Patents by Inventor Nobutoshi Mizusawa

Nobutoshi Mizusawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5277539
    Abstract: A substrate conveying apparatus usable with a semiconductor manufacturing apparatus wherein a pattern of a mask is transferred onto a semiconductor wafer by exposing the semiconductor wafer to synchrotron orbital radiation or other exposure energy through a mask. The conveying apparatus transfers the semiconductor wafer to and from a wafer chuck while the surface thereof extends vertically, and/or transfers the wafer to and from a wafer cassette which contains a plurality of wafers horizontally. The apparatus includes a conveying hand having a gimbal mechanism for supporting the semiconductor wafer to assure the semiconductor wafer transfer to and from the wafer chuck while the wafer is vertical. When the semiconductor wafer is transferred to and from a wafer cassette, the apparatus is provided with a correcting mechanism for correcting the attitude of the conveying hand to prevent the semiconductor wafer from contacting the wafer cassette.
    Type: Grant
    Filed: May 10, 1993
    Date of Patent: January 11, 1994
    Assignee: Canon Kabushiki Kaisha
    Inventors: Shin Matsui, Takao Kariya, Nobutoshi Mizusawa, Ryuichi Ebinuma, Shunichi Uzawa
  • Patent number: 5267292
    Abstract: An X-ray exposure apparatus for exposing a semiconductor wafer to a mask with X-rays, to print a pattern of the mask onto the wafer, is disclosed. The ambience within a stage accommodating chamber, accommodating a mask, a semiconductor wafer, and the like, is replaced by helium. Thereafter, a predetermined quantity of helium is supplied into the stage accommodating chamber. This effectively prevents degradation of the purity of helium due to air leakage into the chamber. Therefore, any undesirable decrease in the quantity of X-ray transmission can be avoided. Thus, high-precision and high-throughput exposure is ensured.
    Type: Grant
    Filed: March 1, 1993
    Date of Patent: November 30, 1993
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yutaka Tanaka, Nobutoshi Mizusawa, Mitsuaki Amemiya, Takao Kariya, Isamu Shimoda
  • Patent number: 5182615
    Abstract: An exposure apparatus for printing a pattern of a mask to a wafer includes a mask moving mechanism for moving the mask; a wafer moving mechanism or moving the wafer along a predetermined movement coordinate; a measuring system for measuring an error with respect to the movement coordinate, resulting from the movement of the mask by the mask moving mechanism; and a memorizing device for memorizing a data table prepared on the basis of the error measured by the measuring system; wherein the wafer moving mechanism uses the data in the data table when it moves the wafer for positioning of the wafer with respect to the mask.
    Type: Grant
    Filed: August 7, 1990
    Date of Patent: January 26, 1993
    Assignee: Canon Kabushiki Kaisha
    Inventors: Hiroshi Kurosawa, Koji Uda, Kunitaka Ozawa, Shunichi Uzawa, Nobutoshi Mizusawa, Shigeyuki Suda, Noriyuki Nose, Takao Kariya
  • Patent number: 5172402
    Abstract: An exposure method for manufacture of semiconductor devices, includes moving a shutter having an edge so that the edge is related to a predetermined exposure region; projecting an exposure beam to the edge of the shutter and to at least a portion of the exposure region; determining a position of a shadow of the edge of the shutter formed by the exposure beam with respect to a predetermined coordinate system related to movement of a movable chuck; adjusting the shutter in accordance with the determination; placing a substrate on the chuck; moving the chuck so that the substrate is related to the exposure region; and controlling the exposure of the substrate with the exposure beam through the shutter.
