Abstract: According to various embodiments, an Internet of Things (IoT) sensor architecture is disclosed. The architecture includes one or more IoT sensor components configured to capture data and one or more processors configured to analyze the captured data. The processors include a data compression module configured to convert received data into compressed data, a machine learning module configured to extract features from the received data and classify the extracted features, and an encryption/hashing module configured to encrypt and ensure integrity of resulting data from the machine learning module or the received data.

Abstract: A method for estimating the power consumption of an electronic circuit under design that employs a Cycle-Accurate Functional Description (CAFD) which advantageously provides the accuracy achieved by RTL power estimation with the speed and speed of higher-level approaches.

Abstract: An integrated circuit comprising at least one system level decompressor and at least a first hardware block associated with a core level decompressor. The system level decompressor is capable of performing system level decompression of received compressed test data to form partially decompressed test data. The core level decompressor being capable of performing core level decompression of the partially decompressed test data.

Abstract: A method for testing a controller-data path RTL circuit using a BIST scheme without imposing any major design restrictions on the circuit. A state table is extracted from the controller netlist of the circuit using a state machine extraction program. The untested RTL elements/modules in the circuit are then selected, and the test control and data flow (TCDF) of the circuit are extracted from the controller/data path. Once the TCDF is extracted for the selected RTL elements, a symbolic testability analysis (STA) is performed to obtain test environments for as many untested data path elements as possible. The controller input sequence at the select signals of these test multiplexers needed for the particular test environment is noted and/or stored. A BIST controller is synthesized from the stored input sequences and the circuit is integrated with the BIST components using the thereby determined BIST architecture.