Patents by Inventor Nisha Checka

Nisha Checka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150268962
    Abstract: An asynchronous circuit that implements a dual pipeline stage is disclosed. The input stage of the circuit receives asynchronous data. A first converter separates the data from the input stage into alternating pipelines to allow parallel execution. A second converter then merges the data from the dual pipelines back into a single output stage. This technique is useful in improving the speed of a circuit, as it allows parallel execution. In other embodiments, the dual pipelines offer fault tolerance. In some embodiments, the protocol used in the input and output stages is different from that employed in the dual pipelines.
    Type: Application
    Filed: March 24, 2014
    Publication date: September 24, 2015
    Inventors: Nisha Checka, Christopher David Shirk
  • Patent number: 7916128
    Abstract: Surface impacts are located and characterized based on an acoustic signal produced by the impact despite the presence of signal dispersion. Acoustic signals from the surface may be compared to acoustic signals detected external to the surface in order to eliminate spurious impact sensing due to external sounds. Low-frequency acoustic signals may be sensed and identified as explicit hard “bangs” which are of limited utility for pointing and tracking applications.
    Type: Grant
    Filed: January 4, 2010
    Date of Patent: March 29, 2011
    Assignee: Massachusetts Institute of Technology
    Inventors: Joseph A. Paradiso, Che King Leo, Nisha Checka
  • Publication number: 20100116563
    Abstract: Surface impacts are located and characterized based on an acoustic signal produced by the impact despite the presence of signal dispersion. Acoustic signals from the surface may be compared to acoustic signals detected external to the surface in order to eliminate spurious impact sensing due to external sounds. Low-frequency acoustic signals may be sensed and identified as explicit hard “bangs” which are of limited utility for pointing and tracking applications.
    Type: Application
    Filed: January 4, 2010
    Publication date: May 13, 2010
    Applicant: Massachusetts Institute of Technology
    Inventors: Joseph A. Paradiso, Che King Leo, Nisha Checka
  • Patent number: 7643015
    Abstract: Surface impacts are located and characterized based on an acoustic signal produced by the impact despite the presence of signal dispersion. Acoustic signals from the surface may be compared to acoustic signals detected external to the surface in order to eliminate spurious impact sensing due to external sounds. Low-frequency acoustic signals may be sensed and identified as explicit hard “bangs” which are of limited utility for pointing and tracking applications.
    Type: Grant
    Filed: May 24, 2002
    Date of Patent: January 5, 2010
    Assignee: Massachusetts Institute of Technology
    Inventors: Joseph A. Paradiso, Che King Leo, Nisha Checka
  • Patent number: 7480879
    Abstract: System and method for analyzing substrate noise is disclosed, which is capable of accepting inputs of increasing complexity and granularity. During the early phases, the tool can accept coarse circuit descriptions, such as gate level netlists. The tool is capable of generating rudimentary substrate models based on estimated die size, allowing the designer to have an early indication of potential substrate noise issues. During the middle phases, the tool can accept more accurate circuit descriptions, such as a SPICE netlist. A more detailed substrate model can be generated, which considers layout information, thereby allowing the designer to make layout and circuit modifications before the circuit is completed. Lastly, during final verification, the tool can accept an even more accurate netlist, such as a SPICE netlist that includes parasitic capacitance. The tool can also accept a more detailed substrate model and provides the substrate noise analysis necessary to finalize the design.
    Type: Grant
    Filed: April 7, 2006
    Date of Patent: January 20, 2009
    Assignee: Massachusetts Institute of Technology
    Inventors: Nisha Checka, Anantha Chandrakasan, Rafael Reif
  • Publication number: 20070067747
    Abstract: System and method for analyzing substrate noise is disclosed, which is capable of accepting inputs of increasing complexity and granularity. During the early phases, the tool can accept coarse circuit descriptions, such as gate level netlists. The tool is capable of generating rudimentary substrate models based on estimated die size, allowing the designer to have an early indication of potential substrate noise issues. During the middle phases, the tool can accept more accurate circuit descriptions, such as a SPICE netlist. A more detailed substrate model can be generated, which considers layout information, thereby allowing the designer to make layout and circuit modifications before the circuit is completed. Lastly, during final verification, the tool can accept an even more accurate netlist, such as a SPICE netlist that includes parasitic capacitance. The tool can also accept a more detailed substrate model and provides the substrate noise analysis necessary to finalize the design.
    Type: Application
    Filed: April 7, 2006
    Publication date: March 22, 2007
    Inventors: Nisha Checka, Anantha Chandrakasan, Rafael Reif
  • Patent number: 7067909
    Abstract: A multi-layer integrated semiconductor structure is provided, which includes at least a first semiconductor structure and a second semiconductor structure coupled together via an interface. The interface includes at least a first portion adapted to provide a communication interface between the first semiconductor structure and the second semiconductor structure and at least a second portion adapted to reduce electrical interference between the first semiconductor structure and the second semiconductor structure.
    Type: Grant
    Filed: December 30, 2003
    Date of Patent: June 27, 2006
    Assignee: Massachusetts Institute of Technology
    Inventors: Rafael Reif, Nisha Checka, Anantha Chandrakasan
  • Publication number: 20060087019
    Abstract: A multi-layer integrated semiconductor structure is provided, which includes at least a first semiconductor structure and a second semiconductor structure coupled together via an interface. The interface includes at least a first portion adapted to provide a communication interface between the first semiconductor structure and the second semiconductor structure and at least a second portion adapted to reduce electrical interference between the first semiconductor structure and the second semiconductor structure.
    Type: Application
    Filed: December 30, 2003
    Publication date: April 27, 2006
    Inventors: Rafael Reif, Nisha Checka, Anantha Chandrakasan
  • Publication number: 20030217873
    Abstract: Surface impacts are located and characterized based on an acoustic signal produced by the impact despite the presence of signal dispersion. Acoustic signals from the surface may be compared to acoustic signals detected external to the surface in order to eliminate spurious impact sensing due to external sounds. Low-frequency acoustic signals may be sensed and identified as explicit hard “bangs” which are of limited utility for pointing and tracking applications.
    Type: Application
    Filed: May 24, 2002
    Publication date: November 27, 2003
    Applicant: Massachusetts Institute of Technology
    Inventors: Joseph A. Paradiso, Che King Leo, Nisha Checka