequence of test parameter configurations for a malfunction using test parameters, storing for test parameter configurations for which a malfunction is detected, and assigning the respective test parameter configuration with a bit fail count comprising the number of malfunctioning memory cells. Embodiments of the present invention can be used to create a relational data structure representing test parameter configurations and can combine one or more test parameter configurations and can create a representation of the bit fail counts of the respective test parameter configurations.
    Type: Grant
    Filed: May 10, 2016
    Date of Patent: April 11, 2017
    Assignee: International Business Machines Corporation
    Inventors: Martin Eckert, Nils Schlemminger, Otto A. Torreiter
  • Determining categories for memory fail conditions
    Patent number: 9401222
    Abstract: Embodiments of the present invention provide methods, program products, and systems for testing a memory cell arrangement. Embodiments of the present invention can determine categories of memory fail conditions by checking memory cells of with a sequence of test parameter configurations for a malfunction using test parameters, storing for test parameter configurations for which a malfunction is detected, and assigning the respective test parameter configuration with a bit fail count comprising the number of malfunctioning memory cells. Embodiments of the present invention can be used to create a relational data structure representing test parameter configurations and can combine one or more test parameter configurations and can create a representation of the bit fail counts of the respective test parameter configurations.
    Type: Grant
    Filed: November 23, 2015
    Date of Patent: July 26, 2016
    Assignee: International Business Machines Corporation
    Inventors: Martin Eckert, Nils Schlemminger, Otto A. Torreiter