Abstract: In one embodiment, a system includes at least one projector configured to project a plurality of projected patterns, where a projected lighting characteristic of each of the projected patterns varies over a time period in accordance with an associated predetermined temporal lighting-characteristic pattern, a camera configured to capture images of detected patterns during the time period, and one or more processors configured to: determine, for each detected pattern, a detected temporal lighting-characteristic pattern based on variations in a detected lighting characteristic of the detected pattern, identify a detected pattern that corresponds to one of the projected patterns by comparing at least one of the detected temporal lighting-characteristic patterns to at least one of the temporal lighting-characteristic patterns, and compute a depth associated with the detected patterns based on the one or more of the projected patterns, the detected pattern, and a relative position between the camera and the project

Abstract: In one embodiment, a system includes at least one projector configured to project a plurality of projected patterns, where a projected lighting characteristic of each of the projected patterns varies over a time period in accordance with an associated predetermined temporal lighting-characteristic pattern, a camera configured to capture images of detected patterns during the time period, and one or more processors configured to: determine, for each detected pattern, a detected temporal lighting-characteristic pattern based on variations in a detected lighting characteristic of the detected pattern, identify a detected pattern that corresponds to one of the projected patterns by comparing at least one of the detected temporal lighting-characteristic patterns to at least one of the temporal lighting-characteristic patterns, and compute a depth associated with the detected patterns based on the one or more of the projected patterns, the detected pattern, and a relative position between the camera and the project

Abstract: In one embodiment, a system includes at least one projector comprising a plurality of light emitters, where the projector is configured to project a projected pattern comprising a plurality of projected features having different locations; a camera configured to capture an image comprising a detected pattern corresponding to a reflection of the projected pattern; and one or more processors configured to: identify at least one detected feature of the detected pattern, wherein the detected feature corresponds to at least one reflection of the projected features; and activate or deactivate one or more of the light emitters based on the detected feature. The light emitters may be activated or deactivated by determining a detected feature measurement based on the detected feature, and activating or deactivating one or more of the light emitters when the detected feature measurement satisfies a threshold feature measurement condition.

Abstract: In one embodiment, a system includes at least one projector configured to project a plurality of projected patterns, where a projected lighting characteristic of each of the projected patterns varies over a time period in accordance with an associated predetermined temporal lighting-characteristic pattern, a camera configured to capture images of detected patterns during the time period, and one or more processors configured to: determine, for each detected pattern, a detected temporal lighting-characteristic pattern based on variations in a detected lighting characteristic of the detected pattern, identify a detected pattern that corresponds to one of the projected patterns by comparing at least one of the detected temporal lighting-characteristic patterns to at least one of the temporal lighting-characteristic patterns, and compute a depth associated with the detected patterns based on the one or more of the projected patterns, the detected pattern, and a relative position between the camera and the project

Abstract: A depth camera assembly (DCA) determines depth information for a local area. The DCA includes a plurality of cameras and at least one illuminator. The DCA dynamically determines depth sensing modes (e.g., passive stereo, active stereo, structured stereo) based in part on the surrounding environment and/or user activity. The DCA uses the depth information to update a depth model describing the local area. The DCA may determine that a portion of the depth information associated with some of portion of the local area is not accurate. The DCA may then select a different depth sensing mode for the portion of the local area and update the depth model with the additional depth information. In some embodiments, the DCA may update the depth model by utilizing a machine learning model to generate a refined depth model.

Abstract: In one embodiment, a system includes at least one projector configured to project a plurality of projected patterns, where a projected lighting characteristic of each of the projected patterns varies over a time period in accordance with an associated predetermined temporal lighting-characteristic pattern, a camera configured to capture images of detected patterns, and one or more processors configured to: determine, for each detected pattern, a detected temporal lighting-characteristic pattern based on variations in a detected lighting characteristic of the detected pattern, identify a detected pattern that corresponds to one of the projected patterns by comparing at least one of the detected temporal lighting-characteristic patterns to at least one of the temporal lighting-characteristic patterns, and compute a depth associated with the detected patterns based on the one or more of the projected patterns, the detected pattern, and a relative position between the camera and the projector.

Abstract: In one embodiment, a system includes at least one projector comprising a plurality of light emitters, where the projector is configured to project a projected pattern comprising a plurality of projected features having different locations; a camera configured to capture an image comprising a detected pattern corresponding to a reflection of the projected pattern; and one or more processors configured to: identify at least one detected feature of the detected pattern, wherein the detected feature corresponds to at least one reflection of the projected features; and activate or deactivate one or more of the light emitters based on the detected feature. The light emitters may be activated or deactivated by determining a detected feature measurement based on the detected feature, and activating or deactivating one or more of the light emitters when the detected feature measurement satisfies a threshold feature measurement condition.

