Abstract: The present invention provides a total reflection prism that can be used in multiple reflection method and that can make the contact area with the sample small. A total reflection prism is made of a plate-shaped optical member, has a leading-in part and a leading-out part of a measurement light provided at positions deviated from the center of either of the front and back surfaces, and has a plurality of plane parts that are formed perpendicularly to the front and back surfaces respectively on an outer periphery of the prism excluding the front and back surfaces of the prism. The leading-in part is provided to irradiate the measurement light that is guided inside at an angle of incidence of total reflection toward either of the front and back surfaces. The front and back surfaces are provided so that the measurement light travels while totally reflected alternately.

Abstract: To provide a total reflection measurement device that can improve a light utilization rate more than a Cassegrain type objective mirror, is capable of total reflection measurement at low magnification, and can maintain compatibility with a conventional objective mirror. The device (1) includes: a pair of plane mirrors (2a, 2b) disposed on a central axis (P1); a pair of intermediate mirrors (4a, 4b) opposing to the plane mirrors (2a, 2b), respectively; a pair of ellipsoidal mirrors (6a, 6b) opposing to the intermediate mirrors (4a, 4b), respectively; and an ATR crystal (8) provided at a position nearer to the sample side than the pair of plane mirrors (2a, 2b) on the central axis (P1).

Abstract: An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle ?c inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle ?c? of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.

Abstract: An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle ?c inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle ?c? of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.

Abstract: To provide a total reflection measurement device that can improve a light utilization rate more than a Cassegrain type objective mirror, is capable of total reflection measurement at low magnification, and can maintain compatibility with a conventional objective mirror. The device (1) includes: a pair of plane mirrors (2a, 2b) disposed on a central axis (P1); a pair of intermediate mirrors (4a, 4b) opposing to the plane mirrors (2a, 2b), respectively; a pair of ellipsoidal mirrors (6a, 6b) opposing to the intermediate mirrors (4a, 4b), respectively; and an ATR crystal (8) provided at a position nearer to the sample side than the pair of plane mirrors (2a, 2b) on the central axis (P1).

Abstract: An object of the present invention is to provide a total reflection measuring apparatus which, while visually observing a specific minute area of a measurement object, is capable of efficiently obtaining optical data on the basis of the total reflection measurement. A microscopic total reflection measuring apparatus of the present invention comprises a Cassegrain mirror 12 having a Cassegrain primary mirror 16 and a Cassegrain secondary mirror 18, which condenses an incident light beam 30 on a measurement object 20 by making an incident light beam successively reflected by the secondary mirror 18 and the primary mirror 16, and which obtains a reflected light beam 32 from the measurement object 20 by making the reflected light beam 32 successively reflected by the primary mirror 16 and the secondary mirror 18. And, a total reflection prism 14 is arranged below the Cassegrain secondary mirror 18.

Abstract: An object of the present invention is to provide a total reflection measuring apparatus which, while visually observing a specific minute area of a measurement object, is capable of efficiently obtaining optical data on the basis of the total reflection measurement. A microscopic total reflection measuring apparatus of the present invention comprises a Cassegrain mirror 12 having a Cassegrain primary mirror 16 and a Cassegrain secondary mirror 18, which condenses an incident light beam 30 on a measurement object 20 by making an incident light beam successively reflected by the secondary mirror 18 and the primary mirror 16, and which obtains a reflected light beam 32 from the measurement object 20 by making the reflected light beam 32 successively reflected by the primary mirror 16 and the secondary mirror 18. And, a total reflection prism 14 is arranged below the Cassegrain secondary mirror 18.

Abstract: The present invention provides an attenuated-total-reflection (“ATR”) measurement apparatus that collects light onto a contact surface between a sample and an ATR prism at an incident angle greater than or equal to a critical angle and measures total-reflection light from the contact surface. The attenuated-total-reflection measurement apparatus according to the invention includes: a light-irradiating system for emitting the light which is collected onto the contact surface; a photodetector for detecting the total-reflection light from the contact surface; an aperture for restricting the light which the photodetector detects to only light from a specific measurement site in the contact surface; and a detection-side scanning mirror provided in a light path extending from the ATR prism to the aperture.

Abstract: A mapping-measurement apparatus includes a light illumination unit, a photodetector for detecting, through an aperture, reflection light or transmission light from a sample, and adjustable scanning mirrors on the illumination and detection sides of the sample, each mirror having two independent rotational axes about which they can be independently rotated by a controller. The aperture restricts light incident on the photodetector from a predetermined portion of the sample surface.

Abstract: A high-sensitivity reflection measurement apparatus disposed in an optical path between a light emitter and a detector of an analysis apparatus comprises an incident-side optical element, which bends the optical path of measurement light emitted from the light emitter such that the angle of incidence of the measurement light so emitted with respect to a sample surface under measurement ranges from 70° inclusive to 90° exclusive with respect to the direction perpendicular to the sample surface under measurement. The measurement light is transmitted as linearly polarized light having a desired oscillation direction, and is incident on the sample surface under measurement. Information related to the measured sample surface is obtained from light reflected from the measured sample surface when the linearly polarized light from the incident-side optical element is incident on the sample surface.

Abstract: An attenuated-total-reflection measurement apparatus 10 of the present invention collects light onto a contact surface between a sample and an ATR prim 14 at an incident angle greater than or equal to a critical angle and measures total-reflection light from the contact surface. The attenuated-total-reflection measurement apparatus 10 comprises: a light-irradiating system 12 for emitting the light which is collected onto the contact surface; a photodetector 18 for detecting the total-reflection light from the contact surface; an aperture 20 for restricting the light which the photodetector 18 detects to only light from a specific measurement site in the contact surface; and a detection-side scanning mirror 22 provided in a light path extending from the ATR prism 14 to the aperture 20. The detection-side scanning mirror 22 is configured to allow the orientation of a reflecting surface thereof to be changed.

Abstract: A high-sensitivity reflection measurement apparatus disposed in an optical path between a light emitter and a detector of an analysis apparatus, the high-sensitivity reflection measurement apparatus comprising an incident-side optical element, wherein the incident-side optical element bends the optical path of measurement light emitted from the light emitter such that the angle of incidence of the measurement light emitted from the light emitter with respect to a sample surface under measurement is a desired angle ranging from 70 degrees inclusive to 90 degrees exclusive with respect to the direction perpendicular to the sample surface under measurement, transmits the measurement light as linearly polarized light having a desired oscillation direction, and makes the linearly polarized light incident on the sample surface under measurement; and information related to the sample surface under measurement is obtained according to light reflected from the sample surface under measurement when the linearly polariz

Abstract: A mapping-measurement apparatus for applying mapping measurement to a predetermined area on a surface of a sample, comprising: a light illumination unit for illuminating the sample with light; a photodetector for detecting, through an aperture, reflection light or transmission light coming from the sample; and a detection-side scanning mirror provided in the optical path from the sample to the aperture. The aperture restricts light to be detected by the photodetector only to light coming from a given measurement portion only on the surface of the sample. The detection-side scanning mirror is structured such that the direction of a reflection plane thereof can be changed. The direction of the reflection plane of the detection-side scanning mirror is changed with respect to the incident direction of the reflection light or the transmission light coming from the sample to change the measurement portion on the surface of the sample where measurement is performed by the photodetector.