Patents by Inventor Nobuchika Matsui

Nobuchika Matsui has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Impulse immunity test apparatus
    Patent number: 8410791
    Abstract: The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform. A TLP generator is used as a rectangular wave generator. The sum of an injection resistance and a matching resistance is set so as to match the characteristic impedance of a transmission line for transmitting a rectangular wave to a test target. A capacitor is connected to a return line of the applied rectangular wave. With this configuration, stable application can be achieved. An error observation function of an electronic circuit gradually increases a peak value of the rectangular wave and determines the immunity based on an application voltage to cause an error for the first time.
    Type: Grant
    Filed: March 6, 2008
    Date of Patent: April 2, 2013
    Assignees: NEC Corporation, Renesas Electronics Corporation, Hanwa Electronic Ind. Co., Ltd.
    Inventors: Tsuneo Tsukagoshi, Takeshi Watanabe, Toshiyuki Nakaie, Nobuchika Matsui
  • IMPULSE IMMUNITY TEST APPARATUS
    Publication number: 20100090710
    Abstract: The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform. A TLP generator is used as a rectangular wave generator. The sum of an injection resistance and a matching resistance is set so as to match the characteristic impedance of a transmission line for transmitting a rectangular wave to a test target. A capacitor is connected to a return line of the applied rectangular wave. With this configuration, stable application can be achieved. An error observation function of an electronic circuit gradually increases a peak value of the rectangular wave and determines the immunity based on an application voltage to cause an error for the first time.
    Type: Application
    Filed: March 6, 2008
    Publication date: April 15, 2010
    Applicants: NEC Corporation, NEC Electronics Corporation, Hanwa Electronic Ind. Co., Ltd.
    Inventors: Tsuneo Tsukagoshi, Takeshi Watanabe, Toshiyuki Nakaie, Nobuchika Matsui