    Type: Grant
    Filed: March 8, 1991
    Date of Patent: December 15, 1992
    Assignee: Canon Kabushiki Kaisha
    Inventors: Nobutoshi Mizusawa, Ryuichi Ebinuma, Hiroshi Kurosawa, Koji Uda, Takao Kariya, Shunichi Uzawa
  • Patent number: 5172403
    Abstract: An X-ray exposure apparatus for transferring a pattern of a mask to a wafer includes an X-ray source accommodating chamber; a mask chuck for supporting the mask; a wafer chuck for supporting the wafer; a stage for moving the wafer chuck; a stage accommodating chamber for accommodating therein the mask chuck, the wafer chuck and the stage; a barrel for coupling the X-ray source accommodating chamber with the stage accommodating chamber, to define an X-ray projection passageway; a blocking window provided in the X-ray projection passageway, for isolating the ambience in the X-ray accommodating chamber and the ambience in the stage accommodating chamber from each other; and a gas supply port contributable to fill the stage accommodating chamber with a gas ambience of low X-ray absorption, the gas supply port opening to the X-ray projection passageway, at a position between the blocking window and the mask supported by the mask chuck.
    Type: Grant
    Filed: October 22, 1990
    Date of Patent: December 15, 1992
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yutaka Tanaka, Nobutoshi Mizusawa, Takao Kariya, Shunichi Uzawa, Mitsuaki Amemiya
  • Patent number: 5168512
    Abstract: A method for the manufacture of semiconductor devices wherein a radiation beam including first and second beams is projected from a synchrotron orbit radiation source into an ambience maintained substantially at a vacuum, includes the steps of directing the radiation beam to a wafer through a window effective to isolate the ambience to thereby print a circuit pattern on an X-ray sensitive layer on the wafer with the first beam, providing a support for supporting the window having an opening, extracting the second beam through the opening, and detecting and correcting any deviation of the first beam with respect to the wafer.
    Type: Grant
    Filed: March 12, 1991
    Date of Patent: December 1, 1992
    Assignee: Canon Kabushiki Kaisha
    Inventors: Kazunori Iwamoto, Nobutoshi Mizusawa, Takao Kariya, Shunichi Uzawa, Ryuichi Ebinuma
  • Patent number: 5160961
    Abstract: A device for holding a substrate includes a holding system for holding a substrate by attraction and a guard system for preventing dropping of the substrate held by the holding system, the guard system being out of contact with the substrate as the same is held by the holding system.
    Type: Grant
    Filed: March 20, 1991
    Date of Patent: November 3, 1992
    Assignee: Canon Kabushiki Kaisha
    Inventors: Mitsuji Marumo, Kazunori Iwamoto, Nobutoshi Mizusawa, Takao Kariya, Shunichi Uzawa
  • Patent number: 5159621
    Abstract: An X-ray transmitting window for use in X-ray lithography, for allowing transmission therethrough of X-rays from a vacuum ambience to a different ambience, includes an X-ray transmitting film, and a gasket material gas-tightly provided on at least one of opposite surfaces in a peripheral portion of the X-ray transmitting film. The gasket material has a Brinell hardness smaller than that of the X-ray transmitting film. The formed X-ray transmitting window is able to be sandwiched and fastened between a pair of flanges in a gas-tight manner.
    Type: Grant
    Filed: August 1, 1991
    Date of Patent: October 27, 1992
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yutaka Watanabe, Shunichi Uzawa, Yasuaki Fukuda, Nobutoshi Mizusawa, Ryuichi Ebinuma, Mitsuaki Amemiya
  • Patent number: 5157700
    Abstract: An exposure apparatus usable with synchrotron radiation source wherein the synchrotron radiation is generated by electron injection into a ring. The exposure apparatus is to transfer a semiconductor element pattern of a mask onto a semiconductor wafer by the synchrotron radiation. The apparatus includes a shutter for controlling the exposure of the wafer. The shutter controls the exposure with the illuminance distribution on the wafer surface taken into account. The illuminance distribution is determined in response to the electron injection, and thereafter, the illuminance distribution is corrected in a predetermined manner. By this, the illuminance distribution data for controlling the shutter always correspond to the actual illuminance distribution. The entire shot areas of the semiconductor wafer are exposed with high precision.
