Patents by Inventor Norbert Rieser

Norbert Rieser has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • DEVICE FOR CONTROLLING TRAPPED IONS HAVING AN ELECTRODE CIRCUITRY CONFIGURED FOR DEVICE TESTING
    Publication number: 20230019665
    Abstract: A device for controlling trapped ions includes a substrate. An electrode structure is disposed on the substrate, the electrode structure including DC electrodes and RF electrodes of an ion trap configured to trap ions in a space above the substrate. A first device terminal is disposed on the substrate, the first device terminal being connected via a first electrode connection line to a specific DC electrode. Further, a second device terminal is disposed on the substrate, the second device terminal being connected via a second electrode connection line to the specific DC electrode.
    Type: Application
    Filed: July 15, 2022
    Publication date: January 19, 2023
    Inventors: Clemens Roessler, Thomas Ostermann, Norbert Rieser, Johanna Elisabeth Roessler, Siegfried Schmid, Walter Slamnig
  • Probe card and method for performing an unclamped inductive switching test using multiple equal-length interconnection lines emanating from a common connection node
    Patent number: 9933476
    Abstract: A probe card with a ground contact, a first contact element and a second contact element is provided. The first contact element is coupled to an interconnection node via a first interconnection line having a definite length and the second contact element is coupled to the interconnection node via a second interconnection line having the same definite length. The interconnection node is directly connected to the ground contact.
    Type: Grant
    Filed: August 4, 2015
    Date of Patent: April 3, 2018
    Assignee: Infineon Technologies Austria AG
    Inventors: Michael Leutschacher, Norbert Rieser
  • Probe Card and Method for Performing an Unclamped Inductive Switching Test
    Publication number: 20160041220
    Abstract: A probe card with a ground contact, a first contact element and a second contact element is provided. The first contact element is coupled to an interconnection node via a first interconnection line having a definite length and the second contact element is coupled to the interconnection node via a second interconnection line having the same definite length. The interconnection node is directly connected to the ground contact.
    Type: Application
    Filed: August 4, 2015
    Publication date: February 11, 2016
    Inventors: Michael Leutschacher, Norbert Rieser