Abstract: Methods and systems for calibrating a mass spectrometer having one or more ion lenses and a mass analyser comprise acquiring from the mass analyser a plurality of mass spectra from a sample comprising a plurality of ion masses. A voltage value applied to the one or more ion lenses is static while each mass spectrum is obtained and the voltage value is varied between different mass spectra. A voltage value providing an optimum ion signal for each of the plurality of ion masses in the sample is determined from the plurality of mass spectra and corresponding voltages applied to the one or more ion lenses during acquisition of each mass spectrum. Data indicating the ion mass value and corresponding voltage value providing the optimum ion signal for each of the plurality of ion masses in the sample are stored.

Abstract: Methods of checking calibration of a dual-mode secondary electron multiplier (SEM) detector of a mass spectrometer using non-analyte ions comprise: recording, using a counting mode detector of the dual-mode SEM detector, a first count signal related to the number of non-analyte ions incident at the SEM detector at a working point voltage; offsetting the working point of the counting mode detector and recording second count signals related to the number of non-analyte ions incident at the SEM detector at respective two or more offset working point voltages; fitting a non-linear function to the first and second recorded count signals and values corresponding to the working point voltages; and determining that the calibration is valid if a rate of change of the non-linear function at the calibrated working point is within an acceptance range. A mass spectrometer configured to perform the method is also described.

Abstract: A plasma source chamber for use in a spectrometer comprises an inner housing for accommodating a plasma source and an outer housing accommodating the inner housing. The outer housing comprises at least one outer air inlet in a first wall and at least one outer air outlet in a second wall. Walls of the inner and outer housings define a spacing so as to allow a first air flow from the at least one outer air inlet to the at least one outer air outlet through the spacing between the inner and outer housings. The inner housing comprises at least one inner air inlet in a first wall and at least one inner air outlet in a second wall to allow a second air flow from the at least one inner air inlet to the at least one inner air outlet through the inner housing.

Abstract: A plasma source chamber (10) for use in a spectrometer comprises an inner housing (11) for accommodating a plasma source (31) and an outer housing (12) accommodating the inner housing. The outer housing (12) comprises at least one outer air inlet opening (21) in a first wall and at least one outer air outlet opening (22) in a second wall. Walls of the inner housing and walls of the outer housing define a spacing (25) so as to allow a first air flow (1) from the at least one outer air inlet opening (21) to the at least one outer air outlet opening (22) through the spacing (25) between the inner housing and the outer housing. The inner housing (11) comprises at least one inner air inlet opening (23) in a first wall and at least one inner air outlet opening (24) in a second wall to allow a second air flow (2) from the at least one inner air inlet opening to the at least one inner air outlet opening through the inner housing.

Abstract: A method of determining a peak intensity in an optical spectrum is described. The method includes producing a two-dimensional array of spectrum values by imaging the optical spectrum onto a detector array. An offset using an actual location and an expected location of a peak of an interpolated subarray is used to adjust an expected location of another peak that is within another two-dimensional subarray. Interpolated spectrum values are then used to produce a peak intensity value of the second peak.

Abstract: Methods for operating a mass spectrometer having a skimmer and a circuit configured to apply an electric potential to the skimmer comprise obtaining an initial mass spectrum of a sample and measuring a value indicating an ion beam intensity of one or more ion species. A varying DC electric potential is applied to the skimmer to identify an operational electric potential, wherein the DC electric potential is varied until the value indicating the ion beam intensity of the one or more ion species changes by a predetermined amount. The mass spectrum with the operational electric potential applied to the skimmer is output. In some examples, a pressure within the mass spectrometer is varied to identify an operational pressure, and the mass spectrum with the pressure within the mass spectrometer at the operational pressure is output.

Abstract: A method of determining a peak intensity in an optical spectrum is described. The method includes producing a two-dimensional array of spectrum values by imaging the optical spectrum onto a detector array. An offset using an actual location and an expected location of a peak of an interpolated subarray is used to adjust an expected location of another peak that is within another two-dimensional subarray. Interpolated spectrum values are then used to produce a peak intensity value of the second peak.

