Abstract: Techniques for generating a set of Deep Learning (DL) models are described. An example method includes training an initial set of DL models using the training data, wherein a topology of each of the DL models is determined based on the parameters vector. The method also includes generating a set of estimate performance functions for each of the DL models in the initial set based on the set of edge-related metrics, and generating a plurality of objective functions based on the set of estimated performance functions. The method also includes generating a final DL model set based on the objective functions, receiving a user selection of a selected DL model from the final DL model set, and deploying the selected DL model to an edge device.

Abstract: A method of forming a semiconductor device is disclosed including through-package debug features enabling debug of a BGA package while mounted to a printed circuit board or other host device. In one example, the through-package debug features are filled or plated vias extending from a surface of the semiconductor device, through a device housing, down to test pads on the substrate. In another example, the through-package debug features are open channels formed from a surface of the semiconductor device.

Abstract: A semiconductor device includes through-package debug features enabling debug of a BGA package while mounted to a printed circuit board or other host device. In one example, the through-package debug features are filled or plated vias extending from a surface of the semiconductor device, through a device housing, down to test pads on the substrate. In another example, the through-package debug features are open channels formed from a surface of the semiconductor device.

Abstract: A semiconductor device is disclosed including through-package debug features enabling debug of a BGA package while mounted to a printed circuit board or other host device. In one example, the through-package debug features are filled or plated vias extending from a surface of the semiconductor device, through a device housing, down to test pads on the substrate. In another example, the through-package debug features are open channels formed from a surface of the semiconductor device.

Abstract: Methods, systems, and computer readable media for storage device workload detection using power consumption are disclosed. One aspect of the subject matter described herein includes a storage device. The storage device includes non-volatile storage. The storage device further includes a device controller for controlling access to the non-volatile storage. A power management controller separate from the device controller senses an indication of power used by at least one of the non-volatile storage and the device controller, compares the sensed indication of power to at least one threshold, and, in response to a predetermined relationship between the sensed indication of power and the at least one threshold, signals the device controller of a workload state of the storage device.

Abstract: A storage system and method for adaptive thermal throttling are disclosed. In one embodiment, a method for adaptive thermal throttling is provided that is performed in a storage system having a memory. This method comprises determining if a temperature of the storage system is above a threshold temperature; and in response to determining that the temperature of the storage system is above the threshold temperature: reducing performance of the storage system in an iterative manner until the temperature of the storage system is within a temperature envelope around the threshold temperature; and storing, in the memory, a value indicating what the performance of the storage system was reduced to in order to get the temperature within the temperature envelope. Other embodiments are possible, and each of the embodiments can be used alone or together in combination.

Abstract: Methods, systems, and computer readable media for storage device workload detection using power consumption are disclosed. One aspect of the subject matter described herein includes a storage device. The storage device includes non-volatile storage. The storage device further includes a device controller for controlling access to the non-volatile storage. A power management controller separate from the device controller senses an indication of power used by at least one of the non-volatile storage and the device controller, compares the sensed indication of power to at least one threshold, and, in response to a predetermined relationship between the sensed indication of power and the at least one threshold, signals the device controller of a workload state of the storage device.

Abstract: A storage system and method for adaptive thermal throttling are disclosed. In one embodiment, a method for adaptive thermal throttling is provided that is performed in a storage system having a memory. This method comprises determining if a temperature of the storage system is above a threshold temperature; and in response to determining that the temperature of the storage system is above the threshold temperature: reducing performance of the storage system in an iterative manner until the temperature of the storage system is within a temperature envelope around the threshold temperature; and storing, in the memory, a value indicating what the performance of the storage system was reduced to in order to get the temperature within the temperature envelope. Other embodiments are possible, and each of the embodiments can be used alone or together in combination.

Abstract: Articles-of-manufacturing comprising an object having a surface and a therapeutically active agent being deposited onto at least a portion of the surface, while at least a portion of said therapeutically active agent being in a crystalline form thereof are disclosed. Methods utilizing such articles-of-manufacturing for treating medical conditions are also disclosed. Processes of preparing the articles-of-manufacturing by contacting a surface of the object with a solution containing the therapeutically active agent; and cooling the surface to a temperature below a temperature of the solution, and apparatus for performing these processes, are also disclosed.