Patents by Inventor Niraj Rangwala

Niraj Rangwala has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing system and method
    Patent number: 10444278
    Abstract: A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configured to: provide a voltage signal having a plurality of voltages to the at least one device under test, monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, and determine if one or more of the plurality of monitored current values exceeds one or more of a plurality of current thresholds.
    Type: Grant
    Filed: September 13, 2017
    Date of Patent: October 15, 2019
    Assignee: Xcerra Corporation
    Inventors: Benjamin Brown, Niraj Rangwala, David McConnell, Peter Ho, Howard Maassen
  • Testing system and method
    Patent number: 10379154
    Abstract: A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configured to: provide a voltage signal having a plurality of voltages to the at least one device under test, and monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages. The plurality of monitored current values are stored.
    Type: Grant
    Filed: September 13, 2017
    Date of Patent: August 13, 2019
    Assignee: Xcerra Corporation
    Inventors: Benjamin Brown, Niraj Rangwala, David McConnell, Howard Massenn
  • TESTING SYSTEM AND METHOD
    Publication number: 20180080979
    Abstract: A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configured to: provide a voltage signal having a plurality of voltages to the at least one device under test, monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, and determine if one or more of the plurality of monitored current values exceeds one or more of a plurality of current thresholds.
    Type: Application
    Filed: September 13, 2017
    Publication date: March 22, 2018
    Inventors: Benjamin Brown, Niraj Rangwala, David McConnell, Peter Ho, Howard Maassen
  • TESTING SYSTEM AND METHOD
    Publication number: 20180080978
    Abstract: A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configured to: provide a voltage signal having a plurality of voltages to the at least one device under test, and monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages. The plurality of monitored current values are stored.
    Type: Application
    Filed: September 13, 2017
    Publication date: March 22, 2018
    Inventors: Benjamin Brown, Niraj Rangwala, David McConnell, Howard Maassen