Patents by Inventor Norbert Sappelt

Norbert Sappelt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measuring the thickness of multi-layer films
    Patent number: 6646453
    Abstract: A method for capacitively measuring the thickness of multi-layer films (10), the layers (32, 34) the dielectric constants of which differ at least at a particular temperature, wherein, in addition to the capacitive measurement, at least one further thickness measurement is carried out under different conditions, and wherein the thicknesses (d1, d2) of the individual layers is determined by comparing the measurement results and by means of the different dielectric constants.
    Type: Grant
    Filed: November 6, 2001
    Date of Patent: November 11, 2003
    Assignee: Plast-Control Gerätebau GmbH
    Inventors: Frank Müller, Stefan Konermann, Norbert Sappelt
  • Method for measuring the thickness of multi-layer films
    Publication number: 20020057096
    Abstract: A method for capacitively measuring the thickness of multi-layer films (10), the layers (32, 34) the dielectric constants of which differ at least at a particular temperature, wherein, in addition to the capacitive measurement, at least one further thickness measurement is carried out under different conditions, and wherein the thicknesses (d1, d2) of the individual layers is determined by comparing the measurement results and by means of the different dielectric constants.
    Type: Application
    Filed: November 6, 2001
    Publication date: May 16, 2002
    Inventors: Frank Muller, Stefan Konermann, Norbert Sappelt