Patents by Inventor Niral M. Sheth

Niral M. Sheth has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240041558
    Abstract: A system for surgical navigation, including an instrument for a medical procedure attached to a camera and having a spatial position relative to the camera, an x-ray system to acquire x-ray images, and multiple fiducial markers detectable by both the camera and x-ray system, having a radio-opaque material arranged as at least one of a line and a point. A computer receives an optical image from the camera and an x-ray image from the x-ray system, identifies fiducial markers visible in both the optical image and x-ray image, determines for each fiducial marker a spatial position relative to the camera based on the optical image and relative to the x-ray system based on the x-ray image, and determines a spatial position for the instrument relative to the x-ray system based on at least the spatial positions relative to the camera and x-ray system.
    Type: Application
    Filed: December 9, 2021
    Publication date: February 8, 2024
    Applicant: The Johns Hopkins University
    Inventors: Jeffrey H. SIEWERDSEN, Niral M. SHETH, Prasad VAGDARGI, Greg M. OSGOOD, Wathudurage Tharindu DE SILVA
  • Patent number: 11790525
    Abstract: A system and method for metal artifact avoidance in 3D x-ray imaging is provided. The method includes determining a 3D location of metal in an object or volume of interest to be scanned; estimating a source-detector orbit that will reduce the severity of metal artifacts; moving an imaging system to locations consistent with the source-detector orbit that was estimated; and scanning the object according to the source-detector orbit.
    Type: Grant
    Filed: December 4, 2020
    Date of Patent: October 17, 2023
    Assignees: THE JOHNS HOPKINS UNIVERSITY, SIEMENS HEALTHCARE GMBH
    Inventors: Jeffrey H. Siewerdsen, Pengwei Wu, Niral M. Sheth, Bjoern W. Kreher
  • Publication number: 20210174502
    Abstract: A system and method for metal artifact avoidance in 3D x-ray imaging is provided. The method includes determining a 3D location of metal in an object or volume of interest to be scanned; estimating a source-detector orbit that will reduce the severity of metal artifacts; moving an imaging system to locations consistent with the source-detector orbit that was estimated; and scanning the object according to the source-detector orbit.
    Type: Application
    Filed: December 4, 2020
    Publication date: June 10, 2021
    Inventors: Jeffrey H. Siewerdsen, Pengwei Wu, Niral M. Sheth, Bjoern W. Kreher