Abstract: A drive device drives a display panel through alternately applying a positive polarity gradation voltage and a negative polarity gradation voltage to the display panel. The drive device includes an amplifier unit for amplifying a voltage applied to an input to obtain an amplified gradation voltage, and a voltage generation unit for generating the positive polarity gradation voltage and the negative polarity gradation voltage according to the amplified gradation voltage. The amplifier unit selects one of the positive polarity gradation voltage and the negative polarity gradation voltage immediately before the amplifier unit switches a gradation reference voltage. The selected gradation voltage has a polarity the same as that of the gradation reference voltage to be applied to the input line after the amplifier unit switches the gradation reference voltage.

Abstract: In a semiconductor circuit, a high frequency level detecting unit detects a level of a high frequency component adjusted with a first adjusting unit, and a first control unit controls a first gain of the adjusting unit according to the level of the high frequency component thus detected. Further, a low frequency level detecting unit detects a level of a low frequency component adjusted with a second adjusting unit. A second control unit controls a second gain according to the level of the high frequency component and the level of the low frequency component thus adjusted, so that a difference between the level of the high frequency component adjusted with the first adjusting unit and the level of the low frequency component adjusted with the second adjusting unit becomes smaller than a specific level determined in advance.

Abstract: A drive device drives a display panel through alternately applying a positive polarity gradation voltage and a negative polarity gradation voltage to the display panel. The drive device includes an amplifier unit for amplifying a voltage applied to an input to obtain an amplified gradation voltage, and a voltage generation unit for generating the positive polarity gradation voltage and the negative polarity gradation voltage according to the amplified gradation voltage. The amplifier unit selects one of the positive polarity gradation voltage and the negative polarity gradation voltage immediately before the amplifier unit switches a gradation reference voltage. The selected gradation voltage has a polarity the same as that of the gradation reference voltage to be applied to the input line after the amplifier unit switches the gradation reference voltage.

Abstract: In a semiconductor circuit, a high frequency level detecting unit detects a level of a high frequency component adjusted with a first adjusting unit, and a first control unit controls a first gain of the adjusting unit according to the level of the high frequency component thus detected. Further, a low frequency level detecting unit detects a level of a low frequency component adjusted with a second adjusting unit. A second control unit controls a second gain according to the level of the high frequency component and the level of the low frequency component thus adjusted, so that a difference between the level of the high frequency component adjusted with the first adjusting unit and the level of the low frequency component adjusted with the second adjusting unit becomes smaller than a specific level determined in advance.

Abstract: The present invention provides an arbitration circuit capable of stable operation regardless of timings for read and write requests. A latch signal of a predetermined pulse width is generated in accordance with a read request signal or a write request signal and supplied to latches. Flip-flops or FFs respectively fetch therein write and read requests produced within the time of the latch signal. The latches respectively output the fetched requests as signals at the same timing. Thus, since the timings for the signals coincide with each other even when the write request and the read request are made at close intervals while the latch signal is being outputted from a latch controller, a write control signal or a read control signal can be stably outputted in accordance with the order of priority defined in advance by a delay unit.

Abstract: The present invention provides an arbitration circuit capable of stable operation regardless of timings for read and write requests. A latch signal of a predetermined pulse width is generated in accordance with a read request signal or a write request signal and supplied to latches. Flip-flops or FFs respectively fetch therein write and read requests produced within the time of the latch signal. The latches respectively output the fetched requests as signals at the same timing. Thus, since the timings for the signals coincide with each other even when the write request and the read request are made at close intervals while the latch signal is being outputted from a latch controller, a write control signal or a read control signal can be stably outputted in accordance with the order of priority defined in advance by a delay unit.

Abstract: A semiconductor memory device includes a redundant memory cell, an electrode and an output circuit. The redundant memory cell is used instead of a memory cell when the memory cell has a defect. The electrode applys with a test signal for setting a test condition from outside in testing the redundant memory cell. The output circuit outputs data read out of the memory cell and the redundant memory cell. When the test signal is applied to the electrode to set the test condition for the redundant memory cell, the output circuit is configured to output data read out of the redundant memory cell at a level different from a signal level of data readout of the memory cell for output.

