Patents by Inventor Nobuhiko KONISHI

Nobuhiko KONISHI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11971426
    Abstract: An automatic analysis device that avoids carryover and prevents deterioration of analysis performance without controlling reaction cell position is provided with: a reaction cell in which a sample and a reagent are mixed and allowed to react; a light source that radiates light onto the mixed liquid of the sample and the reagent; a detector that detects the light radiated from the light source; and a cleaning mechanism that cleans the reaction cell. The cleaning mechanism includes an intake nozzle that draws in liquid from the reaction cell and a discharge nozzle that discharges the liquid into the reaction cell; the intake nozzle and the discharge nozzle can move vertically; and the intake nozzle is cleaned by lowering the intake nozzle into the reaction cell, in which a cleaning liquid or cleaning water have been accumulated, without drawing in the cleaning liquid or the cleaning water.
    Type: Grant
    Filed: January 23, 2019
    Date of Patent: April 30, 2024
    Assignee: Hitachi High-Tech Corporation
    Inventors: Rei Konishi, Nobuhiko Sasaki, Masahiko Iijima
  • Patent number: 11674927
    Abstract: The eddy current flaw detection apparatus includes: a pair of detecting coils 10a, 10b arranged in coaxial and spaced relation with a specimen 3; and a bridge circuit two sides of which are constituted by the detecting coils so that magnetic fields generated by these detecting coils 10a, 10b are in opposite phases to each other. A pair of exciting coils 11a, 11b are arranged coaxially with the detecting coils 10a, 10b in a manner to sandwich the pair of detecting coils 10a, 10b therebetween. A distance D between the detecting coil and the exciting coil adjacent thereto is set to a distance where a vibrational noise signal excited in the exciting coil and detected by its adjacent detecting coil is in opposite phase to that of a vibrational noise signal excited in the detecting coil and detected by the detecting coil.
    Type: Grant
    Filed: January 13, 2021
    Date of Patent: June 13, 2023
    Assignee: Tex Riken Co., Ltd.
    Inventors: Yuji Kumakura, Nobuhiko Konishi
  • Publication number: 20210231613
    Abstract: The eddy current flaw detection apparatus includes: a pair of detecting coils 10a, 10b arranged in coaxial and spaced relation with a specimen 3; and a bridge circuit two sides of which are constituted by the detecting coils so that magnetic fields generated by these detecting coils 10a, 10b are in opposite phases to each other. A pair of exciting coils 11a, 11b are arranged coaxially with the detecting coils 10a, 10b in a manner to sandwich the pair of detecting coils 10a, 10b therebetween. A distance D between the detecting coil and the exciting coil adjacent thereto is set to a distance where a vibrational noise signal excited in the exciting coil and detected by its adjacent detecting coil is in opposite phase to that of a vibrational noise signal excited in the detecting coil and detected by the detecting coil.
    Type: Application
    Filed: January 13, 2021
    Publication date: July 29, 2021
    Inventors: Yuji KUMAKURA, Nobuhiko KONISHI