    Type: Grant
    Filed: August 31, 1989
    Date of Patent: October 20, 1992
    Assignee: Canon Kabushiki Kaisha
    Inventors: Hiroshi Kurosawa, Mitsuaki Amemiya, Shigeru Terashima, Koji Uda, Isamu Shimoda, Shunichi Uzawa, Kunitaka Ozawa, Makiko Mori, Ryuichi Ebinuma, Shinichi Hara, Nobutoshi Mizusawa, Eigo Kawakami
  • Patent number: 5150391
    Abstract: An exposure apparatus for transferring a pattern of an original onto a workpiece, includes a blocking member for defining a rectangular exposure region with respect to at least one of the original and the workpiece, wherein the exposure for the pattern transfer can be effected with the exposure region defined by the blocking member. Plural detection systems detect a positional deviation between the original and the workpiece, each of which is disposed so as to be associated with at least one of four sides of the rectangular exposure region. Plural first movable stages each is provided so as to be associated with at least one of the four sides, and each is adapted to carry thereon one of the detection systems disposed to be associated with a corresponding side. Each first movable stage comprises a single-axis stage movable in a direction parallel to a corresponding side.
    Type: Grant
    Filed: February 5, 1992
    Date of Patent: September 22, 1992
    Assignee: Canon Kabushiki Kaisha
    Inventors: Ryuichi Ebinuma, Nobutoshi Mizusawa, Takao Kariya, Shigeyuki Suda, Shunichi Uzawa
  • Patent number: 5140429
    Abstract: An ink jet apparatus in which a recorded image is read to provide an image reference signal for comparison with an image recording signal, the resulting comparison being used as a basis for diagnosing an ink ejection state of a recording head nozzle in order to determine and implement an ink ejection recovery process.
    Type: Grant
    Filed: August 12, 1991
    Date of Patent: August 18, 1992
    Assignee: Canon Kabushiki Kaisha
    Inventors: Ryuichi Ebinuma, Yuji Chiba, Nobutoshi Mizusawa
  • Patent number: 5026239
    Abstract: A mask cassette and mask cassette loading device, suitably usable in an X-ray exposure apparatus for exposing a wafer to a mask with X-rays contained in synchrotron radiation, to print a pattern of the mask on the wafer, are disclosed. The mask cassette includes a base for accommodating a plurality masks and a cover which can be separated from and coupled to the base only in one direction. When the two are coupled by a locking mechanism, the cassette can be completely closed against atmospheric pressure. The mask cassette loading device includes a common mechanism which serves to release the locking mechanism of the cassette and also, to move the cassette base relative to the cover. Thus, with a simple and compact structure, the protection and replacement of X-ray masks are ensured with certainty.
    Type: Grant
    Filed: September 5, 1989
    Date of Patent: June 25, 1991
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yuji Chiba, Hidehiko Fujioka, Nobutoshi Mizusawa, Takao Kariya, Isamu Shimoda
  • Patent number: 4999506
    Abstract: A positioning device includes a movable table supported by a rectilinear guide mechanism or rotary mechanism, the movable table being moved by a driving mechanism so as to position a member, to be conveyed, placed on the movable table, with respect to a predetermined site. After the member being conveyed is conveyed to the predetermined site, the conveyed member intimately contacts a stationary table which provides a reference with respect to the attitude of the conveyed member, such that the attitude correction of the conveyed member is attained.
    Type: Grant
    Filed: January 26, 1989
    Date of Patent: March 12, 1991
    Assignee: Canon Kabushiki Kaisha
    Inventors: Nobutoshi Mizusawa, Yutaka Tanaka, Ryuichi Ebinuma
  • Patent number: 4977459
    Abstract: An ink-jet apparatus in which a recorded image is read to provide a image reference signal for comparison with an image recording signal, the resulting comparison being used as a basis for diagnosing an ink injection state of a recording head nozzles in order to determine and implement an ink injection recovery process.
    Type: Grant
    Filed: March 21, 1990
    Date of Patent: December 11, 1990
    Assignee: Canon Kabushiki Kaisha
    Inventors: Ryuichi Ebinuma, Yuji Chiba, Nobutoshi Mizusawa
  • Patent number: 4947190
    Abstract: An ink jet recording apparatus comprising: a non-contact print mode in which a medium to be recorded is conveyed to a region in which printing can be performed and is subjected to recording by discharging ink in a non-contact manner from a recording head confronting the medium at a predetermined interval; and a contact cleaning mode in which a cleaning sheet which has been conveyed into the region in which printing can be performed by using at least a part of a conveyance route for the medium is brought into contact with the recording head and then discharged from the region in which printing can be performed.
