Patents by Inventor Nishchal Sharma

Nishchal Sharma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11973680
    Abstract: Systems and methods described herein monitor real-time digital data for degradation. A merging unit may measure electrical parameters in an electric power system using a sensor component and may generate a stream of digital data representing measured electrical parameters. The merging unit may transmit the stream of digital data representing measured electrical parameters and receive a plurality of data frames using an interface. A digital data degradation detection subsystem may analyze a plurality of digital metrics associated with the plurality of data frames and make a determination of whether a subset of the plurality of data frames satisfies the plurality of digital metrics, and the subset of the plurality of data frames fails at least one of the plurality of digital metrics. The merging unit may implement a response when the subset of the plurality of data frames fails at least one of the plurality of digital metrics.
    Type: Grant
    Filed: February 9, 2023
    Date of Patent: April 30, 2024
    Assignee: Schweitzer Engineering Laboratories, Inc.
    Inventors: Derek Lautenschlager, Arun Shrestha, Nishchal Sharma, Vinodev E. Rajasekaran, Karthi Sellakkannu, Sajal Harmukh
  • Patent number: 11949222
    Abstract: Disclosed herein is a system for time aligning electric power system measurements at an intelligent electronic device (IED) using samples and sample time offset from merging units. The merging units do not require access to a common time signal. The IED does not require storage of a communication latency with the merging units. The sample time offset corresponds to a latency between obtaining the sample and receipt of the sample at the IED. The IED aligns samples from various merging units using sample time offset values communicated from the merging units to the IED. The IED performs monitoring and protection functions using the time aligned samples.
    Type: Grant
    Filed: November 30, 2021
    Date of Patent: April 2, 2024
    Assignee: Schweitzer Engineering Laboratories, Inc.
    Inventors: Lisa Gayle Nelms, Tony J. Lee, Bryon S. Bridges, Derek Lautenschlager, Guillermo Ramirez Conejo, Stephanie L. McDaid, Nishchal Sharma, Bharat Nalla, Vinodev E. Rajasekaran
  • Publication number: 20230179505
    Abstract: Systems and methods described herein monitor real-time digital data for degradation. A merging unit may measure electrical parameters in an electric power system using a sensor component and may generate a stream of digital data representing measured electrical parameters. The merging unit may transmit the stream of digital data representing measured electrical parameters and receive a plurality of data frames using an interface. A digital data degradation detection subsystem may analyze a plurality of digital metrics associated with the plurality of data frames and make a determination of whether a subset of the plurality of data frames satisfies the plurality of digital metrics, and the subset of the plurality of data frames fails at least one of the plurality of digital metrics. The merging unit may implement a response when the subset of the plurality of data frames fails at least one of the plurality of digital metrics.
    Type: Application
    Filed: February 9, 2023
    Publication date: June 8, 2023
    Applicant: Schweitzer Engineering Laboratories, Inc.
    Inventors: Derek Lautenschlager, Arun Shrestha, Nishchal Sharma, Vinodev E. Rajasekaran, Karthi Sellakkannu, Sajal Harmukh
  • Patent number: 11606281
    Abstract: Systems and methods are disclosed to monitor real-time digital data for degradation. In one embodiment, an intelligent electronic device (“IED”) in an electric power system may include an interface to receive a stream of digital data, the stream of digital data comprising a plurality of data frames. A protective action subsystem may monitor the sampled digital data and implement a protective action based on the stream of sampled digital data. A digital data degradation detection subsystem may analyze a plurality of digital metrics associated with the plurality of data frames and make a determination regarding degradation of a communication channel based on whether the plurality of digital metrics fails at least one threshold. In response to the determination, the digital data degradation detection subsystem may implement a response to the determination that the plurality of digital metrics fails at least one threshold.
    Type: Grant
    Filed: May 20, 2021
    Date of Patent: March 14, 2023
    Assignee: Schweitzer Engineering Laboratories, Inc.
    Inventors: Bharat Nalla, Nishchal Sharma, Arun Shrestha, Ozan Akyildiz, Mauricio G. Silveira, Manodev J. Rajasekaran, Sajal Harmukh, Jaya R A K Yellajosula
  • Publication number: 20220377003
    Abstract: Systems and methods are disclosed to monitor real-time digital data for degradation. In one embodiment, an intelligent electronic device (“IED”) in an electric power system may include an interface to receive a stream of digital data, the stream of digital data comprising a plurality of data frames. A protective action subsystem may monitor the sampled digital data and implement a protective action based on the stream of sampled digital data. A digital data degradation detection subsystem may analyze a plurality of digital metrics associated with the plurality of data frames and make a determination regarding degradation of a communication channel based on whether the plurality of digital metrics fails at least one threshold. In response to the determination, the digital data degradation detection subsystem may implement a response to the determination that the plurality of digital metrics fails at least one threshold.
    Type: Application
    Filed: May 20, 2021
    Publication date: November 24, 2022
    Applicant: Schweitzer Engineering Laboratories, Inc.
    Inventors: Bharat Nalla, Nishchal Sharma, Arun Shrestha, Ozan Akyildiz, Mauricio G. Silveira, Manodev J. Rajasekaran, Sajal Harmukh, Jaya R A K Yellajosula
  • Publication number: 20220239089
    Abstract: Disclosed herein is a system for time aligning electric power system measurements at an intelligent electronic device (IED) using samples and sample time offset from merging units. The merging units do not require access to a common time signal. The IED does not require storage of a communication latency with the merging units. The sample time offset corresponds to a latency between obtaining the sample and receipt of the sample at the IED. The IED aligns samples from various merging units using sample time offset values communicated from the merging units to the IED. The IED performs monitoring and protection functions using the time aligned samples.
    Type: Application
    Filed: November 30, 2021
    Publication date: July 28, 2022
    Applicant: Schweitzer Engineering Laboratories, Inc.
    Inventors: Lisa Gayle Nelms, Tony J. Lee, Bryon S. Bridges, Derek Lautenschlager, Guillermo Ramirez Conejo, Stephanie L. McDaid, Nishchal Sharma, Bharat Nalla, Vinodev E. Rajasekaran