Abstract: An apparatus for detecting a pallet full load state determines a pallet full load state while switching the upper limit value of the mounting height of workpieces according to workpiece size. The controller of an apparatus for controlling a sheet metal machining line estimates an occurrence or non-occurance of a pallet full load state. A pallet full load state is defined as a function of the overall height or the total weight of the workpieces loaded on the carrier pallet. The controller estimates an occurance or non-occurance of a pallet full load state by analyzing the machining schedule when a machined workpiece is loaded on the carrier pallet has a replacing carrier pallet suitable for the next workpiece to be loaded standby whenever appropriate.

Abstract: A cell controller is provided that analyzes each unit machining schedule, which is referred to for manufacturing products, prior to the start of the assigned unit machining schedule. The data items in the schedule are analyzed include identification numbers of machining programs, the use or non-use of such identification numbers, the number of workpieces to be machined, and a presence or absence of predetermined procedures (e.g., for exchanging metal molds, etc.) that are referred to for manufacturing the products. An operator is notified of any foreseeable schedule alarm condition, that will force the operation of the line of manufacturing products of a specific item to be suspended, so that the operator may be informed of the situation in advance. The foreseeable schedule alarm condition may arise for reasons such as an insufficient number of available workpieces and/or preparatory work to be done (e.g., an exchange of metal molds, etc.).

Abstract: In one type of scanning electron microscope, a specimen is inserted substantially centrally in a gap between the magnetic pole pieces of an objective lens and the secondary electrons from the specimen are detected by the detecting means disposed upwardly of the objective lens. In this invention, a pipe electrode is incorporated along the optical axis of the objective lens between the objective lens and the detecting means so that the primary electron beam irradiating the specimen is not adversely affected by the detecting means. Further, a mesh electrode maintained at positive potential against the specimen is incorporated at the bottom end of the pipe electrode so that almost all the secondary electrons from the specimen are attracted toward the detecting means.