Abstract: Disclosed an impact detection system including: three or more optical fiber sensors disposed respectively in different positions, the sensors not being in alignment with one another, in which the sensors each includes a core portion to have a grating portion formed therein, the grating portion has a plurality of gratings; light source; two or more optical filters having different pass bands to one another to an output light of one of the optical fiber sensors; and an arithmetic processing apparatus to perform arithmetic processing of output values of the three or more optical fiber sensors through the optical filters so as to specify a position on the subject where an impact is loaded, the output values being obtained when the impact is loaded on the subject.

Abstract: Embodiments of the invention provide an HDD functional test apparatus which can test an HDD in a shorter time by increasing the amount of transfer per command without using a larger memory resource. In one embodiment, a data storage device test apparatus comprises a storage section to store original data; a data generating section which generates transfer data, larger in size than the original data, for each command to a data storage device by repeatedly using the original data; and a transfer section which transfers the generated transfer data to the data storage device.

Abstract: A damage detection system including: a optical fiber sensor including a core portion to have a grating portion formed therein, the grating portion having gratings reflecting light, wherein a wavelength band of the reflected light changes when a distance between adjacent gratings changes; a light source to input broadband light into the core portion; two optical filters connected to an output end of the sensor; and an apparatus to perform arithmetic processing on output values of the optical filters, wherein each passband of the optical filters overlaps with the vibration range of the wavelength band, in which a center wavelength of one of the passbands is fixed to an upper area of a vibration center of a center wavelength of the reflected light and that of the other of the passbands is fixed to a lower area thereof.

Abstract: Embodiments of the present invention help to maintain the sealing capability of a depressurized space where a test subject device is placed in a test chamber apparatus, and to accurately control air pressure in the depressurized space. In one embodiment of the present invention, a depressurized space and a separate space are separated by a connection board. The connection board transmits signals between a test computer and an HDD. The connection board is fixed to an inner wall defining the depressurized space and the separate space. An opening is formed on the inner wall. The connection board which is larger than the opening covers the opening. To maintain the air sealing property in the depressurized space, the connection board is fixed to the inner wall via a gasket.

Abstract: Disclosed is an impact detection system including: an optical fiber including a plurality of sensor sections to reflect light, a wavelength band of the reflected light vibrates depending on an elastic wave propagating through a subject to be inspected; a light source to input light into the optical fiber; optical filters each connected to an output terminal of the optical fiber; and an arithmetic processing unit to detect the impact from output values of sensor sections, wherein the wavelength bands of the sensor sections in the optical fiber are distributed such that the vibration bands caused by the impact to be detected do not overlap with each other, and a pass band of the optical filter corresponding to one of the sensor sections is distributed in the vibration band caused by the detection object, and is distributed in both sides of a center of the wavelength band of the one sensor section.

Abstract: Disclosed an impact detection system including: three or more optical fiber sensors disposed respectively in different positions, the sensors not being in alignment with one another, in which the sensors each includes a core portion to have a grating portion formed therein, the grating portion has a plurality of gratings; light source; two or more optical filters having different pass bands to one another to an output light of one of the optical fiber sensors; and an arithmetic processing apparatus to perform arithmetic processing of output values of the three or more optical fiber sensors through the optical filters so as to specify a position on the subject where an impact is loaded, the output values being obtained when the impact is loaded on the subject.

Abstract: A damage detection system including: a optical fiber sensor including a core portion to have a grating portion formed therein, the grating portion having gratings reflecting light, wherein a wavelength band of the reflected light changes when a distance between adjacent gratings changes; a light source to input broadband light into the core portion; two optical filters connected to an output end of the sensor; and an apparatus to perform arithmetic processing on output values of the optical filters, wherein each passband of the optical filters overlaps with the vibration range of the wavelength band, in which a center wavelength of one of the passbands is fixed to an upper area of a vibration center of a center wavelength of the reflected light and that of the other of the passbands is fixed to a lower area thereof.

Abstract: Embodiments of the invention provide an HDD functional test apparatus which can test an HDD in a shorter time by increasing the amount of transfer per command without using a larger memory resource. In one embodiment, a data storage device test apparatus comprises a storage section to store original data; a data generating section which generates transfer data, larger in size than the original data, for each command to a data storage device by repeatedly using the original data; and a transfer section which transfers the generated transfer data to the data storage device.

Abstract: The present invention includes a three-dimensional base body (40) having a curved surface allowing definition of a circular orbital band (B), an electroacoustic transducer (21) arranged on the orbital band (B) of the three-dimensional base body (40) and configured to excite surface acoustic wave to perform multiple roundtrips along the orbital band (B), and a sensitive film (25) formed on at least a part of the orbital band (B) of the three-dimensional base body (40) and configured to react with a specific gas molecule. The surface acoustic wave experienced the multiple roundtrips along the orbital band (B) is then converted into a high frequency electric signal again by an interdigital transducer (21). The resulting high frequency electric signal is transferred to a detection/output unit (24) via a switching unit (23) and then detected by the detection/output unit (24).

Abstract: Damage caused to a structural composite material is detected while reduction in the strength thereof is prevented. A damage detection system 10 for a structural composite material includes a vibration application apparatus 20 including: a sheet body 22; a plurality of piezo elements 21 sprinkled throughout and held by the sheet body 22; and wires 23 for the piezo elements 21 provided to the sheet body 22. The damage detection system 10 also includes: a fiber optic sensor 30 which includes a grating portion 33 in a core portion 32 thereof, the grating portion 33 reflecting light of a predetermined wavelength; a light source to perform light irradiation onto the core portion 32; and a characteristic detection unit 42 to detect a characteristic of the light reflected from the grating portion 33.

