Patents by Inventor Nimrod Lucas

Nimrod Lucas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Calculating correction factors for subsequent printing operations by weighting measured alignment differences
    Patent number: 11238322
    Abstract: A position of a first registration mark printed on a substrate during an earlier printing operation is detected. A second registration mark is printed on the substrate during a current printing operation at a position on the substrate relative to the first registration mark based on the detected position of the first registration mark and a correction factor. An alignment difference between the position of the first registration mark and the position of the second registration mark is measured. A new correction factor for a subsequent printing operation is calculated by weighting the measured alignment difference according to a difference between the measured alignment difference and a previous measured alignment difference.
    Type: Grant
    Filed: November 29, 2017
    Date of Patent: February 1, 2022
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Eli Velner, Oren Aks, Nimrod Lucas
  • CALCULATING CORRECTION FACTORS FOR SUBSEQUENT PRINTING OPERATIONS BY WEIGHTING MEASURED ALIGNMENT DIFFERENCES
    Publication number: 20210383179
    Abstract: A position of a first registration mark printed on a substrate during an earlier printing operation is detected. A second registration mark is printed on the substrate during a current printing operation at a position on the substrate relative to the first registration mark based on the detected position of the first registration mark and a correction factor. An alignment difference between the position of the first registration mark and the position of the second registration mark is measured. A new correction factor for a subsequent printing operation is calculated by weighting the measured alignment difference according to a difference between the measured alignment difference and a previous measured alignment difference.
    Type: Application
    Filed: November 29, 2017
    Publication date: December 9, 2021
    Applicant: Hewlett-Packard Development Company, L.P.
    Inventors: Eli VELNER, Oren AKS, Nimrod LUCAS
  • Measured sensor distance correction
    Patent number: 11027537
    Abstract: Example implementations relate to determining a correction factor that converts a measured sensor distance to a calibrated sensor distance. The measured sensor distance may be based on an amount of substrate advancement through a web printing press between detecting a mark on the substrate at a first sensor and detecting the mark at a second sensor. The calibrated sensor distance may be the separation between the first sensor and the second sensor.
    Type: Grant
    Filed: January 16, 2020
    Date of Patent: June 8, 2021
    Assignee: HP Indigo B.V.
    Inventors: Nimrod Lucas, Ofer Hollenberg, Ran Soffer
  • MEASURED SENSOR DISTANCE CORRECTION
    Publication number: 20200147953
    Abstract: Example implementations relate to determining a correction factor that converts a measured sensor distance to a calibrated sensor distance. The measured sensor distance may be based on an amount of substrate advancement through a web printing press between detecting a mark on the substrate at a first sensor and detecting the mark at a second sensor. The calibrated sensor distance may be the separation between the first sensor and the second sensor.
    Type: Application
    Filed: January 16, 2020
    Publication date: May 14, 2020
    Applicant: HP INDIGO B.V.
    Inventors: Nimrod Lucas, Ofer Hollenberg, Ran Soffer
  • Measured sensor distance correction
    Patent number: 10562291
    Abstract: Example implementations relate to determining a correction factor that converts a measured sensor distance (228) to a calibrated sensor distance (222). The measured sensor distance may be based on an amount of substrate advancement through a web printing press (202) between detecting a mark (226-1, . . . , 226-N) on the substrate (204) at a first sensor (212) and detecting the mark at a second sensor (214). The calibrated sensor distance (222) may be the separation between the first sensor and the second sensor.
    Type: Grant
    Filed: May 8, 2015
    Date of Patent: February 18, 2020
    Assignee: HP Indigo B.V.
    Inventors: Nimrod Lucas, Ofer Hollenberg, Ran Soffer
  • MEASURED SENSOR DISTANCE CORRECTION
    Publication number: 20180079197
    Abstract: Example implementations relate to determining a correction factor that converts a measured sensor distance (228) to a calibrated sensor distance (222). The measured sensor distance may be based on an amount of substrate advancement through a web printing press (202) between detecting a mark (226-1, . . . , 226-N) on the substrate (204) at a first sensor (212) and detecting the mark at a second sensor (214). The calibrated sensor distance (222) may be the separation between the first sensor and the second sensor.
    Type: Application
    Filed: May 8, 2015
    Publication date: March 22, 2018
    Applicant: HP INDIGO B.V.
    Inventors: Nimrod Lucas, Ofer Hollenberg, Ran Soffer