Patents by Inventor Ningbo Li

Ningbo Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11400526
    Abstract: The present disclosure provides a clamping jaw assembly and a drill chuck, which solve technical problems of complex structure, small clamping range, poor clamping effect, and high cost of the existing clamping jaw assembly. The clamping jaw assembly includes a first clamping jaw and a second clamping jaw, both of which include a screwing section, an outer surface of each screwing section is arranged with a thread, a top end of each screwing section is arranged with a clamping section, the screwing section is fixedly connected with corresponding clamping section. An inner side of the clamping section of the first clamping jaw includes a first clamping part, and an inner side of the clamping section of the second clamping jaw includes a second clamping part matched with the first clamping part. The present disclosure can be widely used in fields of electric tools, machine tool accessories and medical equipment, etc.
    Type: Grant
    Filed: May 21, 2019
    Date of Patent: August 2, 2022
    Assignee: SHANDONG WEIDA MACHINERY CO., LTD.
    Inventors: Yanzhao Li, Ningbo Wei
  • Publication number: 20220223692
    Abstract: A gallium nitride power device, including: a gallium nitride substrate; cathodes; a plurality of gallium nitride protruding structures arranged on the gallium nitride substrate and between the cathodes, a groove is formed between adjacent gallium nitride protruding structures; an electron transport layer, covering a top portion and side surfaces of each of the gallium nitride protruding structures; a gallium nitride layer, arranged on the electron transport layer and filling each of the grooves; a plurality of second conductivity type regions, where each of the second conductivity type regions extends downward from a top portion of the gallium nitride layer into one of the grooves, and the top portion of each of the gallium nitride protruding structures is higher than a bottom portion of each of the second conductivity type regions; and an anode, arranged on the gallium nitride layer and the second conductivity type regions.
    Type: Application
    Filed: September 25, 2020
    Publication date: July 14, 2022
    Applicants: SOUTHEAST UNIVERSITY, CSMC TECHNOLOGIES FAB2 CO.,LTD
    Inventors: SIYANG LIU, NINGBO LI, DEJIN WANG, KUI XIAO, CHI ZHANG, SHENG LI, XINYI TAO, WEIFENG SUN, LONGXING SHI
  • Patent number: 11322606
    Abstract: A heterojunction semiconductor device comprises a substrate; a second barrier layer is disposed on the second channel layer and a second channel is formed; a trench gate structure is disposed in the second barrier layer; the trench gate structure is embedded into the second barrier layer and is composed of a gate medium and a gate metal located in the gate medium; an isolation layer is disposed in the second channel layer and separates the second channel layer into an upper layer and a lower layer; a first barrier layer is disposed between the lower layer of the second channel layer and the first channel layer and a first channel is formed; a bottom of the metal drain is flush with a bottom of the first barrier layer; and a first metal source is disposed between the second metal source and the first channel layer.
    Type: Grant
    Filed: October 21, 2019
    Date of Patent: May 3, 2022
    Assignee: SOUTHEAST UNIVERSITY
    Inventors: Weifeng Sun, Siyang Liu, Sheng Li, Chi Zhang, Xinyi Tao, Ningbo Li, Longxing Shi
  • Publication number: 20210234030
    Abstract: A heterojunction semiconductor device comprises a substrate; a second barrier layer is disposed on the second channel layer and a second channel is formed; a trench gate structure is disposed in the second barrier layer; the trench gate structure is embedded into the second barrier layer and is composed of a gate medium and a gate metal located in the gate medium; an isolation layer is disposed in the second channel layer and separates the second channel layer into an upper layer and a lower layer; a first barrier layer is disposed between the lower layer of the second channel layer and the first channel layer and a first channel is formed; a bottom of the metal drain is flush with a bottom of the first barrier layer; and a first metal source is disposed between the second metal source and the first channel layer.
    Type: Application
    Filed: October 21, 2019
    Publication date: July 29, 2021
    Inventors: Weifeng SUN, Siyang LIU, Sheng LI, Chi ZHANG, Xinyi TAO, Ningbo LI, Longxing SHI
  • Patent number: 10762542
    Abstract: The present disclosure discloses an item transfer apparatus, system and method, and belongs to the field of data processing. The method includes: sending, by a terminal, an order instruction of a target item to an order management system, feeding back, by the order management system, order information of an order to the terminal, sending, by the terminal, a resource exchange instruction to a card management system according to the order information and a read e-card, completing, by the card management system, transfer of the exchange resource, sending, by the order management system, an item transfer instruction to an item provider device according to a resource transfer result, and completing, by the item provider device, transfer of the target item.
