Abstract: There is provided a metrology system and method. The method includes obtaining a set of tool parameters selected from multiple tool parameters characterizing the examination tool, varying a value of each tool parameter from the set a number of times, giving rise to a plurality of tool settings corresponding to a plurality of combinations of varying values of the set of tool parameters, configuring an examination tool with each given tool setting of the plurality of tool settings; and in response to receiving, from the examination tool, a plurality of sets of images corresponding to the plurality of tool settings and representing expected tool variations over time in a single tool or between different tools, optimizing a metrology algorithm using the plurality of sets of images so as to meet at least one metrology metric including tool matching.

Abstract: Techniques described herein are related to a system, medium, and method of depth data filling of shadows for image processing comprising obtaining a location of at least one gap of missing depth data on pixel image data of at least one image, calculating a shadow band length corresponding to a size and position of the gap on the image, and calculated by using, at least in part, background and foreground depth values, and providing depth values of multiple pixel locations extending along the shadow band length.

Abstract: Techniques described herein are related to a system, medium, and method of depth data filling of shadows for image processing.

Abstract: Systems and methods may provide for obtaining data associated with an image and using a plurality of threads in a graphics processor to conduct a single instruction multiple data (SIMD) scan of the data. Additionally, systems and methods may provide for generating a plurality of connection tables corresponding to the plurality of threads based on the SIMD scan. In one example, a plurality of threads in the graphics processor are used to conduct a single phase merge of the plurality of connection tables onto a global connected components labeling (CCL) table for the image.

Abstract: Techniques related to blob detection in noisy images are discussed. Such techniques may include traversing a contour associated with a candidate blob contour pixel to an inline pixel along a predetermined orientation, detecting a direction of the inline pixel with respect to the candidate blob contour pixel, and continuing to traverse the contour as a contour of the blob or detecting a second candidate blob contour pixel based on the detected direction.

Abstract: Techniques related to blob detection in noisy images are discussed. Such techniques may include traversing a contour associated with a candidate blob contour pixel to an inline pixel along a predetermined orientation, detecting a direction of the inline pixel with respect to the candidate blob contour pixel, and continuing to traverse the contour as a contour of the blob or detecting a second candidate blob contour pixel based on the detected direction.

Abstract: Systems and methods may provide for obtaining data associated with an image and using a plurality of threads in a graphics processor to conduct a single instruction multiple data (SIMD) scan of the data. Additionally, systems and methods may provide for generating a plurality of connection tables corresponding to the plurality of threads based on the SIMD scan. In one example, a plurality of threads in the graphics processor are used to conduct a single phase merge of the plurality of connection tables onto a global connected components labeling (CCL) table for the image.