Abstract: A plasma source chamber (10) for use in a spectrometer comprises an inner housing (11) for accommodating a plasma source (31) and an outer housing (12) accommodating the inner housing. The outer housing (12) comprises at least one outer air inlet opening (21) in a first wall and at least one outer air outlet opening (22) in a second wall. Walls of the inner housing and walls of the outer housing define a spacing (25) so as to allow a first air flow (1) from the at least one outer air inlet opening (21) to the at least one outer air outlet opening (22) through the spacing (25) between the inner housing and the outer housing. The inner housing (11) comprises at least one inner air inlet opening (23) in a first wall and at least one inner air outlet opening (24) in a second wall to allow a second air flow (2) from the at least one inner air inlet opening to the at least one inner air outlet opening through the inner housing.

Abstract: A method of calibrating a mass spectrometer is disclosed. The mass spectrometer includes a first quadrupole, a second mass analyzer and a detection means. The method includes calibrating the second mass analyzer at a first time, calibrating the first quadrupole at a second time later than the first including a) determining for each of several selected masses a corresponding value of the amplitude of the RF voltage and DC voltage applied to the electrodes of the first quadrupole, b) fitting a function of the selected mass to the values of the amplitude of the RF voltage and DC voltage corresponding to the several selected masses, c) detecting the selected mass in a filter window width over a mass range, d) evaluating a shift of the peak position and/or a deviation of the filter window width, and e) repeating the calibration steps under certain conditions.

Abstract: A method of calibrating a mass spectrometer is disclosed. The mass spectrometer includes a first quadrupole, a second mass analyzer and a detection means. The method includes calibrating the second mass analyzer at a first time, calibrating the first quadrupole at a second time later than the first including a) determining for each of several selected masses a corresponding value of the amplitude of the RF voltage and DC voltage applied to the electrodes of the first quadrupole, b) fitting a function of the selected mass to the values of the amplitude of the RF voltage and DC voltage corresponding to the several selected masses, c) detecting the selected mass in a filter window width over a mass range, d) evaluating a shift of the peak position and/or a deviation of the filter window width, and e) repeating the calibration steps under certain conditions.

Abstract: A method of producing spatial fine structures comprises the steps of: selecting a luminophore from the group of luminophores displaying two different states, one of the two states being an active state in which luminescence light is obtainable from the luminophore, the other of the two states being an inactive state in which no luminescence light is obtainable from the luminophore, and the luminophore being reversibly, but essentially completely, transferable out the one state into the other state by means of an optical signal; adding the luminophore to a material; forming a spatial fine structure of the material; and fluorescence-microscopically examining whether the desired fine structure is present.

Abstract: A method of microscopically examining a spatial fine structure comprises the steps of selecting a luminophore from the group of luminophores which have two physical states, the two states differing from each other with regard to the luminescence properties displayed by the luminophore, and which are reversibly, but essentially completely transferable out of one into the other state of their two states by means of an optical signal; overlaying a surface of the spatial fine structure with the luminophore; and determining the profile of the surface overlaid with the luminophore. The step of determining the profile of the surface comprises the sub-steps of transferring the luminophore by means of the optical signal out of the one into the other of its two states outside a presently observed measurement point, measuring luminescence light emitted by the luminophore, and repeating the sub-steps of transferring and measuring for further measurement points distributed over the surface.

Abstract: A method of producing spatial fine structures comprises the steps of: selecting a luminophore from the group of luminophores displaying two different states, one of the two states being an active state in which luminescence light is obtainable from the luminophore, the other of the two states being an inactive state in which no luminescence light is obtainable from the luminophore, and the luminophore being reversibly, but essentially completely, transferable out the one state into the other state by means of an optical signal; adding the luminophore to a material; forming a spatial fine structure of the material; and fluorescence-microscopically examining whether the desired fine structure is present.

Abstract: A method of microscopically examining a spatial fine structure comprises the steps of selecting a luminophore from the group of luminophores which have two physical states, the two states differing from each other with regard to the luminescence properties displayed by the luminophore, and which are reversibly, but essentially completely transferable out of one into the other state of their two states by means of an optical signal; overlaying a surface of the spatial fine structure with the luminophore; and determining the profile of the surface overlaid with the luminophore. The step of determining the profile of the surface comprises the sub-steps of transferring the luminophore by means of the optical signal out of the one into the other of its two states outside a presently observed measurement point, measuring luminescence light emitted by the luminophore, and repeating the sub-steps of transferring and measuring for further measurement points distributed over the surface.