Patents by Inventor Nirav J. Desai

Nirav J. Desai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Generating service call patterns for systems under test
    Patent number: 8977901
    Abstract: Disclosed are various embodiments for generating a service call pattern for a system. A monitor is installed on a first and a second service call channel. Each service call channel is used by a first and second system under test, respectively. Through the monitor, service calls are received from the respective system under test. The service calls are issued to at least one service. A first service call pattern is generated based at least in part on the plurality of service calls issued by the first system under test. A second service call pattern is generated based at least in part on the plurality of service calls issued by the second under test. The first service call pattern report and the second service call pattern report are compared. An error condition if the comparison indicates a difference greater than a predefined threshold.
    Type: Grant
    Filed: August 9, 2013
    Date of Patent: March 10, 2015
    Assignee: Amazon Technologies, Inc.
    Inventors: Nirav J. Desai, Stanislava R. Vlasseva, Kyle Andrew Farrell, Michael C. Moore
  • Generating service call patterns for systems under test
    Patent number: 8510601
    Abstract: Disclosed are various embodiments for generating a service call pattern for a system. A monitor is installed on a first and a second service call channel. Each service call channel is used by a first and second system under test, respectively. Through the monitor, service calls are received from the respective system under test. The service calls are issued to at least one service. A first service call pattern is generated based at least in part on the plurality of service calls issued by the first system under test. A second service call pattern is generated based at least in part on the plurality of service calls issued by the second under test. The first service call pattern report and the second service call pattern report are compared. An error condition if the comparison indicates a difference greater than a predefined threshold.
    Type: Grant
    Filed: September 27, 2010
    Date of Patent: August 13, 2013
    Assignee: Amazon Technologies, Inc.
    Inventors: Nirav J. Desai, Stanislava R. Vlasseva, Kyle Andrew Farrell, Michael C. Moore