Abstract: An apparatus is described having a latch circuit. The latch circuit includes redundant data inputs, redundant data outputs, redundant clock inputs and circuitry to self-correct a soft-error.

Abstract: Described is a processor comprising: a plurality of radiation detectors; a first logic unit to receive outputs from the plurality of radiation detectors, the logic unit to generate an output according to the received outputs, the output of the first logic unit indicating whether the processor was exposed to incoming radiations; and a second logic unit to receive the output from the first logic unit, and to cause the processor to perform an action according to the output from the first logic unit.

Abstract: An apparatus is described having a latch circuit. The latch circuit includes redundant data inputs, redundant data outputs, redundant clock inputs and circuitry to self-correct a soft-error.

Abstract: Described is a processor comprising: a plurality of radiation detectors; a first logic unit to receive outputs from the plurality of radiation detectors, the logic unit to generate an output according to the received outputs, the output of the first logic unit indicating whether the processor was exposed to incoming radiations; and a second logic unit to receive the output from the first logic unit, and to cause the processor to perform an action according to the output from the first logic unit.

Abstract: A method and apparatus for reducing soft errors in which the method includes: assigning a plurality of nodes within a storage circuit to a predetermined state; evaluating a plurality of signals coupled to the storage circuit, where evaluating the plurality of signals enables a first node to change from its predetermined state; and actively maintaining a second node in its predetermined state, where actively maintaining the predetermined state reduces the storage circuit's susceptibility to soft errors.

Abstract: Methods are disclosed for calculating the amount of voltage coupled to a device. In some embodiments, the method may comprise identifying a conductor that is coupled to a device, extracting information regarding the relationship between the conductor coupled to the device and adjacent conductors, extracting information regarding signals that are present in the adjacent conductors, partitioning the signal information into phases, calculating a voltage induced in the conductor coupled to the device during each phase of the partitioned signal, calculating an average voltage induced in the conductor coupled to the device and, flagging the device if the average voltage induced is above a predetermined threshold.