Patents by Inventor Nobuaki Ema

Nobuaki Ema has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20030164940
    Abstract: A swept-wavelength loss measuring system is provided with an arrangement including a tunable laser source that outputs light to a DUT with the wavelength being continuously varied, and outputs measuring trigger signals at arbitrary intervals, at least one optical power meter for measuring an intensity of light transmitted through the DUT in response to reception of each of the measuring trigger signals, a wavelength measuring unit for measuring a wavelength of the outputted light from the tunable laser source in response to reception of each of the measuring trigger signals, and an arithmetic operation unit carrying out an arithmetic operation of the outputs from the optical power meter and the wavelength measuring unit to output a light intensity value relative to each wavelength. The arrangement assures accuracy of the measured wavelength.
    Type: Application
    Filed: March 3, 2003
    Publication date: September 4, 2003
    Inventors: Kiyohisa Fujita, Nobuaki Ema
  • Publication number: 20020196818
    Abstract: In a tunable laser source device for branching a light output from a tunable laser source portion 1 to supply to a wavelength measuring device 6 and a wavelength calibrating reference device 5 and then controlling the tunable laser source portion in response to an output of the wavelength measuring device, at least one peak and one notch or two peaks or two notches or more in a measurement interference period of the wavelength measuring device are included between a plurality of reference wavelengths of the wavelength calibrating reference device.
    Type: Application
    Filed: June 13, 2002
    Publication date: December 26, 2002
    Inventors: Seiji Funakawa, Nobuaki Ema
  • Publication number: 20020191652
    Abstract: In a tunable laser source device for branching a light output from a tunable laser source portion 1 to supply to a wavelength measuring device 6 and a gas cell as a reference for calibrating wavelength 5 and then controlling the tunable laser source portion in response to an output of the wavelength measuring device, a temperature controlling device is provided to the wavelength measuring device to mate a result measured by the wavelength measuring device with an interval of a plurality of absorbed line wavelengths in the gas cell as a reference for calibrating wavelength.
    Type: Application
    Filed: June 13, 2002
    Publication date: December 19, 2002
    Inventor: Nobuaki Ema
  • Publication number: 20020141727
    Abstract: A variable-wavelength light source unit for sending output light of an arbitrary wavelength selected in a variable-wavelength light source section 1 has an optical variable attenuator 2 placed on the output side of the variable-wavelength light source section and a control circuit 4 for controlling the attenuation amount of the optical variable attenuator in response to light output provided by splitting a part of the output light.
    Type: Application
    Filed: April 2, 2002
    Publication date: October 3, 2002
    Inventors: Nobuaki Ema, Hiroki Saito
  • Publication number: 20020027658
    Abstract: An optical coupler 13, a reflection attenuation amount measurement photodetector 14, and an APC photodetector 15 are provided in a variable-wavelength light source apparatus 1 and the reflection attenuation amount can be measured simply by connecting a device under test without using any external optical power meter, etc, and when wavelength calibration is executed, an external wavelength calibration gas cell 18 and a total reflection termination 20 are connected, whereby the wavelength of an optical signal output from a variable-wavelength light source 11 can be measured and controlled with higher accuracy.
    Type: Application
    Filed: August 21, 2001
    Publication date: March 7, 2002
    Inventor: Nobuaki Ema
  • Publication number: 20020024670
    Abstract: An optical component measurement apparatus 1 is provided with an alignment controller 16 for adjusting alignment between a device 15 under test and measurement optical fibers. Further, each of a plurality of photodetectors 14 constituting an optical component tester 10 is provided with an analog signal output terminal. By means of switching action of a switch 18, an arbitrary output terminal can be connected to the voltmeter 17. The voltmeter 17 is equipped further with a waveform display device 19, thereby enabling monitoring of alignment without use of an external digital voltmeter or recorder.
    Type: Application
    Filed: August 21, 2001
    Publication date: February 28, 2002
    Inventor: Nobuaki Ema
  • Patent number: 5937122
    Abstract: A high-reflection attenuation light-interception apparatus having a measured optical plug (1) which is PC polished on its output terminal, a short ferrule (2) which has an internal graded index fiber (6) with a PC polished input terminal and diagonal polished output terminal, a receptacle (3) which directly connects the output terminal of the measured optical plug (1) and the input terminal of the short ferrule (2), a light-interception element which receives light propagated through the graded index fiber (6) in the short ferrule (2), and a light-interception element block which fixes in face to face relationship the output terminal of the short ferrule (2) and the receiving surface of the light-interception element (4).
    Type: Grant
    Filed: August 21, 1997
    Date of Patent: August 10, 1999
    Assignee: Ando Electric Co., Ltd.
    Inventors: Kazuhiro Ohki, Yoshinori Satoh, Nobuaki Ema