Patents by Inventor Norifumi Yoshiwara

Norifumi Yoshiwara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20020184011
    Abstract: With respect to each of codes corresponding to code vectors in a code book stored in a code book storage section 82, an expectation degree storage section 84 stores an expectation degree at which observation is expected when an integrated parameter with respect to a word as a recognition target is inputted. A vector quantization section 81 vector-quantizes the integrated parameter and outputs a series of codes of a code vector which has a shortest distance to the integrated parameter. Further, a chi-square test section 83 makes a chi-square test with use of the series of codes outputted from the vector quantization section 81 and an expectation degree of each code stored in the expectation degree storage section 84, thereby to obtain properness as to whether or not the integrated parameter corresponds to a recognition target. Further, recognition is performed, based on the chi-square test result. As a result of this, recognition can be performed without considering time components which a signal has.
    Type: Application
    Filed: June 10, 2002
    Publication date: December 5, 2002
    Inventors: Tetsujiro Kondo, Norifumi Yoshiwara
  • Patent number: 6449591
    Abstract: With respect to each of codes corresponding to code vectors in a code book stored in a code book storage section, an expectation degree storage section stores an expectation degree at which observation is expected when an integrated parameter with respect to a word as a recognition target is inputted. A vector quantization section vector-quantizes the integrated parameter and outputs a series of codes of a code vector which has a shortest distance to the integrated parameter. Further, a chi-square test section makes a chi-square test with use of the series of codes outputted from the vector quantization section and an expectation degree of each code stored in the expectation degree storage section, thereby to obtain properness as to whether or not the integrated parameter corresponds to a recognition target. Further, recognition is performed, based on the chi-square test result. As a result of this, recognition can be performed without considering time components which a signal has.
    Type: Grant
    Filed: May 31, 2000
    Date of Patent: September 10, 2002
    Assignee: Sony Corporation
    Inventors: Tetsujiro Kondo, Norifumi Yoshiwara