Patents by Inventor Nobuharu Ishikawa

Nobuharu Ishikawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8491157
    Abstract: To provide a method for manufacturing a plurality of types of illuminating devices having different specifications while reducing cost. A substrate includes a common flexible portion and a plurality of units bendable with respect to the common portion, where the common portion includes a pad that is extended in the horizontal direction in the plane of the drawing and that is arranged for every predefined interval. In the present manufacturing method, a substrate piece is created by cutting the substrate mounted with the light emitting element in a first direction, the common portion in the substrate piece is formed according to the illuminating device to be manufactured, the relative position of the individual portion with respect to the formed common portion is respectively positioned, and the wiring for supplying power to the pad in the substrate piece is formed.
    Type: Grant
    Filed: March 10, 2011
    Date of Patent: July 23, 2013
    Assignee: OMRON Corporation
    Inventors: Hitoshi Oba, Naoki Nishimori, Akira Matsui, Nobuharu Ishikawa, Yoshihiro Yamashita, Takahiro Suga, Kosuke Sugiyama
  • Publication number: 20110222286
    Abstract: To provide a method for manufacturing a plurality of types of illuminating devices having different specifications while reducing cost. A substrate includes a common flexible portion and a plurality of units bendable with respect to the common portion, where the common portion includes a pad that is extended in the horizontal direction in the plane of the drawing and that is arranged for every predefined interval. In the present manufacturing method, a substrate piece is created by cutting the substrate mounted with the light emitting element in a first direction, the common portion in the substrate piece is formed according to the illuminating device to be manufactured, the relative position of the individual portion with respect to the formed common portion is respectively positioned, and the wiring for supplying power to the pad in the substrate piece is formed.
    Type: Application
    Filed: March 10, 2011
    Publication date: September 15, 2011
    Applicant: OMRON CORPORATION
    Inventors: Hitoshi OBA, Naoki NISHIMORI, Akira MATSUI, Nobuharu ISHIKAWA, Yoshihiro YAMASHITA, Takahiro SUGA, Kosuke SUGIYAMA
  • Patent number: 7333912
    Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.
    Type: Grant
    Filed: March 21, 2006
    Date of Patent: February 19, 2008
    Assignee: Omron Corporation
    Inventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
  • Patent number: 7305321
    Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.
    Type: Grant
    Filed: March 21, 2006
    Date of Patent: December 4, 2007
    Assignee: Omron Corporation
    Inventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
  • Publication number: 20070263338
    Abstract: The corona discharge type ionizer has an airflow sensor disposed on an air path and a CPU (corona discharge control part) which stops discharge operation of discharge needles when it is determined from an output signal of the airflow sensor that airflow on the air path is lowered to a set value or less.
    Type: Application
    Filed: May 10, 2007
    Publication date: November 15, 2007
    Inventors: Hirotaka NAKASHIMA, Taketo YASUZUMI, Nobuharu ISHIKAWA, Kohei TOMITA
  • Publication number: 20060224353
    Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.
    Type: Application
    Filed: March 21, 2006
    Publication date: October 5, 2006
    Inventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
  • Publication number: 20060224354
    Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.
    Type: Application
    Filed: March 21, 2006
    Publication date: October 5, 2006
    Inventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
  • Patent number: 7092842
    Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.
    Type: Grant
    Filed: September 16, 2004
    Date of Patent: August 15, 2006
    Assignee: Omron Corporation
    Inventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
  • Publication number: 20050110000
    Abstract: An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.
    Type: Application
    Filed: September 16, 2004
    Publication date: May 26, 2005
    Inventors: Yusuke Iida, Yuichi Inoue, Nobuharu Ishikawa, Toru Hosoda
  • Patent number: 6747745
    Abstract: In a displacement sensor (10) comprising a sensor head (1) and a controller (2) either integrally or separately, the sensor head comprises a measurement light emitting optical system (113), an image acquiring optical system (127a, 127b) and a two dimensional imaging device (122). The controller can control the imaging condition associated with the brightness of the image in the form of a video signal both under a measurement mode and an observation mode. Under the measurement mode, with a light source (112) for measurement turned on, the imaging condition is adjusted in such a manner that a measurement light radiated light image (83) can be imaged at an appropriate brightness but a surrounding part (71) of the measurement object is substantially darker than the appropriate brightness, and a desired displacement is computed according the video signal obtained by the two dimensional imaging device (122).
    Type: Grant
    Filed: November 30, 2001
    Date of Patent: June 8, 2004
    Assignee: Omron Corporation
    Inventors: Nobuharu Ishikawa, Yoshihiro Yamashita, Hirotaka Nakashima, Masahiro Kawachi, Koji Shimada, Hitoshi Oba
  • Publication number: 20030067613
    Abstract: In a displacement sensor (10) comprising a sensor head (1) and a controller (2) either integrally or separately, the sensor head comprises a measurement light emitting optical system (113), an image acquiring optical system (127a, 127b) and a two dimensional imaging device (122). The controller can control the imaging condition associated with the brightness of the image in the form of a video signal both under a measurement mode and an observation mode. Under the measurement mode, with a light source (112) for measurement turned on, the imaging condition is adjusted in such a manner that a measurement light radiated light image (83) can be imaged at an appropriate brightness but a surrounding part (71) of the measurement object is substantially darker than the appropriate brightness, and a desired displacement is computed according the video signal obtained by the two dimensional imaging device (122).
    Type: Application
    Filed: November 30, 2001
    Publication date: April 10, 2003
    Inventors: Nobuharu Ishikawa, Yoshihiro Yamashita, Hirotaka Nakashima, Masahiro Kawachi, Koji Shimada, Hitoshi Oba
  • Patent number: 5790259
    Abstract: Each of a detection sample object and a non-detection sample object is illuminated with S-polarization light, for instance. S-polarization light and P-polarization light reflected from each sample object are detected by different photodetecting elements. Glossiness values and light quantities of the detection and non-detection sample objects are judged based on detection outputs of the photodetecting elements, and a glossiness difference and a light quantity difference are calculated. An evaluation function having at least one of the glossiness and the light quantity as a variable is determined by using the glossiness difference and the light quantity difference. Thresholds for object discrimination are calculated based on evaluation function values of the detection and non-detection sample objects.
    Type: Grant
    Filed: April 5, 1996
    Date of Patent: August 4, 1998
    Assignee: Omron Corporation
    Inventors: Shinji Mizuhata, Hayami Hosokawa, Arata Nakamura, Nobuharu Ishikawa, Hiroyuki Inoue, Satoru Shimokawa, Masahiro Kurokawa, Kohei Tomita, Norimasa Yamanaka