Patents by Inventor Nobuteru Tsubouchi

Nobuteru Tsubouchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11522055
    Abstract: A stack including at least a semiconductor drift layer stacked on a single-crystal diamond substrate having a coalescence boundary, wherein the coalescence boundary of the single-crystal diamond substrate is a region that exhibits, in a Raman spectrum at a laser excitation wavelength of 785 nm, a full width at half maximum of a peak near 1332 cm?1 due to diamond that is observed to be broader than a full width at half maximum of the peak exhibited by a region different from the coalescence boundary, the coalescence boundary has a width of 200 ?m or more, and the semiconductor drift layer is stacked on at least the coalescence boundary.
    Type: Grant
    Filed: January 11, 2019
    Date of Patent: December 6, 2022
    Assignee: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    Inventors: Shinya Ohmagari, Hideaki Yamada, Hitoshi Umezawa, Nobuteru Tsubouchi, Akiyoshi Chayahara, Yoshiaki Mokuno, Akinori Seki, Fumiaki Kawai, Hiroaki Saitoh
  • Publication number: 20210066078
    Abstract: There is provided a novel stack that includes a single-crystal diamond substrate having a coalescence boundary, yet effectively uses the coalescence boundary. A stack comprising at least a semiconductor drift layer stacked on a single-crystal diamond substrate having a coalescence boundary, wherein the coalescence boundary of the single-crystal diamond substrate is a region that exhibits, in a Raman spectrum at a laser excitation wavelength of 785 nm, a full width at half maximum of a peak near 1332 cm?1 due to diamond that is observed to be broader than a full width at half maximum of the peak exhibited by a region different from the coalescence boundary, the coalescence boundary has a width of 200 ?m or more, and the semiconductor drift layer is stacked on at least the coalescence boundary.
    Type: Application
    Filed: January 11, 2019
    Publication date: March 4, 2021
    Inventors: Shinya OHMAGARI, Hideaki YAMADA, Hitoshi UMEZAWA, Nobuteru TSUBOUCHI, Akiyoshi CHAYAHARA, Yoshiaki MOKUNO, Akinori SEKI, Fumiaki KAWAI, Hiroaki SAITOH
  • Patent number: 6555182
    Abstract: A surface hardening method for resins and a surface hardened resin, capable of reforming the surface of a plastic disk substrate at low energy in a short time, and a production device of such a resin is disclosed. The formation of an ion-implanted layer 11 by implanting equal to or more than 1017 carbon ions per cm2 into the surface of a plastic disk substrate 10 at equal to or less than 20 KeV and the formation of a thin film 12 of high hardness on the ion-implanted layer 11 can be performed alternately or simultaneously, and the hardening rate is increased further by using a bias device.
    Type: Grant
    Filed: July 1, 1999
    Date of Patent: April 29, 2003
    Assignees: Sony Corporation, Agency of Industrial Science and Technology
    Inventors: Minehiro Tonosaki, Yutaka Takei, Hiroyuki Okita, Yuji Horino, Akiyoshi Chayahara, Atsushi Kinomura, Nobuteru Tsubouchi
  • Patent number: 6169288
    Abstract: A laser ablation type ion source including vacuum chambers provided with a retaining section for holding a solid raw material for the generation of ions, an ion extracting electrode, an ion accelerating electrode, and a mass spectrograph for ion separation. The ion source also includes a laser beam source for injecting a laser beam of high density into the vacuum chamber.
    Type: Grant
    Filed: September 24, 1998
    Date of Patent: January 2, 2001
    Assignee: Agency of Industrial Science & Technology, Ministry of International Trade & Industry
    Inventors: Yuji Horino, Toshiyuki Mihara, Akiyoshi Chayahara, Atsushi Kinomura, Nobuteru Tsubouchi
  • Patent number: 6039847
    Abstract: A material of ions is sputtered with cesium ions to generate negative ions and, the negative ions are accelerated and mass-separated to obtain a negative ion beam, and a material of thin film is sputtered with the negative ion beam, thereby forming a thin film on a base material.
    Type: Grant
    Filed: March 12, 1998
    Date of Patent: March 21, 2000
    Assignee: Agency of Industrial Science & Technology
    Inventors: Akiyoshi Chayahara, Yuji Horino, Atsushi Kinomura, Nobuteru Tsubouchi, Kanenaga Fujii