Abstract: Systems and methods disclosed herein provide for an integrated circuit partitioned into a plurality of regions of a two-dimensional grid, wherein each region of the grid corresponds to similarly located scan flops. The systems and methods also provide for enabling clock gates to scan flops in some regions of the integrated circuit and disabling clock gates to other regions in order to better manage power dissipation during ATPG. Specifically, toggle disabling templates are applied during ATPG in order to enable clock gates in certain regions of the two-dimensional grid.

Abstract: A method is provided to improve the usability of Design-For-Testability Synthesis (DFTS) tools and to increase the design process productivity. The method comprises receiving a list of testability and design impact analysis functions, to be performed on the circuit, also referred to as a device under test (DUT). The impact analysis leads to the creation of logical transformations, which can be selected by a user with one or more available transformation methods from a list including, but not limited to, boundary scan test logic insertion, scan test logic insertion, memory BIST (built-in-self-test) logic insertion, and logic BIST logic insertion, and scan test data compression insertion logic insertion.