    Type: Grant
    Filed: July 18, 2016
    Date of Patent: September 1, 2020
    Assignee: Tencent Technology (Shenzhen) Company Limited
    Inventors: Shanwan Zhang, Huashan Chen, Bin Chen, Dongming Qin, Huanming Wu, Huiqiu Zhou, Hongru Xu, Songjian Wang, Kexiao Duan, Jia Yang, Ningbo Li
  • Patent number: 10660024
    Abstract: A wireless network access method and apparatus are provided. The method includes obtaining identification information and status information of one or more network access points, determining a target access point according to the status information, submitting the identification information of the target access point to a network access server via a mobile communications network, receiving access account information for the target access point from the network access server, and transmitting a wireless network access request including the received access account information, to the target access point.
    Type: Grant
    Filed: June 15, 2016
    Date of Patent: May 19, 2020
    Assignee: TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED
    Inventors: Shanwan Zhang, Longfei Li, Wenping Shi, Jinlong Shen, Dabin Zhuang, Zhengwen Xiong, Hongxi Pan, Linfeng Chen, Ningbo Li, Peihong Huang, Zheng Fan
  • Patent number: 10254192
    Abstract: The present invention discloses an improved method of combination test by using argon as gross-leak tracer gas and using helium as fine-leak tracer gas, belongs to the field of hermeticity test. The method is designed to solve the problem that the existing methods are not ideal when the component has lower ?Hemin and wider range of volume V. The invention comprises step S1 of selecting: using helium-argon prefilling method for the first hermeticity test and helium-argon pressuring method after helium-argon prefilling for repetitive hermeticity test, or using helium-argon pressuring method after argon prefilling for the first hermeticity test and helium-argon multi-pressuring method after argon prefilling for repetitive hermeticity tests. The improved method extends the maximum detection-waiting time, effectively prevents detection missing and misjudges in gross-leak/fine-leak test, and solves the detection problems on applicability, feasibility and credibility.
    Type: Grant
    Filed: December 16, 2015
    Date of Patent: April 9, 2019
    Inventors: Genglin Wang, Ningbo Li, Lijun Dong
  • Publication number: 20180132167
    Abstract: A wireless network access method and apparatus are provided. The method includes obtaining identification information and status information of one or more network access points, determining a target access point according to the status information, submitting the identification information of the target access point to a network access server via a mobile communications network, receiving access account information for the target access point from the network access server, and transmitting a wireless network access request including the received access account information, to the target access point.
    Type: Application
    Filed: June 15, 2016
    Publication date: May 10, 2018
    Applicant: TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED
    Inventors: Shanwan ZHANG, Longfei LI, Wenping SHI, Jinlong SHEN, Dabin ZHUANG, Zhengwen XIONG, Hongxi PAN, Linfeng CHEN, Ningbo LI, Peihong HUANG, Zheng FAN
  • Patent number: 9671308
    Abstract: A method for helium mass spectrometric fine-leak test is based on quantitative determination of maximum test-waiting time, which gives a method for quantitative determination of the maximum test-waiting time for fine-leak test during a helium mass spectrometric test process of the sealability, and gives a method for determining the criterion for measured leak rate by taking the minimum helium gas exchange time constant, i.e., a rigour grade ?Hemin, of an acceptable sealed electronic component as a basic criterion for helium mass spectrometric fine-leak test. Based on the inventive method for quantitative determination of the maximum test-waiting time, for most of the cavity volume ranges, the maximum test-waiting time that is determined accurately may be much longer than 1 hour or 0.5 hour as determined qualitatively by the existing related standards.
    Type: Grant
    Filed: June 21, 2013
    Date of Patent: June 6, 2017
    Assignee: BEIJING KEYTON ELECTRONIC RELAY CORPORATION LTD.
