Patents by Inventor Nishchal Sharma
Nishchal Sharma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250047427Abstract: This disclosure pertains to systems and methods to detect network errors in a parallel redundant protocol (PRP) network. A node-level redundancy error subsystem of an intelligent electronic device (IED) maintains records (e.g., counts) of information associated with missing duplicate frames expected from node devices on the PRP network via redundant first and second local area networks (LANs). Non-zero counts of missing duplicate frames may be identified as network errors.Type: ApplicationFiled: August 1, 2023Publication date: February 6, 2025Applicant: Schweitzer Engineering Laboratories, Inc.Inventors: Mauricio G. Silveira, Bharat Nalla, Rajeev Kumar Babu, David J. Dolezilek, Edson L. Hernandez Cortinas, Nishchal Sharma, Andrew W. Rash, Andrew A. Miller, Lihua Ran
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Patent number: 11973680Abstract: Systems and methods described herein monitor real-time digital data for degradation. A merging unit may measure electrical parameters in an electric power system using a sensor component and may generate a stream of digital data representing measured electrical parameters. The merging unit may transmit the stream of digital data representing measured electrical parameters and receive a plurality of data frames using an interface. A digital data degradation detection subsystem may analyze a plurality of digital metrics associated with the plurality of data frames and make a determination of whether a subset of the plurality of data frames satisfies the plurality of digital metrics, and the subset of the plurality of data frames fails at least one of the plurality of digital metrics. The merging unit may implement a response when the subset of the plurality of data frames fails at least one of the plurality of digital metrics.Type: GrantFiled: February 9, 2023Date of Patent: April 30, 2024Assignee: Schweitzer Engineering Laboratories, Inc.Inventors: Derek Lautenschlager, Arun Shrestha, Nishchal Sharma, Vinodev E. Rajasekaran, Karthi Sellakkannu, Sajal Harmukh
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Patent number: 11949222Abstract: Disclosed herein is a system for time aligning electric power system measurements at an intelligent electronic device (IED) using samples and sample time offset from merging units. The merging units do not require access to a common time signal. The IED does not require storage of a communication latency with the merging units. The sample time offset corresponds to a latency between obtaining the sample and receipt of the sample at the IED. The IED aligns samples from various merging units using sample time offset values communicated from the merging units to the IED. The IED performs monitoring and protection functions using the time aligned samples.Type: GrantFiled: November 30, 2021Date of Patent: April 2, 2024Assignee: Schweitzer Engineering Laboratories, Inc.Inventors: Lisa Gayle Nelms, Tony J. Lee, Bryon S. Bridges, Derek Lautenschlager, Guillermo Ramirez Conejo, Stephanie L. McDaid, Nishchal Sharma, Bharat Nalla, Vinodev E. Rajasekaran
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Publication number: 20230179505Abstract: Systems and methods described herein monitor real-time digital data for degradation. A merging unit may measure electrical parameters in an electric power system using a sensor component and may generate a stream of digital data representing measured electrical parameters. The merging unit may transmit the stream of digital data representing measured electrical parameters and receive a plurality of data frames using an interface. A digital data degradation detection subsystem may analyze a plurality of digital metrics associated with the plurality of data frames and make a determination of whether a subset of the plurality of data frames satisfies the plurality of digital metrics, and the subset of the plurality of data frames fails at least one of the plurality of digital metrics. The merging unit may implement a response when the subset of the plurality of data frames fails at least one of the plurality of digital metrics.Type: ApplicationFiled: February 9, 2023Publication date: June 8, 2023Applicant: Schweitzer Engineering Laboratories, Inc.Inventors: Derek Lautenschlager, Arun Shrestha, Nishchal Sharma, Vinodev E. Rajasekaran, Karthi Sellakkannu, Sajal Harmukh
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Patent number: 11606281Abstract: Systems and methods are disclosed to monitor real-time digital data for degradation. In one embodiment, an intelligent electronic device (“IED”) in an electric power system may include an interface to receive a stream of digital data, the stream of digital data comprising a plurality of data frames. A protective action subsystem may monitor the sampled digital data and implement a protective action based on the stream of sampled digital data. A digital data degradation detection subsystem may analyze a plurality of digital metrics associated with the plurality of data frames and make a determination regarding degradation of a communication channel based on whether the plurality of digital metrics fails at least one threshold. In response to the determination, the digital data degradation detection subsystem may implement a response to the determination that the plurality of digital metrics fails at least one threshold.Type: GrantFiled: May 20, 2021Date of Patent: March 14, 2023Assignee: Schweitzer Engineering Laboratories, Inc.Inventors: Bharat Nalla, Nishchal Sharma, Arun Shrestha, Ozan Akyildiz, Mauricio G. Silveira, Manodev J. Rajasekaran, Sajal Harmukh, Jaya R A K Yellajosula
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Publication number: 20220377003Abstract: Systems and methods are disclosed to monitor real-time digital data for degradation. In one embodiment, an intelligent electronic device (“IED”) in an electric power system may include an interface to receive a stream of digital data, the stream of digital data comprising a plurality of data frames. A protective action subsystem may monitor the sampled digital data and implement a protective action based on the stream of sampled digital data. A digital data degradation detection subsystem may analyze a plurality of digital metrics associated with the plurality of data frames and make a determination regarding degradation of a communication channel based on whether the plurality of digital metrics fails at least one threshold. In response to the determination, the digital data degradation detection subsystem may implement a response to the determination that the plurality of digital metrics fails at least one threshold.Type: ApplicationFiled: May 20, 2021Publication date: November 24, 2022Applicant: Schweitzer Engineering Laboratories, Inc.Inventors: Bharat Nalla, Nishchal Sharma, Arun Shrestha, Ozan Akyildiz, Mauricio G. Silveira, Manodev J. Rajasekaran, Sajal Harmukh, Jaya R A K Yellajosula
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Publication number: 20220239089Abstract: Disclosed herein is a system for time aligning electric power system measurements at an intelligent electronic device (IED) using samples and sample time offset from merging units. The merging units do not require access to a common time signal. The IED does not require storage of a communication latency with the merging units. The sample time offset corresponds to a latency between obtaining the sample and receipt of the sample at the IED. The IED aligns samples from various merging units using sample time offset values communicated from the merging units to the IED. The IED performs monitoring and protection functions using the time aligned samples.Type: ApplicationFiled: November 30, 2021Publication date: July 28, 2022Applicant: Schweitzer Engineering Laboratories, Inc.Inventors: Lisa Gayle Nelms, Tony J. Lee, Bryon S. Bridges, Derek Lautenschlager, Guillermo Ramirez Conejo, Stephanie L. McDaid, Nishchal Sharma, Bharat Nalla, Vinodev E. Rajasekaran