Patents by Inventor Nobuharu Ishikawa
Nobuharu Ishikawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8491157Abstract: To provide a method for manufacturing a plurality of types of illuminating devices having different specifications while reducing cost. A substrate includes a common flexible portion and a plurality of units bendable with respect to the common portion, where the common portion includes a pad that is extended in the horizontal direction in the plane of the drawing and that is arranged for every predefined interval. In the present manufacturing method, a substrate piece is created by cutting the substrate mounted with the light emitting element in a first direction, the common portion in the substrate piece is formed according to the illuminating device to be manufactured, the relative position of the individual portion with respect to the formed common portion is respectively positioned, and the wiring for supplying power to the pad in the substrate piece is formed.Type: GrantFiled: March 10, 2011Date of Patent: July 23, 2013Assignee: OMRON CorporationInventors: Hitoshi Oba, Naoki Nishimori, Akira Matsui, Nobuharu Ishikawa, Yoshihiro Yamashita, Takahiro Suga, Kosuke Sugiyama
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Publication number: 20110222286Abstract: To provide a method for manufacturing a plurality of types of illuminating devices having different specifications while reducing cost. A substrate includes a common flexible portion and a plurality of units bendable with respect to the common portion, where the common portion includes a pad that is extended in the horizontal direction in the plane of the drawing and that is arranged for every predefined interval. In the present manufacturing method, a substrate piece is created by cutting the substrate mounted with the light emitting element in a first direction, the common portion in the substrate piece is formed according to the illuminating device to be manufactured, the relative position of the individual portion with respect to the formed common portion is respectively positioned, and the wiring for supplying power to the pad in the substrate piece is formed.Type: ApplicationFiled: March 10, 2011Publication date: September 15, 2011Applicant: OMRON CORPORATIONInventors: Hitoshi OBA, Naoki NISHIMORI, Akira MATSUI, Nobuharu ISHIKAWA, Yoshihiro YAMASHITA, Takahiro SUGA, Kosuke SUGIYAMA
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Patent number: 7333912Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.Type: GrantFiled: March 21, 2006Date of Patent: February 19, 2008Assignee: Omron CorporationInventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
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Patent number: 7305321Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.Type: GrantFiled: March 21, 2006Date of Patent: December 4, 2007Assignee: Omron CorporationInventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
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Publication number: 20070263338Abstract: The corona discharge type ionizer has an airflow sensor disposed on an air path and a CPU (corona discharge control part) which stops discharge operation of discharge needles when it is determined from an output signal of the airflow sensor that airflow on the air path is lowered to a set value or less.Type: ApplicationFiled: May 10, 2007Publication date: November 15, 2007Inventors: Hirotaka NAKASHIMA, Taketo YASUZUMI, Nobuharu ISHIKAWA, Kohei TOMITA
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Publication number: 20060224353Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.Type: ApplicationFiled: March 21, 2006Publication date: October 5, 2006Inventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
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Publication number: 20060224354Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.Type: ApplicationFiled: March 21, 2006Publication date: October 5, 2006Inventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
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Patent number: 7092842Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.Type: GrantFiled: September 16, 2004Date of Patent: August 15, 2006Assignee: Omron CorporationInventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
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Publication number: 20050110000Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.Type: ApplicationFiled: September 16, 2004Publication date: May 26, 2005Inventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
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Patent number: 6747745Abstract: In a displacement sensor (10) comprising a sensor head (1) and a controller (2) either integrally or separately, the sensor head comprises a measurement light emitting optical system (113), an image acquiring optical system (127a, 127b) and a two dimensional imaging device (122). The controller can control the imaging condition associated with the brightness of the image in the form of a video signal both under a measurement mode and an observation mode. Under the measurement mode, with a light source (112) for measurement turned on, the imaging condition is adjusted in such a manner that a measurement light radiated light image (83) can be imaged at an appropriate brightness but a surrounding part (71) of the measurement object is substantially darker than the appropriate brightness, and a desired displacement is computed according the video signal obtained by the two dimensional imaging device (122).Type: GrantFiled: November 30, 2001Date of Patent: June 8, 2004Assignee: Omron CorporationInventors: Nobuharu Ishikawa, Yoshihiro Yamashita, Hirotaka Nakashima, Masahiro Kawachi, Koji Shimada, Hitoshi Oba
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Publication number: 20030067613Abstract: In a displacement sensor (10) comprising a sensor head (1) and a controller (2) either integrally or separately, the sensor head comprises a measurement light emitting optical system (113), an image acquiring optical system (127a, 127b) and a two dimensional imaging device (122). The controller can control the imaging condition associated with the brightness of the image in the form of a video signal both under a measurement mode and an observation mode. Under the measurement mode, with a light source (112) for measurement turned on, the imaging condition is adjusted in such a manner that a measurement light radiated light image (83) can be imaged at an appropriate brightness but a surrounding part (71) of the measurement object is substantially darker than the appropriate brightness, and a desired displacement is computed according the video signal obtained by the two dimensional imaging device (122).Type: ApplicationFiled: November 30, 2001Publication date: April 10, 2003Inventors: Nobuharu Ishikawa, Yoshihiro Yamashita, Hirotaka Nakashima, Masahiro Kawachi, Koji Shimada, Hitoshi Oba
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Patent number: 5790259Abstract: Each of a detection sample object and a non-detection sample object is illuminated with S-polarization light, for instance. S-polarization light and P-polarization light reflected from each sample object are detected by different photodetecting elements. Glossiness values and light quantities of the detection and non-detection sample objects are judged based on detection outputs of the photodetecting elements, and a glossiness difference and a light quantity difference are calculated. An evaluation function having at least one of the glossiness and the light quantity as a variable is determined by using the glossiness difference and the light quantity difference. Thresholds for object discrimination are calculated based on evaluation function values of the detection and non-detection sample objects.Type: GrantFiled: April 5, 1996Date of Patent: August 4, 1998Assignee: Omron CorporationInventors: Shinji Mizuhata, Hayami Hosokawa, Arata Nakamura, Nobuharu Ishikawa, Hiroyuki Inoue, Satoru Shimokawa, Masahiro Kurokawa, Kohei Tomita, Norimasa Yamanaka