    Type: Grant
    Filed: November 10, 1989
    Date of Patent: August 7, 1990
    Assignee: Canon Kabushiki Kaisha
    Inventors: Nobutoshi Mizusawa, Ryuichi Ebinuma, Yuji Chiba
  • Patent number: 4906894
    Abstract: A photoelectron beam converting device including a semiconductor substrate having a p-n junction formed between an n-type region and a p-type region and an opening portion formed on the side of the semiconductor substrate. An electron beam is generated by a light which enters from the opening portion and by a reverse voltage to be applied to the p-n junction.
    Type: Grant
    Filed: March 28, 1989
    Date of Patent: March 6, 1990
    Assignee: Canon Kabushiki Kaisha
    Inventors: Mamoru Miyawaki, Yukio Masuda, Ryuichi Arai, Nobutoshi Mizusawa, Takahiko Ishiwatari, Hitoshi Oda
  • Patent number: 4906833
    Abstract: An electron-beam information exchange apparatus adapted to effect information exchange in incoming light signals and outgoing light signals by utilizing electron beams. The apparatus has a plurality of electron beam generating means for generating electron beams according to the incoming light signals; a plurality of electron beam deflecting means for independently deflecting individual electron beams emitted from the electron beam generating means; and a plurality of electron beam detecting means for reproducing information from the thus-deflected electron beams to generate the outgoing light beams. The electron beam detecting means controls the electron beams so that each of the electron beams is made incident upon a desired one of said electron beam detecting means. Also, the electron beam generating means are semiconductor devices for generating electron beams.
    Type: Grant
    Filed: September 6, 1988
    Date of Patent: March 6, 1990
    Assignee: Canon Kabushiki Kaisha
    Inventors: Mamoru Miyawaki, Yukio Masuda, Ryuichi Arai, Nobutoshi Mizusawa, Takahiko Ishiwatari, Masahiko Okunuki
  • Patent number: 4893137
    Abstract: A recording apparatus is provided with an upper unit having a recording head for discharging ink for effecting recording on a recording medium in response to information, and at least a portion of the electric circuit of the apparatus, a lower unit having a platen for maintaining the recording medium in the recording station by the recording head, the lower unit capable of being spaced apart relative to the upper unit, and a conveying member for conveying the recording medium to the recording station. The upper unit and the lower unit are capable of being spaced apart and opened in the recording station by the recording head.
    Type: Grant
    Filed: December 9, 1987
    Date of Patent: January 9, 1990
    Assignee: Canon Kabushiki Kaisha
    Inventors: Ryuichi Ebinuma, Nobutoshi Mizusawa, Yuji Chiba
  • Patent number: 4798694
    Abstract: A molded composite material comprising a plural number of constituents is provided in which at least two of the constituents are distributed with a relative existing ratio varying at least in one direction in the composite material. A process for producing the composite material is also provided.
    Type: Grant
    Filed: August 6, 1986
    Date of Patent: January 17, 1989
    Assignee: Canon Kabushiki Kaisha
    Inventors: Hiroyuki Sugata, Kouhei Nakata, Nobutoshi Mizusawa, Satoshi Yuasa, Masahiro Haruta, Takashi Hamamoto, Kuniji Osabe
  • Patent number: 4757331
    Abstract: A recorder having an ink re-supply system for a moving ink tank has a movable record element for recording data, a first tank movable with the record element, a fixed second tank, a recording liquid path connecting the two tanks, and a supply device for supplying recording liquid during periods when the recording liquid path is established. Structure is also provided for connecting and disconnecting the recording liquid path. The connection/disconnection structure includes an opening through which part of the recording liquid path extends. The recorder can also include a flexible curtain blade for protecting the inside of the recording liquid path and through which the recording liquid path extends when it is established by the connection/disconnection means structure.
    Type: Grant
    Filed: March 11, 1986
    Date of Patent: July 12, 1988
    Assignee: Canon Kabuskiki Kaisha
    Inventor: Nobutoshi Mizusawa