Abstract: A semiconductor manufacturing station (50) exposes light on a surface area of a spherical semiconductor device or ball (52). A mask pattern generator (56) provides a pattern of light, which undergoes temporal changes to collectively represent an image. The mask pattern generator has an active exposure contour (80) that provides a portion of the overall image. The pattern of light is directed though a lens (62) to the surface area of the semiconductor device. The semiconductor device rotates in relation to the temporal changes in the pattern of light to expose the pattern of light over a portion of a surface area of the semiconductor device. The exposure contour has a narrower center and becomes wider moving away from the center. The exposure contour may have a curvature.

Abstract: A semiconductor manufacturing station (50) exposes light on a surface area of a spherical semiconductor device or ball (52). A mask pattern generator (56) provides a pattern of light, which undergoes temporal changes to collectively represent an image. The mask pattern generator has an active exposure contour (80) that provides a portion of the overall image. The pattern of light is directed though a lens (62) to the surface area of the semiconductor device. The semiconductor device rotates in relation to the temporal changes in the pattern of light to expose the pattern of light over a portion of a surface area of the semiconductor device. The exposure contour has a narrower center and becomes wider moving away from the center. The exposure contour may have a curvature.

Abstract: A spherical semiconductor device includes a spherical semiconductor element having one or more electrodes on its surface. Spherical conductive bumps are formed at the positions of the electrodes. The electrodes are so arranged as to contact a common plane. Spherical bumps constituting a group to be connected to the outside protrude above the spherical semiconductor element such that a predetermined gap is formed between a plane or a spherical surface capable of contacting the spherical bumps and the surface of the spherical semiconductor element. The spherical semiconductor device is connected to various circuit boards or another semiconductor device through the spherical bumps. This affords easy and accurate electrical connections to the outside.

Abstract: Damage caused to a structural composite material is detected while reduction in the strength thereof is prevented. A damage detection system 10 for a structural composite material includes a vibration application apparatus 20 including: a sheet body 22; a plurality of piezo elements 21 sprinkled throughout and held by the sheet body 22; and wires 23 for the piezo elements 21 provided to the sheet body 22. The damage detection system 10 also includes: a fiber optic sensor 30 which includes a grating portion 33 in a core portion 32 thereof, the grating portion 33 reflecting light of a predetermined wavelength; a light source to perform light irradiation onto the core portion 32; and a characteristic detection unit 42 to detect a characteristic of the light reflected from the grating portion 33.

Abstract: A connection structure of a light transfer medium includes: a light transfer medium embedded in a structural body; and a protection tube in which the light transfer medium is inserted. The protection tube is embedded in the structural body at one end portion of the structural body. One end portion of the light transfer medium is inserted into the protection tube such that an end of the one end portion of the light transfer medium is positioned inwardly from one end face of the one end portion of said structural body.

Abstract: A spherical semiconductor device includes a spherical semiconductor element having one or more electrodes on its surface. Spherical conductive bumps are formed at the positions of the electrodes. The electrodes are so arranged as to contact a common plane. Spherical bumps constituting a group to be connected to the outside protrude above the spherical semiconductor element such that a predetermined gap is formed between a plane or a spherical surface capable of contacting the spherical bumps and the surface of the spherical semiconductor element. The spherical semiconductor device is connected to various circuit boards or another semiconductor device through the spherical bumps. This affords easy and accurate electrical connections to the outside.

Abstract: An object is to provide an accelerometer or a spherical sensor-type measurement device, able to control by means of an active restraining control system a spherical mass part or a spherical sensor part. The accelerometer or spherical sensor-type measurement device has a spherical mass part, which is levitated by electrostatic supporting forces, and electrodes positioned so as to surround the spherical mass part and which have spherical inner surfaces; the above electrodes include a plurality of electrostatic supporting electrodes, positioned symmetrically with respect to the spherical mass part, and a displacement detection electrode, positioned between the electrostatic supporting electrodes.

Abstract: A connection structure of a light transfer medium includes: a light transfer medium embedded in a structural body; and a protection tube in which the light transfer medium is inserted. The protection tube is embedded in the structural body at one end portion of the structural body. One end portion of the light transfer medium is inserted into the protection tube such that an end of the one end portion of the light transfer medium is positioned inwardly from one end face of the one end portion of said structural body.

Abstract: A system and method for reducing electric discharge breakdown occurrences in a micro-electromechanical system device is provided. The device comprises a core, a shell, and electrodes, which may be formed on the shell. When voltage is applied to the electrodes, each electrode applies an electrostatic force on the core. The electrodes are arranged in concentric sets, where each set may comprises two or more electrodes. Due to the concentricity of the electrodes, a minimum distance is maintained between the core and an outer electrode of an electrode set when the core nears or touches an inner electrode of the electrode set.

Abstract: A system and method is disclosed for coating a conventional wafer or a spherical shaped semiconductor substrate with liquid material such as photoresist by utilizing a “drop on demand” piezo driven dispense nozzle, a bubble-jet dispense nozzle, or a continuous piezo jet with charging electrodes. The proposed system and method will greatly reduce, and in some cases virtually eliminate, the waste of photoresist in the process.