Abstract: A semiconductor device of an embodiment includes a substrate, a first electrode, a second electrode, the first electrode provided between the substrate and the second electrode, the oxide semiconductor layer in contact with the first electrode, an oxide semiconductor layer between the first electrode and the second electrode, the oxide semiconductor layer contains Zn and at least one first element selected from In, Ga, Si, Al, and Sn; a conductive layer between the oxide semiconductor layer and the second electrode, the conductive layer in contact with the second electrode, the conductive layer contains O and at least one second element selected from the group consisting of In, Ga, Si, Al, Sn, Zn, and Ti, a gate electrode; and a gate insulating layer between the oxide semiconductor layer and the gate electrode.

Abstract: A semiconductor memory device comprises: memory layers arranged in a first direction; and a first and a second via wirings having different positions in a second direction. The memory layer comprises: a first transistor electrically connected to the first via wiring; a memory portion electrically connected to the first transistor; a wiring electrically connected to the first transistor; a second transistor electrically connected to the second via wiring; and an electrode provided in a current path between the second transistor and the wiring. The second transistor comprises: a semiconductor layer electrically connected to the electrode and the second via wiring; and a gate electrode facing the semiconductor layer. The semiconductor layer faces at least one of surfaces on one side or the other side in the first direction of the gate electrode. The electrode includes a portion arranged with the second via wiring in a third direction.

Abstract: A semiconductor memory device comprises: a first memory layer; and a first via wiring and a second via wiring extending in a first direction, and having different positions from each other in a second direction. The first memory layer comprises: a first transistor electrically connected to the first via wiring; a memory portion electrically connected to the first transistor; a first wiring electrically connected to the first transistor; a second transistor electrically connected to the second via wiring and the first wiring; a first electrode electrically connected to the second transistor; and a second electrode electrically connected to the first wiring and first electrode. A length of the second electrode in the first direction is larger than one or both of a length of the first wiring in the first direction and a length of the first conductive layer in the first direction.

Abstract: By using an offset parabolic concave mirror as a concave mirror, and arranging a lens having an entrance pupil at the geometric focal point of the offset parabolic concave mirror, a group of rays incident parallel to the optical axis of the offset parabolic concave mirror become chief rays which are telecentric with respect to an object plane orthogonal to the optical axis of the offset parabolic concave mirror, and diverging light from each object point on the object plane can be detected on a quadric image plane formed by the lens at the focal point of the offset parabolic concave mirror without blind spots. An image of the target object is detected after the beams reflected by the offset parabolic concave mirror are bent by the reflecting mirrors and made incident on the lens to reduce the size and cost of the device.

Abstract: By using an offset parabolic concave mirror as a concave mirror, and arranging a lens having an entrance pupil at the geometric focal point of the offset parabolic concave mirror, a group of rays incident parallel to the optical axis of the offset parabolic concave mirror become chief rays which are telecentric with respect to an object plane orthogonal to the optical axis of the offset parabolic concave mirror, and diverging light from each object point on the object plane can be detected on a quadric image plane formed by the lens at the focal point of the offset parabolic concave mirror without blind spots. An image of the target object is detected after the beams reflected by the offset parabolic concave mirror are bent by the reflecting mirrors and made incident on the lens to reduce the size and cost of the device.

Abstract: An ejector system for a color sorter, eliminates particulate matter by air by detection of the particulate matter falling from an end of a transfer device at a predetermined position, and has a nozzle part in which a plurality of air flow paths that communicate with a plurality of nozzle holes are formed. A manifold part is provided with a plurality of electromagnetic valves that communicate with an air space communicating with a compressed air source and in which a plurality of air flow paths for supplying compressed air to the corresponding air flow paths in the nozzle part by the operation of the respective electromagnetic valves are formed. The nozzle part and the manifold part are separably integrated while open surfaces of the air flow paths in the nozzle part and open surfaces of the air flow paths in the manifold part are brought into contact with each other.

Abstract: An ejector system for a color sorter, eliminates particulate matter by air by detection of the particulate matter falling from an end of a transfer device at a predetermined position, and has a nozzle part in which a plurality of air flow paths that communicate with a plurality of nozzle holes are formed. A manifold part is provided with a plurality of electromagnetic valves that communicate with an air space communicating with a compressed air source and in which a plurality of air flow paths for supplying compressed air to the corresponding air flow paths in the nozzle part by the operation of the respective electromagnetic valves are formed. The nozzle part and the manifold part are separably integrated while open surfaces of the air flow paths in the nozzle part and open surfaces of the air flow paths in the manifold part are brought into contact with each other.

Abstract: A color sorting apparatus capable of displaying images of granules picked up by a CCD sensor on a panel and performing sensibility control of defective granules while observing the displayed images is provided. The color sorting apparatus comprises a contour processor for outputting contour binary data from the picked-up images and a contour threshold, a first defective determination circuit for outputting the defective part of the granule having a predetermined area or more of part exceeding a first threshold in the form of first defective pixel binary data, and a second defective determination circuit for outputting the defective part of the granule having a part exceeding a second threshold being greater than the first threshold in the form of second defective pixel binary data. The first defective pixel binary data are displayed on a monitor for thin coloration. The second defective pixel binary data are displayed on a monitor for partial coloration.

Abstract: A color sorting apparatus capable of displaying images of granules picked up by a CCD sensor on a panel and performing sensibility control of defective granules while observing the displayed images is provided. The color sorting apparatus comprises a contour processor for outputting contour binary data from the picked-up images and a contour threshold, a first defective determination circuit for outputting the defective part of the granule having a predetermined area or more of part exceeding a first threshold in the form of first defective pixel binary data, and a second defective determination circuit for outputting the defective part of the granule having a part exceeding a second threshold being greater than the first threshold in the form of second defective pixel binary data. The first defective pixel binary data are displayed on a monitor for thin coloration. The second defective pixel binary data are displayed on a monitor for partial coloration.

Abstract: An optical detection device for use in a color sorting apparatus for granular objects includes a CCD linear sensor. The CCD linear sensor comprises a plurality of light receiving elements arranged in one row each of which is capable of detecting red, green and blue wavelengths. The CCD linear sensor receives light from a granular object and a background which are irradiated by a red light source, a green light source and a blue light source. The red, green and blue light sources are switched over while the granular object is passing within an optical detection area. The CCD linear sensor receives light from the granular object in synchronization with the above switching operation of the light sources.

Abstract: An optical detection device for use in a color sorting apparatus for granular objects includes a CCD linear sensor. The CCD linear sensor comprises a plurality of light receiving elements arranged in one row each of which is capable of detecting red, green and blue wavelengths. The CCD linear sensor receives light from a granular object and a background which are irradiated by a red light source, a green light source and a blue light source. The red, green and blue light sources are switched over while the granular object is passing within an optical detection area. The CCD linear sensor receives light from the granular object in synchronization with the above switching operation of the light sources.

Abstract: A granular material sorting apparatus comprises a transfer device for causing material grains to fall down, optical detector units mounted along the falling-down locus of the material grains, an injection nozzle device for injecting air to the material grains, and a control unit for controlling operation of the injection nozzle device in response to detection by the optical detector unit. The optical detector units and the control unit optically detect and discriminate colored grains different in color from good material grains and foreign matters in similar color to the good material grains or transparent, which are mixed in the material grains, and activate the injection nozzle device in a predetermined period of time after the detection to remove the detected bad grains. The control unit sets different injection times and different injection delay times depending whether the bad grains are colored grains or foreign matters.