Patents by Inventor Nobukazu Banjo
Nobukazu Banjo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6624644Abstract: An electro-optic probe has a laser diode for emitting a laser beam in accordance with a control signal from a measuring instrument main body, an electro-optic or magneto-optic element provided with a reflection film on an end surface thereof, a separator provided between the laser diode and electro-optic or magneto-optic element which is pervious the laser beam emitted from the laser diode and separates a beam reflected from the reflection film and two photodiodes which transform the beam reflected by the separator. A member of weak dielectric material, such as a glass plate, overlies the electro-optic or magneto-optic element at the end of the probe to protect the element, or the element is at the end of the probe and is exposed.Type: GrantFiled: July 2, 2001Date of Patent: September 23, 2003Assignees: Ando Electric Co., Ltd., Nippon Telegraph and Telephone CorporationInventors: Akishige Ito, Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjo, Sanjay Gupta, Mitsuru Shinagawa, Tadao Nagatsuma, Hakaru Kyuragi
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Patent number: 6567760Abstract: An electro-optic sampling oscilloscope (or EOS oscilloscope) uses an electro-optic probe containing an electro-optic crystal, which is placed under effect of an electric field caused by a measured signal. Laser pulses are supplied to the electro-optic crystal wherein they are subjected to polarization. Then, measurement data representative of a waveform of the measured signal are produced in response to polarization states of the laser pulses and are stored in a measurement data storage. A user can select specific measurement data by using a list of files of multiple measurement data which is displayed on a screen. Then, the EOS oscilloscope displays an outline waveform which is created based on a reduced number of sample points extracted from the selected measurement data. Comments and/or measurement conditions can be stored in the measurement data storage in relation to the measurement data, so that they are adequately displayed on the screen.Type: GrantFiled: April 27, 1999Date of Patent: May 20, 2003Assignees: Ando Electric Co., Ltd., Nippon Telegraph and Telephone CorporationInventors: Jun Kikuchi, Nobuaki Takeuchi, Yoshiki Yanagisawa, Nobukazu Banjo, Yoshio Endou, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Patent number: 6384590Abstract: In a light receiving circuit for use in electro-optic sampling oscilloscope which receives first and second optical, photodiodes 51 and 52 are connected in series between a positive bias power supply 50P and a negative bias power supply 50N. The photodiodes 51 and 52 receive optical signals whose polarization state correspond to the voltage of a signal to be measured and convert the thus-received optical signals into electric signals. An amplifier 53 amplifies an electric current appearing in a point of connection P between the photodiodes 51 and 52. A current monitor 54 detects the electric signal converted by the photodiode 51, and a current monitor 57 detects the electric signal converted by the photodiode 52. The electric signal detected by the current monitor 54 is subjected to analog-to-digital conversion by an analog-to-digital converter 55, and the electric signal detected by the current monitor 57 is subjected to analog-to-digital conversion by an analog-to-digital converter 58.Type: GrantFiled: November 10, 1999Date of Patent: May 7, 2002Assignees: Ando Electric Co., Ltd., Nippon Telegraph and Telephone CorporationInventors: Jun Kikuchi, Nobuaki Takeuchi, Yoshiki Yanagisawa, Nobukazu Banjo, Yoshio Endou, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Publication number: 20020008533Abstract: The electro-optic probe of the present invention comprises a laser diode for emitting a laser beam in accordance with a control signal from a measuring instrument main body, an electro-optic element, provided with a reflection film on the end surface thereof, a separator provided between the laser diode and electro-optic element, which is pervious the laser beam emitted from the laser diode and separates a beam reflected from the reflection film, two photodiodes which transform the beam reflected by the separator, and a glass plate used for protecting the electro-optic element.Type: ApplicationFiled: July 2, 2001Publication date: January 24, 2002Applicant: ANDO ELECTRIC CO., LTDInventors: Akishige Ito, Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjo, Sanjay Gupta, Mitsuru Shinagawa, Tadao Nagatsuma, Hakaru Kyuragi
