Patents by Inventor Nobuhiko Kanbara
Nobuhiko Kanbara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240109078Abstract: Provided is a variable conductivity film exhibiting a large change in conductivity so as to facilitate movement or sorting of micro-materials. Silicon semiconductor layers disposed between a first electrode and a second electrode include: a first silicon layer of a first conductivity type with a first impurity concentration; a second silicon layer of a second conductivity type different from the first conductivity type, contacting the first silicon layer and having a second impurity concentration smaller than the first impurity concentration; and a third silicon layer of the first conductivity type contacting the second silicon layer and having a third impurity concentration larger than the second impurity concentration. The first silicon layer and the second silicon layer form a first photodiode having a first polarity, and the second silicon layer and the third silicon layer form a second photodiode having a second polarity and being connected in series to the first photodiode.Type: ApplicationFiled: September 27, 2023Publication date: April 4, 2024Inventors: Nobuhiko KANBARA, Takashi AOTO
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Patent number: 11650155Abstract: A gas analysis system, includes: a light-emitting element that emits a laser light modulated by a predetermined modulation frequency; and a light-receiving element that: receives the laser light that has passed through a measurement target gas; and upon receiving the laser light, outputs a received signal having an N-frequency that is n times the predetermined modulation frequency, wherein n is an integer no less than 2; and a signal processing device that: calculates a third component by removing, from a first component having the N-frequency, a second component, wherein the second component is a component of optical interference noise arising on an optical path of the laser light from the light-emitting element to the light-receiving element and has the same frequency as the first component; and calculates, based on a magnitude of the third component, a concentration of the measurement target gas.Type: GrantFiled: July 30, 2021Date of Patent: May 16, 2023Assignee: YOKOGAWA ELECTRIC CORPORATIONInventors: Yuta Suzuki, Yuma Kitagawa, Toshiyuki Saruya, Nobuhiko Kanbara
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Publication number: 20220034807Abstract: A gas analysis system, includes: a light-emitting element that emits a laser light modulated by a predetermined modulation frequency; and a light-receiving element that: receives the laser light that has passed through a measurement target gas; and upon receiving the laser light, outputs a received signal having an N-frequency that is n times the predetermined modulation frequency, wherein n is an integer no less than 2; and a signal processing device that: calculates a third component by removing, from a first component having the N-frequency, a second component, wherein the second component is a component of optical interference noise arising on an optical path of the laser light from the light-emitting element to the light-receiving element and has the same frequency as the first component; and calculates, based on a magnitude of the third component, a concentration of the measurement target gas.Type: ApplicationFiled: July 30, 2021Publication date: February 3, 2022Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Yuta Suzuki, Yuma Kitagawa, Toshiyuki Saruya, Nobuhiko Kanbara
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Patent number: 9671333Abstract: A laser gas analyzer includes a wavelength-variable laser having a wide wavelength-variable width, a light-split module configured to split an output light of the wavelength-variable laser into a measurement light and a reference light, a first gas cell into which gases to be measured are introduced, and the measurement light is made to be incident, and a data processor configured to obtain an absorption spectrum of each of the gases to be measured based on a reference signal related to the reference light and an absorption signal related to an output light of the first gas cell, and to obtain concentrations of the respective gases to be measured.Type: GrantFiled: May 21, 2015Date of Patent: June 6, 2017Assignee: YOKOGAWA ELECTRIC CORPORATIONInventors: Takaaki Hirata, Yasuhiko Mitsumoto, Masaya Ooyama, Nobuhiko Kanbara, Naoyuki Fujimura, Minoru Maeda, Tadashi Sugiyama, Alan Cowie, Jie Zhu
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Patent number: 9347877Abstract: A laser gas analyzer includes a wavelength-variable laser having a wide wavelength-variable width, a light-split module configured to split an output light of the wavelength-variable laser into a measurement light and a reference light, a first gas cell into which gases to be measured are introduced, and the measurement light is made to be incident, and a data processor configured to obtain an absorption spectrum of each of the gases to be measured based on a reference signal related to the reference light and an absorption signal related to an output light of the first gas cell, and to obtain concentrations of the respective gases to be measured.Type: GrantFiled: November 28, 2012Date of Patent: May 24, 2016Assignee: YOKOGAWA ELECTRIC CORPORATIONInventors: Takaaki Hirata, Yasuhiko Mitsumoto, Masaya Ooyama, Nobuhiko Kanbara, Naoyuki Fujimura, Minoru Maeda, Tadashi Sugiyama, Alan Cowie, Jie Zhu
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Publication number: 20150260646Abstract: A laser gas analyzer includes a wavelength-variable laser having a wide wavelength-variable width, a light-split module configured to split an output light of the wavelength-variable laser into a measurement light and a reference light, a first gas cell into which gases to be measured are introduced, and the measurement light is made to be incident, and a data processor configured to obtain an absorption spectrum of each of the gases to be measured based on a reference signal related to the reference light and an absorption signal related to an output light of the first gas cell, and to obtain concentrations of the respective gases to be measured.Type: ApplicationFiled: May 21, 2015Publication date: September 17, 2015Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Takaaki Hirata, Yasuhiko Mitsumoto, Masaya Ooyama, Nobuhiko Kanbara, Naoyuki Fujimura, Minoru Maeda, Tadashi Sugiyama, Alan Cowie, Jie Zhu
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Publication number: 20150185144Abstract: A laser gas analyzer includes a wavelength-variable laser having a wide wavelength-variable width, a light-split module configured to split an output light of the wavelength-variable laser into a measurement light and a reference light, a first gas cell into which gases to be measured are introduced, and the measurement light is made to be incident, and a data processor configured to obtain an absorption spectrum of each of the gases to be measured based on a reference signal related to the reference light and an absorption signal related to an output light of the first gas cell, and to obtain concentrations of the respective gases to be measured.Type: ApplicationFiled: March 10, 2015Publication date: July 2, 2015Applicant: YOKOGAWA ELECTRIC CORPORATIONInventors: Takaaki Hirata, Yasuhiko Mitsumoto, Masaya Ooyama, Nobuhiko Kanbara, Naoyuki Fujimura, Minoru Maeda, Tadashi Sugiyama, Alan Cowie, Jie Zhu