Patents by Inventor Noah Hymes-Vandermeulen
Noah Hymes-Vandermeulen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11874452Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: GrantFiled: March 16, 2022Date of Patent: January 16, 2024Assignee: Alentic Microscience Inc.Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
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Publication number: 20220206282Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: ApplicationFiled: March 16, 2022Publication date: June 30, 2022Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
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Publication number: 20200379234Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: ApplicationFiled: August 17, 2020Publication date: December 3, 2020Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
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Patent number: 10809512Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: GrantFiled: June 27, 2019Date of Patent: October 20, 2020Assignee: Alentic Microscience Inc.Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
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Patent number: 10746979Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: GrantFiled: June 27, 2019Date of Patent: August 18, 2020Assignee: Alentic Microscience Inc.Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
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Patent number: 10459213Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: GrantFiled: June 1, 2018Date of Patent: October 29, 2019Assignee: Alentic Microscience Inc.Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
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Publication number: 20190324258Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: ApplicationFiled: June 27, 2019Publication date: October 24, 2019Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
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Publication number: 20190317309Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: ApplicationFiled: June 27, 2019Publication date: October 17, 2019Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
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Publication number: 20180284416Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: ApplicationFiled: June 1, 2018Publication date: October 4, 2018Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
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Patent number: 9989750Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: GrantFiled: November 23, 2016Date of Patent: June 5, 2018Assignee: Alentic Microscience Inc.Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
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Publication number: 20170075099Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: ApplicationFiled: November 23, 2016Publication date: March 16, 2017Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
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Patent number: 9518920Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: GrantFiled: June 25, 2014Date of Patent: December 13, 2016Assignee: Alentic Microscience Inc.Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
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Publication number: 20150002834Abstract: Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.Type: ApplicationFiled: June 25, 2014Publication date: January 1, 2015Inventors: Alan Marc Fine, Hershel Macaulay, Noah Hymes-Vandermeulen