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Publication number: 20010022338Abstract: Disclosed is a probe signal outputting apparatus comprising an electrooptic probe for receiving an optical output from a light source and outputting a first optical signal and a second optical signal which are polarized in accordance with a voltage of a to-be-probed signal from an object to-be-probed; a first photoelectric converting element and a second photoelectric converting element, connected in series between a first bias power supply and a second bias power suppl, for respectively receiving the first optical signal and the second optical signal and converting the first and second optical signals to electric signals; an output circuit for outputting an electric signal acquired at a connection node between the first photoelectric converting element and the second photoelectric converting element; a current drive circuit, provided in an optical input/output unit together with the first photoelectric converting element, the second photoelectric converting elements and the output circuit, for supplying a drType: ApplicationFiled: December 18, 2000Publication date: September 20, 2001Inventors: Yoshiki Yanagisawa, Nobukazu Banjo, Jun Kikuchi, Sanjay Gupta, Mitsuru Shinagawa, Chisato Hashimoto, Tadao Nagatsuma, Hakaru Kyuragi
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Publication number: 20010022339Abstract: Disclosed is a probe signal outputting apparatus which comprises an electrooptic probe for receiving an optical output from a light source and outputting a first optical signal and a second optical signal which are polarized in accordance with a voltage of a to-be-probed signal from an object to be measured; a first photoelectric converting element and a second photoelectric converting element, connected in series between a first bias power supply and a second bias power supply, for respectively receiving the first optical signal and the second optical signal and converting the first and second optical signals to electric signals; an output circuit for outputting an electric signal acquired at a connection node between the first photoelectric converting element and the second photoelectric converting element to a measuring circuit; an adder for adding voltage values equivalent to currents respectively flowing in the first photoelectric converting element and the second photoelectric converting element; and aType: ApplicationFiled: December 18, 2000Publication date: September 20, 2001Inventors: Yoshiki Yanagisawa, Nobukazu Banjo, Jun Kikuchi, Sanjay Gupta, Mitsuru Shinagawa, Chisato Hashimoto, Tadao Nagatsuma, Hakaru Kyuragi
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Patent number: 6232765Abstract: An electro-optic sampling oscilloscope (or EOS oscilloscope) is designed to perform measurement such that an electro-optic sampling probe (i.e., EOS probe) is brought into contact with a measured circuit. Optical pulses are input to the EOS probe, wherein they are varied in polarization states in response to the measured circuit. Then, an electric signal output from the EOS probe is amplified to produce a receiving light signal. The receiving light signal is subjected to sampling operations using a first pulse signal to produce detection data, while it is also subjected to sampling operations using a second pulse signal to produce noise data. Herein, the first pulse signal consists of pulses which emerge in synchronization with the optical pulses respectively, while the second pulse signal delays from the first pulse signal by a prescribed delay time. Then, measurement data are produced by subtracting the noise data from the detection data.Type: GrantFiled: March 12, 1999Date of Patent: May 15, 2001Assignees: Ando Electric Co., LTD, Nippon Telegraph and Telephone CorporationInventors: Nobuaki Takeuchi, Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjo, Yoshio Endou, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Patent number: 6201235Abstract: An electro-optic sampling oscilloscope facilitates adjustment of signal-to-noise ratio caused by electrical, optical and temperature factors.Type: GrantFiled: April 27, 1999Date of Patent: March 13, 2001Assignee: Ando Electric Co., Ltd.Inventors: Nobuaki Takeuchi, Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjo, Yoshio Endou, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada
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Patent number: 5930737Abstract: A measurement system analyzes and displays measurement data obtained from measurement modules with respect to prescribed measured values. A large scale graphical user interface (GUI) is provided as a human-machine interface and functions as a display as well as a data input device. The measurement system employs double CPU modules for sharing loads of data processing required for the GUI and measurement modules, respectively. A first CPU module controls the human-machine interface and performs data processing. A second CPU module controls the measurement modules. The first CPU module uses a firsts system for communications, whereas the second CPU module uses a second bus system for communications with the measurement modules. A bus exchanger connects the first and second bus systems so that a user of the system can control the measurement system using the GUI while providing real-time performance for the measurement modules.Type: GrantFiled: December 19, 1997Date of Patent: July 27, 1999Assignee: Ando Electric Co., Ltd.Inventor: Nobukazu Banjo