Abstract: An antenna alignment apparatus includes a first antenna alignment unit. The first antenna alignment unit may include: a flange coupled to a transmit antenna jig providing two-axis rotational motion; a first bearing coupled to the flange; a cylinder inserted into the first bearing to rotate; an optical fiber collimator inserted into and aligned with the cylinder and having a variable focal length; an optical fiber mounted on the optical fiber collimator; and a plurality of screws contacting an external side surface of the optical fiber collimator through an external side surface of the cylinder and aligning a central axis of the optical fiber collimator and a central axis of the cylinder.

Abstract: The present disclosure relates to a vapor cell and a vapor cell temperature control system, and more specifically, to a vapor cell and a vapor cell temperature control system which use a laser to control the temperature of the vapor cell without distortion of an electromagnetic field. The vapor cell according to an embodiment of the present disclosure may include a body provided with a penetration part, which is a space in which a reactive material is accommodated, and a black material provided on a part of an outer surface of the body. According to an embodiment of the present disclosure, there is an advantage in that the intensity and phase of electromagnetic waves in the micromagnetic field and millimeter wave band can be measured by minimizing distortion and removing noise caused by a temperature control device when measuring electromagnetic fields using an atomic system.

Abstract: The present disclosure relates to an electromagnetically induced grating-based electric field detection system and method and, more particularly, to an electric field detection system and method which enable the creation of an electromagnetically induced transparency grating using a low-wavelength laser and enables real-time electromagnetic wave measurement by avoiding the frequency reprocessing of the signal that is essential in the existing Rydberg atom-based electric field measurement technology.

Abstract: A measurement system according to an embodiment of the present invention comprises: an analyzer; a first expansion module for transmitting a first electromagnetic wave signal to a first antenna under control of the analyzer; a second expansion module for receiving a second electromagnetic wave signal through a second antenna; a first signal generator for generating a first local oscillation signal under control of the analyzer, and detecting a reference characteristic of the first electromagnetic wave signal and a first test characteristic of the first antenna by using the first local oscillation signal; and a second signal generator for generating a second local oscillation signal under control of the analyzer, and detecting a second test characteristic of the second antenna by using the second local oscillation signal, wherein the first signal generator comprises a controller for converting instructions transmitted from the analyzer into internal instructions, and a local oscillation signal generator for ge

Abstract: An electromagnetic wave impedance measuring apparatus includes a network analyzer, configured to measure scattering parameters according to a frequency, including a first port and a second port; and a multilayer substrate, connected to the first port and the second port by a coaxial cable, having a via connecting conductive layers to each other and including three or more conductive layers including at least an uppermost layer, a lowermost layer, and an intermediate layer. The multilayer substrate includes a test sample disposed between the uppermost layer and the lowermost layer; a through calibration standard disposed between the uppermost layer and the lowermost layer; a reflect calibration standard disposed between the uppermost layer and the lowermost layer; and a line calibration standard disposed between the uppermost layer and the lowermost layer.

Abstract: A measurement system according to an embodiment of the present invention comprises: an analyzer; a first expansion module for transmitting a first electromagnetic wave signal to a first antenna under control of the analyzer; a second expansion module for receiving a second electromagnetic wave signal through a second antenna; a first signal generator for generating a first local oscillation signal under control of the analyzer, and detecting a reference characteristic of the first electromagnetic wave signal and a first test characteristic of the first antenna by using the first local oscillation signal; and a second signal generator for generating a second local oscillation signal under control of the analyzer, and detecting a second test characteristic of the second antenna by using the second local oscillation signal, wherein the first signal generator comprises a controller for converting instructions transmitted from the analyzer into internal instructions, and a local oscillation signal generator for ge

Abstract: An electromagnetic wave impedance measuring apparatus includes a network analyzer, configured to measure scattering parameters according to a frequency, including a first port and a second port; and a multilayer substrate, connected to the first port and the second port by a coaxial cable, having a via connecting conductive layers to each other and including three or more conductive layers including at least an uppermost layer, a lowermost layer, and an intermediate layer. The multilayer substrate includes a test sample disposed between the uppermost layer and the lowermost layer; a through calibration standard disposed between the uppermost layer and the lowermost layer; a reflect calibration standard disposed between the uppermost layer and the lowermost layer; and a line calibration standard disposed between the uppermost layer and the lowermost layer.