    Inventors: Genglin Wang, Fei Li, Caiyi Wang, Ningbo Li, Liyan Wang, Lijun Dong, Yongmin Liu
  • Patent number: 9651444
    Abstract: The present invention discloses a method of cumulative helium mass spectrometric combination test by using argon gas as gross-leak tracer gas, and specifically gives the procedure for this gross-leak and fine-leak combination test, comprising steps and methods of selecting helium-argon prefilling method or helium-argon pressuring method, fixed or flexible scheme and the criterion RAr0max for argon measured leak rate of gross-leak test according to the rigour grade THemin, cavity volume, leak rate of surficially absorbed helium and argon and the history of the test of a component under test; designing time for pressuring of helium-argon pressuring method, the maximum test-waiting time of fine-leak test and the criterion for helium measured leak rate, helium-argon prefilling and helium-argon pressuring, removing absorbed helium and argon gas, gross-leak test, fine-leak test and complementally testing bigger gross leak, which enhances the sensitivity of gross-leak test, lengthens the maximum test-waiting time of
    Type: Grant
    Filed: December 19, 2013
    Date of Patent: May 16, 2017
    Inventors: Genglin Wang, Ningbo Li, Fei Li
  • Publication number: 20160328764
    Abstract: The present disclosure discloses an item transfer apparatus, system and method, and belongs to the field of data processing. The method includes: sending, by a terminal, an order instruction of a target item to an order management system, feeding back, by the order management system, order information of an order to the terminal, sending, by the terminal, a resource exchange instruction to a card management system according to the order information and a read e-card, completing, by the card management system, transfer of the exchange resource, sending, by the order management system, an item transfer instruction to an item provider device according to a resource transfer result, and completing, by the item provider device, transfer of the target item.
    Type: Application
    Filed: July 18, 2016
    Publication date: November 10, 2016
    Applicant: Tencent Technology (Shenzhen) Company Limited
    Inventors: Shanwan ZHANG, Huashan CHEN, Bin CHEN, Dongming QIN, Huanming WU, Huiqiu ZHOU, Hongru XU, Songjian WANG, Kexiao DUAN, Jia YANG, Ningbo LI
  • Publication number: 20160313207
    Abstract: The present invention discloses an improved method of combination test by using argon as gross-leak tracer gas and using helium as fine-leak tracer gas, belongs to the field of hermeticity test. The method is designed to solve the problem that the existing methods are not ideal when the component has lower ?Hemin and wider range of volume V. The invention comprises step S1 of selecting: using helium-argon prefilling method for the first hermeticity test and helium-argon pressuring method after helium-argon prefilling for repetitive hermeticity test, or using helium-argon pressuring method after argon prefilling for the first hermeticity test and helium-argon multi-pressuring method after argon prefilling for repetitive hermeticity tests. The improved method extends the maximum detection-waiting time, effectively prevents detection missing and misjudges in gross-leak/fine-leak test, and solves the detection problems on applicability, feasibility and credibility.
    Type: Application
    Filed: December 16, 2015
    Publication date: October 27, 2016
    Inventors: Genglin WANG, Ningbo Li, Lijun Dong
  • Publication number: 20150073726
    Abstract: The present invention discloses a method of cumulative helium mass spectrometric combination test by using argon gas as gross-leak tracer gas, and specifically gives the procedure for this gross-leak and fine-leak combination test, comprising steps and methods of selecting helium-argon prefilling method or helium-argon pressuring method, fixed or flexible scheme and the criterion RAr0max for argon measured leak rate of gross-leak test according to the rigour grade THemin, cavity volume, leak rate of surficially absorbed helium and argon and the history of the test of a component under test; designing time for pressuring of helium-argon pressuring method, the maximum test-waiting time of fine-leak test and the criterion for helium measured leak rate, helium-argon prefilling and helium-argon pressuring, removing absorbed helium and argon gas, gross-leak test, fine-leak test and complementally testing bigger gross leak, which enhances the sensitivity of gross-leak test, lengthens the maximum test-waiting time of
    Type: Application
    Filed: December 19, 2013
    Publication date: March 12, 2015
    Inventors: Genglin WANG, Ningbo Li, Fei Li
  • Publication number: 20140222353
    Abstract: A method for helium mass spectrometric fine-leak test is based on quantitative determination of maximum test-waiting time, which gives a method for quantitative determination of the maximum test-waiting time for fine-leak test during a helium mass spectrometric test process of the sealability, and gives a method for determining the criterion for measured leak rate by taking the minimum helium gas exchange time constant, i.e., a rigour grade ?Hemin, of an acceptable sealed electronic component as a basic criterion for helium mass spectrometric fine-leak test. Based on the inventive method for quantitative determination of the maximum test-waiting time, for most of the cavity volume ranges, the maximum test-waiting time that is determined accurately may be much longer than 1 hour or 0.5 hour as determined qualitatively by the existing related standards.
    Type: Application
    Filed: June 21, 2013
    Publication date: August 7, 2014
    Inventors: Genglin Wang, Fei Li, Caiyi Wang, Ningbo Li, Liyan Wang, Lijun Dong, Yongmin Liu