Patents by Inventor Nobukazu Kakutani

Nobukazu Kakutani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8552408
    Abstract: Provided is a particle beam irradiation apparatus capable of highly reliable measurement of a dose of each beam and capable of highly sensitive measurement of a leakage dose caused by momentary beam emission.
    Type: Grant
    Filed: February 7, 2011
    Date of Patent: October 8, 2013
    Assignees: Kabushiki Kaisha Toshiba, National Institute of Radiological Sciences
    Inventors: Katsushi Hanawa, Yasushi Iseki, Nobukazu Kakutani, Takuji Furukawa, Taku Inaniwa, Shinji Sato, Kouji Noda
  • Patent number: 8487282
    Abstract: A particle beam irradiation apparatus that can measure and display a dose two-dimensional distribution during scan while reducing degradation of a particle beam shape, including a particle beam generation portion; a particle beam emission control portion; a two-dimensional beam scanning portion; a sensor portion including first linear electrodes arranged in parallel in a first direction and second linear electrodes arranged in parallel in a second direction orthogonal to the first direction; a beam shape calculation portion that calculates a center of gravity of the particle beam from outputs of each the first linear and second linear electrodes and that obtains a two-dimensional beam shape of the particle beam around the center of gravity; a storage portion that accumulates and stores the two-dimensional beam shapes; and a display portion that displays the two-dimensional beam shapes as a two-dimensional distribution of a dose.
    Type: Grant
    Filed: February 7, 2011
    Date of Patent: July 16, 2013
    Assignees: Kabushiki Kaisha Toshiba, National Institute of Radiological Sciences
    Inventors: Yasushi Iseki, Katsushi Hanawa, Kazunao Maeda, Nobukazu Kakutani, Takuji Furukawa, Taku Inaniwa, Shinji Sato, Kouji Noda
  • Patent number: 8334509
    Abstract: A particle beam irradiation apparatus includes a beam scanning indication unit which two-dimensionally indicates a position of a particle beam in series for each of slices obtained by dividing an affected area to be irradiated in an axial direction of the particle beam, a beam scanning unit which two-dimensionally scans the particle beam based on an indication signal from the beam scanning indication unit, a phosphor film which is provided between the beam scanning unit and a patient and emits light in an amount corresponding to a particle dose of the particle beam transmitting therethrough, an imaging unit which images the phosphor film for each of the slices, and a display unit which obtains an irradiation dose distribution of each of the slices from image data imaged by the imaging unit and displays the obtained irradiation dose distribution associated with a scanning position of the particle beam.
    Type: Grant
    Filed: August 20, 2010
    Date of Patent: December 18, 2012
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Yasushi Iseki, Masao Takahashi, Katsushi Hanawa, Kazunao Maeda, Atsuo Inoue, Teruyasu Nagafuchi, Nobukazu Kakutani
  • Publication number: 20120305790
    Abstract: Provided is a particle beam irradiation apparatus capable of highly reliable measurement of a dose of each beam and capable of highly sensitive measurement of a leakage dose caused by momentary beam emission.
    Type: Application
    Filed: February 7, 2011
    Publication date: December 6, 2012
    Applicants: NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES, KABUSHIKI KAISHA TOSHIBA
    Inventors: Katsushi Hanawa, Yasushi Iseki, Nobukazu Kakutani, Takuji Furukawa, Taku Inaniwa, Shinji Sato, Kouji Noda
  • Publication number: 20120305796
    Abstract: Provided is a particle beam irradiation apparatus that can measure and display a dose two-dimensional distribution during scan with a simple configuration, while reducing degradation of a particle beam shape.
    Type: Application
    Filed: February 7, 2011
    Publication date: December 6, 2012
    Applicants: National Institute of Radiological Sciences, KABUSHIKI KAISHA TOSHIBA
    Inventors: Yasushi Iseki, Katsushi Hanawa, Kazunao Maeda, Nobukazu Kakutani, Takuji Furukawa, Taku Inaniwa, Shinji Sato, Kouji Noda
  • Publication number: 20110049372
    Abstract: The particle beam irradiation apparatus according to the present invention comprises: a beam generation unit; a beam emission control unit which controls emission of the particle beam; a beam scanning indication unit which two-dimensionally indicates a position of the particle beam in series for each of slices obtained by dividing an affected area to be irradiated in an axial direction of the particle beam; a beam scanning unit which two-dimensionally scans the particle beam based on an indication signal from the beam scanning indication unit; a phosphor film which is provided between the beam scanning unit and a patient and emits light in an amount corresponding to a particle dose of the particle beam transmitting therethrough; an imaging unit which images the phosphor film for each slice; and a display unit which obtains an irradiation dose distribution of each slice from image data imaged by the imaging unit and displays the obtained irradiation dose distribution associated with a scanning position of the
    Type: Application
    Filed: August 20, 2010
    Publication date: March 3, 2011
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Yasushi ISEKI, Masao TAKAHASHI, Katsushi HANAWA, Kazunao MAEDA, Atsuo INOUE, Teruyasu NAGAFUCHI, Nobukazu KAKUTANI
  • Patent number: 5528034
    Abstract: The present invention is to provide a method for detecting hydrogen with ultra high sensitivity based on slow multiply-charged ion wherein damages of a target surface can be remarkably reduced and a quantitative analysis of hydrogen atoms on a solid surface can be compactly realized with extremely high efficiency by employing slow multiply-charged ions derived from an ion source for efficiently generating multiply-charged ions.
    Type: Grant
    Filed: March 28, 1995
    Date of Patent: June 18, 1996
    Assignee: The University of Tokyo
    Inventors: Yasunori Yamazaki, Kenichiro Komaki, Toshiyuki Azuma, Nobukazu Kakutani, Kenro Kuroki