Patents by Inventor Niv Sarig

Niv Sarig has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10222710
    Abstract: A method for use in planning metrology measurements, the method comprising: providing inverse total measurement uncertainty (TMU) analysis equations for upper and lower confidence limits TMUUL and TMULL of the TMU being independent on prior knowledge of measurements by a tool under test (TuT) and a reference measurement system (RMS), thereby enabling estimation of input parameters for said equations prior to conducting an experiment of the TMU analysis; and determining at least one of a total number N of samples to be measured in the TMU analysis and an average number ns of measurements per sample by the RMS.
    Type: Grant
    Filed: February 26, 2015
    Date of Patent: March 5, 2019
    Assignee: NOVA MEASURING INSTRUMENTS LTD.
    Inventors: Matthew Sendelbach, Niv Sarig, Charles N. Archie
  • Publication number: 20160363872
    Abstract: A method for use in planning metrology measurements, the method comprising: providing inverse total measurement uncertainty (TMU) analysis equations for upper and lower confidence limits TMUUL and TMULL of the TMU being independent on prior knowledge of measurements by a tool under test (TuT) and a reference measurement system (RMS), thereby enabling estimation of input parameters for said equations prior to conducting an experiment of the TMU analysis; and determining at least one of a total number N of samples to be measured in the TMU analysis and an average number ns of measurements per sample by the RMS.
    Type: Application
    Filed: February 26, 2015
    Publication date: December 15, 2016
    Inventors: Matthew SENDELBACH, Niv SARIG, Charles N. ARCHIE
  • Patent number: 9070207
    Abstract: A system includes an aligner to align an initial position of a partially kinematically, parameterized model with an object in an image, and a modelizer to adjust parameters of the model to match the model to contours of the object, given the initial alignment. An animation system includes a modelizer to hierarchically match a hierarchically rigid model to an object in an image, and a cutter to cut the object from the image and to associate it with the model. A method for animation includes hierarchically matching a hierarchically rigid model to an object in an image, and cutting the object from the image to associate it with the model.
    Type: Grant
    Filed: September 7, 2008
    Date of Patent: June 30, 2015
    Assignee: Yeda Research & Development Co., Ltd.
    Inventors: Yosef Yomdin, Gregory Dinkin, Niv Sarig, Avital Yomdin
  • Publication number: 20100259546
    Abstract: A system includes an aligner to align an initial position of an at least partially kinematically, parameterized model with an object in an image, and a modelizer to adjust parameters of the model to match the model to contours of the object, given the initial alignment. An animation system includes a modelizer to hierarchically match a hierarchically rigid model to an object in an image, and a cutter to cut said object from said image and to associate it with said model. A method for animation includes hierarchically matching a hierarchically rigid model to an object in an image, and cutting said object from said image to associate it with said model.
    Type: Application
    Filed: September 7, 2008
    Publication date: October 14, 2010
    Applicant: YEDA RESEARCH AND DEVELOPMENT CO. LTD.
    Inventors: Yosef Yomdin, Gregory Dinkin, Niv Sarig, Avital Yomdin