Patents by Inventor Norbert Hartwig

Norbert Hartwig has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11523618
    Abstract: Disclosed is a conveyor system including a first conveyor leading to an inspection point, the first conveyor including a diversion mechanism configured to divert an object based on failing to meet an inspection parameter. The system includes a second conveyor configured to transport a container configured to receive the object from the diversion mechanism. A control module is configured to co-register an image of the object captured at the inspection point with container ID data of the container.
    Type: Grant
    Filed: September 30, 2019
    Date of Patent: December 13, 2022
    Assignee: METTLER-TOLEDO, LLC
    Inventors: Norbert Hartwig, Michael A. Evans, Kristofer Loper, Christopher Sisemore
  • Publication number: 20210092969
    Abstract: Disclosed is a conveyor system including a first conveyor leading to an inspection point, the first conveyor including a diversion mechanism configured to divert an object based on failing to meet an inspection parameter. The system includes a second conveyor configured to transport a container configured to receive the object from the diversion mechanism. A control module is configured to co-register an image of the object captured at the inspection point with container ID data of the container.
    Type: Application
    Filed: September 30, 2019
    Publication date: April 1, 2021
    Applicant: Mettler-Toledo, LLC
    Inventors: Norbert HARTWIG, Michael A. EVANS, Kristofer LOPER, Christopher SISEMORE
  • Publication number: 20180106660
    Abstract: A method of determining the mass of an object by scanning the object in a radiographic inspection system, specifically in an X-ray scanner with the capability to take scan images at a plural number J of energy levels, has three modes or parts, namely: an initial learning mode, a normal operating mode, and a learning improvement mode. An initial learning mode in which reference objects are scanned and their actual masses weighed and stored as reference values. A normal operating mode wherein sample objects with unknown mass m are scanned and analyzed for compatibility with the reference values, and if found incompatible, the method switches to the learning improvement mode. A learning improvement mode in which the actual mass of the sample object found incompatible is determined by weighing and updates the stored reference values.
    Type: Application
    Filed: April 6, 2016
    Publication date: April 19, 2018
    Inventor: Norbert Hartwig
  • Patent number: 9945714
    Abstract: A method of determining the mass of an object by scanning the object in a radiographic inspection system, specifically in an X-ray scanner with the capability to take scan images at a plural number J of energy leves, has three modes or parts, namely: an initial learning mode, a normal operating mode, and a learning improvement mode. An inintial learning mode in which refernce object are scanned and their actual masses weighed and stored as reference values. A normal operating mode wherein smaple objects with unknown mass m are scanned and analyzed for compatibility with the reference values, and if found incompatible, the method switches to the learning improvement mode. A learning improvement mode in which the actual mass of the sample object found incompatible is determined by weighing and updates the stored reference values.
    Type: Grant
    Filed: April 6, 2016
    Date of Patent: April 17, 2018
    Assignee: Mettler-Toledo, LLC
    Inventor: Norbert Hartwig
  • Patent number: 7164750
    Abstract: An apparatus and method for non-destructive inspection of materials housed in containers involves orienting an X-ray beam emitter and detector to direct and detect an X-ray beam at an angle substantially parallel to a sloped surface of the container to be inspected. A first X-ray apparatus is located opposite a second X-ray apparatus, and both the first and second X-ray apparatus are adapted to provide two X-ray beams. This arrangement provides for imaging of the entire area of a sloped portion of the container without any shadow or hidden spots.
    Type: Grant
    Filed: June 25, 2004
    Date of Patent: January 16, 2007
    Assignee: Smiths Detection, Inc.
    Inventors: James Nabors, Brook Nash, Todd Schrock, Dick Wyman, Norbert Hartwig, Earl Smith, Adam Williamson
  • Publication number: 20050105680
    Abstract: An apparatus and method for non-destructive inspection of materials housed in containers involves orienting an X-ray beam emitter and detector to direct and detect an X-ray beam at an angle substantially parallel to a sloped surface of the container to be inspected. A first X-ray apparatus is located opposite a second X-ray apparatus, and both the first and second X-ray apparatus are adapted to provide two X-ray beams. This arrangement provides for imaging of the entire area of a sloped portion of the container without any shadow or hidden spots.
    Type: Application
    Filed: June 25, 2004
    Publication date: May 19, 2005
    Inventors: James Nabors, Brook Nash, Todd Schrock, Dick Wyman, Norbert Hartwig, Earl Smith, Adam Williamson