Patents by Inventor Nir Blinky

Nir Blinky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device and method for testing a circuit
    Patent number: 8286040
    Abstract: A device having testing capabilities, the device includes: a tested circuit that includes multiple scan chains; a compactor adapted to compress scan chain test responses; a mask unit, connected between the multiple scan chains and the compactor, wherein the mask unit is adapted to mask scan chain test responses outputted by the multiple scan chains during a masking period; and an mask prevention unit, adapted to prevent masking of scan chain test responses during a mask prevention period that at least partially overlaps a mask unit configuration period.
    Type: Grant
    Filed: February 9, 2007
    Date of Patent: October 9, 2012
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Gal Malach, Nir Blinky, Lior Moheban
  • DEVICE AND METHOD FOR TESTING A CIRCUIT
    Publication number: 20100090706
    Abstract: A device having testing capabilities, the device includes: a tested circuit that includes multiple scan chains; a compactor adapted to compress scan chain test responses; a mask unit, connected between the multiple scan chains and the compactor, wherein the mask unit is adapted to mask scan chain test responses outputted by the multiple scan chains during a masking period; and an mask prevention unit, adapted to prevent masking of scan chain test responses during a mask prevention period that at least partially overlaps a mask unit configuration period.
    Type: Application
    Filed: February 9, 2007
    Publication date: April 15, 2010
    Applicant: FREESCALE SEMICONDUCTOR ,INC.
    Inventors: Gal Malach, Nir Blinky, Lior Moheban