Abstract: The size of a foreign substance which is present between a cathode and an anode and which contributes to a short circuit therebetween is measured. On the basis of the measured size, the wavelength of a laser beam with which the foreign substance is irradiated is set, as is the number of times of irradiation. The foreign substance is irradiated with the laser beam to eliminate at least part of the foreign substance.

Abstract: The size of a foreign substance which is present between a cathode and an anode and which contributes to a short circuit therebetween is measured. On the basis of the measured size, the wavelength of a laser beam with which the foreign substance is irradiated is set, as is the number of times of irradiation. The foreign substance is irradiated with the laser beam to eliminate at least part of the foreign substance.

Abstract: A plurality of liquid crystal display cells in a test unit are driven to display a series of test image patterns. When some of the liquid crystal display cells are judged to function poorly or completely good, they are controlled to display a predetermined image pattern, so that an inspection person can stop further testing them and focus testing on other liquid crystal display cells. Where some of the other liquid crystal display cells are then judged to function poorly or completely good, they are controlled to display the same pattern as such a predetermined image pattern. Thus, since the inspector can test such liquid crystal display cells as required to check, the testing efficiency is significantly improved.

Abstract: A plurality of liquid crystal display cells in a test unit are driven to display a series of test image patterns. When some of the liquid crystal display cells are judged to function poorly or completely good, they are controlled to display a predetermined image pattern, so that an inspection person can stop further testing them and focus testing on other liquid crystal display cells. Where some of the other liquid crystal display cells are then judged to function poorly or completely good, they are controlled to display the same pattern as such a predetermined image pattern. Thus, since the inspector can test such liquid crystal display cells as required to check, the testing efficiency is significantly improved.

Abstract: A semiconductor test circuit and a method for testing a liquid crystal display device which includes a substrate, first and second busses, signal lines, and first and second switching circuits. The test circuit includes driver circuits configured to drive the first and second semiconductor switching circuits simultaneously and detection circuits configured to detect electric properties between the first and second busses and the first and second semiconductor switching circuits when the driver circuits drive the first and second semiconductor switching elements.