Abstract: In one embodiment, a system includes at least one projector comprising a plurality of light emitters, where the projector is configured to project a projected pattern comprising a plurality of projected features having different locations; a camera configured to capture an image comprising a detected pattern corresponding to a reflection of the projected pattern; and one or more processors configured to: identify at least one detected feature of the detected pattern, wherein the detected feature corresponds to at least one reflection of the projected features; and activate or deactivate one or more of the light emitters based on the detected feature. The light emitters may be activated or deactivated by determining a detected feature measurement based on the detected feature, and activating or deactivating one or more of the light emitters when the detected feature measurement satisfies a threshold feature measurement condition.

Abstract: In one embodiment, a system includes at least one projector configured to project a plurality of projected patterns onto a scene, the projected patterns including a first projected pattern that includes a plurality of first projected features, a camera configured to capture a plurality of images including a first detected pattern corresponding to a reflection of the first projected pattern, and one or more processors configured to: compute a depth map of the scene based on the first projected pattern, the first detected pattern, and relative positions of the camera and the at least one projector, project, using the projector, a second projected pattern comprising a plurality of second projected features onto a portion of the scene, where the second projected pattern is more sparse than the first projected pattern, and capture, using the camera, a second detected pattern corresponding to a reflection of the second projected pattern.

Abstract: In one embodiment, a computing system may access a first image and a second image of at least a common portion of an environment while a light emission with a predetermined emission pattern is projected by a projector. The first and second images are respectively captured by a first and a second detector that are respectively separated from the projector by a first and a second distance. The system may determine that a first portion of the first image corresponds to a second portion of the second image. The system may compute, using triangulation, a first depth value associated with the first portion and a second depth value associated with the second portion. The system may determine that the first and second depth values match in accordance with one or more predetermined criteria, and generate a depth map of the environment based on at least one of the depth values.

Abstract: In one embodiment, a system includes a first projector configured to project a first projected pattern having one or more first projected lighting characteristics, a second projector configured to project a second projected pattern having one or more second projected lighting characteristics, a camera configured to capture an image comprising first and second detected patterns corresponding to reflections of the first and second projected patterns, respectively, and one or more processors configured to: identify a detected point in the image that corresponds to a projected point in at least one of the first and second projected patterns by comparing detected lighting characteristics of the first and second detected patterns with the first and second projected lighting characteristics, and compute a depth associated with the detected point based on the projected point, the detected point, and a relative position between the camera and at least one of the projectors.

Abstract: In one embodiment, a system includes a first projector configured to project a first projected pattern having one or more first projected lighting characteristics, a second projector configured to project a second projected pattern having one or more second projected lighting characteristics, a camera configured to capture an image comprising first and second detected patterns corresponding to reflections of the first and second projected patterns, respectively, and one or more processors configured to: identify a detected point in the image that corresponds to a projected point in at least one of the first and second projected patterns by comparing detected lighting characteristics of the first and second detected patterns with the first and second projected lighting characteristics, and compute a depth associated with the detected point based on the projected point, the detected point, and a relative position between the camera and at least one of the projectors.

Abstract: In one embodiment, a computing system may access a first image and a second image of at least a common portion of an environment while a light emission with a predetermined emission pattern is projected by a projector. The first and second images are respectively captured by a first and a second detector that are respectively separated from the projector by a first and a second distance. The system may determine that a first portion of the first image corresponds to a second portion of the second image. The system may compute, using triangulation, a first depth value associated with the first portion and a second depth value associated with the second portion. The system may determine that the first and second depth values match in accordance with one or more predetermined criteria, and generate a depth map of the environment based on at least one of the depth values.

Abstract: The disclosed method may include (1) sensing, via a depth-sensing subsystem, a plurality of locations in three-dimensional space corresponding to physical surfaces in a real-world environment, (2) determining a dominant plane within the real-world environment, (3) defining a three-dimensional grid that is aligned with the dominant plane, (4) identifying, based on the plurality of locations relative to the dominant plane, a set of grid coordinates within the three-dimensional grid that are indicative of the physical surfaces, and (5) determining, based on the set of grid coordinates, a safety boundary to be employed by a head-mounted display system to notify a user of the head-mounted display system of the user's proximity to the physical surfaces. Various other methods, systems, and computer-readable media are also disclosed.

Abstract: A method and system for estimating edge data in patterned light analysis are provided herein. The method may include: obtaining an original depth map of an object generated based on structured light analysis of a pattern comprising stripes; determining portions of the original depth map in which z-axis value is inaccurate given an edge of the object; detecting geometric feature of the object associated with the determined portion, based on neighboring portions of the depth map; and estimating the missing z-axis data along the edge of the object, based on the detecting geometric feature of the object.