Abstract: A method of analysing a spectral peak obtained by an optical spectrometer is provided. The method comprises imaging a spectral peak using an optics assembly and a detector of the optical spectrometer to generate a detected image of the spectral peak. An image correction function is applied to the detected image of the spectral peak to obtain a corrected image of the spectral peak, wherein the image correction function increases the spectral power density of the spectral peak in the corrected image of the spectral peak. Information representative of the spectral peak is extracted from the corrected image of the spectral peak.

Abstract: A method of operating a spectrometer controller is provided. The method comprises obtaining an interfered peak using a detector of a spectrometer, wherein the interfered peak is produced by a plurality of spectral emissions of different wavelengths, each of the plurality of spectral emissions in the interfered peak incident on the detector at an associated detector location. For one or more of the spectral emissions of the interfered peak, an associated curve is generated using a neural network, wherein the neural network is trained to output data indicative of a shape of the associated curve based on data representative of the associated detector location. For one or more of the spectral emissions of the interfered peak, the associated curve is output.

Abstract: A system and method of generating binaural signals includes receiving, by a processing device, a sound signal including speech and noise components, and transforming, by the processing device using a deep neural network (DNN), the sound signal into a first signal and a second signal. The transforming further includes encoding, by an encoding layer of the DNN, the sound signal into a sound signal representation in a latent space, rendering, by a rendering layer of the DNN, the sound signal representation into a first signal representation and a second signal representation in the latent space, and decoding, by a decoding layer of the DNN, the first signal representation into the first signal and the second signal representation into the second signal.

Abstract: Methods and systems are provided to avoid the rotation action with the polarizer and the analyzer in complex ellipsometric measurement and repeated processes. In particular, methods and systems are provided which polarize the incident light in a fixed azimuthal angle then illuminate the polarized light onto the target surface, analyze the surface polarized characteristics light in a fixed azimuthal angle, and obtain the light intensity and phase information corresponding to the target surface. Then, based on the relationship between the characteristic information detected by electromagnetic wave and the light intensity information, the disclosed methods and systems obtain the characteristic information of the target surface.

Abstract: Methods and systems are provided to avoid the rotation action with the polarizer and the analyzer in complex ellipsometric measurement and repeated processes. In particular, methods and systems are provided which polarize the incident light in a fixed azimuthal angle then illuminate the polarized light onto the target surface, analyze the surface polarized characteristics light in a fixed azimuthal angle, and obtain the light intensity and phase information corresponding to the target surface. Then, based on the relationship between the characteristic information detected by electromagnetic wave and the light intensity information, the disclosed methods and systems obtain the characteristic information of the target surface.

Abstract: To avoid the rotation action with the polarizer and the analyzer in ellipsometric measurement, complex measurement and repeated process, this invention proposes to polarize the incident light in a fixed azimuthal angle then illuminate the polarized light onto the target surface, analyze the surface polarized characteristics light in a fixed azimuthal angle, and obtain the light intensity and phase information corresponding to the target surface, then based on the relationship between the characteristics information detected by electromagnetic wave and the light intensity information, to obtain the characteristics information of the target surface.