Abstract: A semiconductor memory device includes a redundant memory cell, an electrode and an output circuit. The redundant memory cell is used instead of a memory cell when the memory cell has a defect. The electrode applys with a test signal for setting a test condition from outside in testing the redundant memory cell. The output circuit outputs data read out of the memory cell and the redundant memory cell. When the test signal is applied to the electrode to set the test condition for the redundant memory cell, the output circuit is configured to output data read out of the redundant memory cell at a level different from a signal level of data readout of the memory cell for output.

Abstract: Switching is provided such that the bit lines between a sense amp and the memory cells connected to the sense amp are put into a non-conducting state during normal operation, and are put into a conducting state during characteristic tests. A control circuit is provided which outputs control signals to control the conducting state of this switching. The control circuit has a signal generation unit and a control signal switching unit. The signal generation unit generates driving signals and the inverted signals of these driving signals in order to drive the control circuit using applied voltages from outside. The control signal switching unit includes a plurality of transmission gates, and outputs control signals according to memory cell select signals and the inverted signals of same, based on the combination of conducting and non-conducting states of the transmission gates, which depend on the supply of driving signals and inverted driving signals.

Abstract: Switching means are provided such that the bit lines between a sense amp and the memory cells connected to the sense amp are put into a non-conducting state during normal operation, and are put into a conducting state during characteristic tests. A control circuit is provided which outputs control signals to control the conducting state of this switching means. The control circuit has a signal generation unit and a control signal switching unit. The signal generation unit generates driving signals and the inverted signals of these driving signals in order to drive the control circuit using applied voltages from outside. The control signal switching unit comprises a plurality of transmission gates, and outputs control signals according to memory cell select signals and the inverted signals of same, based on the combination of conducting and non-conducting states of the transmission gates, which depend on the supply of driving signals and inverted driving signals.

Abstract: A new and improved semiconductor memory that facilitates machining of iterated circuits and solves the problems of the prior art such as the lengthy machining process, the compromised machining accuracy and the considerable time required for device evaluation is provided. A semiconductor memory 10 is provided with a plurality of output circuits 11 and a fuse circuit 12 connected to each of the output circuits. The fuse circuit outputs output signals N1 and N2 to the individual output circuits, the signal levels of which are fixed to either H level or L level depending upon whether or not fuses f1 and f2 in the fuse circuit are disconnected. The output circuits are each provided with an output buffer circuit unit 112 and a pre-driver circuit unit 111 that drives the output buffer circuit unit. The driving capability of the pre-driver circuit unit is determined by the output signal from the fuse circuit.

Abstract: The present invention provides a semiconductor integrated circuit that solves the aforementioned problems. A semiconductor integrated circuit of the present invention has a plurality of memory cells, for respectively storing data, bit line pairs supplied with data read from the memory cells and sense amplifiers for amplifying data supplied to the bit line pairs. The integrated circuit also has first and second data bus driving transistors, and a pair of data buses. The first data bus driver transistors each have a control terminal, for receiving data supplied to one bit line of the bit line pairs, a second terminal connected to a common node, and a third terminal, while the second data bus driver transistors each have a control terminal, for receiving data supplied to the other bit line of the bit line pairs, one terminal connected to the common node, and a third terminal.

Abstract: A synchronous semiconductor memory device which prevents to misread due to the parasitic capacitance is disclosed. A synchronous semiconductor memory device of the present invention comprises memory cells for storing data therein, sense amplifiers coupled to the memory cells and pairs of data lines coupled to the sense amplifiers. The data lines extend to one direction so that the data lines are substantially parallel to each other. The pairs of data lines include first pairs of data lines and second pairs of data lines located between the first pairs of data lines. Each of the second pairs has a cross point at which each of the data lines of the pair crosses each other.

Abstract: An output buffer circuit comprises an input terminal for receiving an input signal, an output circuit coupled to a first node for outputting an output signal in response to a potential level appeared on the first node and a bootstrap circuit coupled between the first node and the input terminal. The bootstrap circuit comprises a delay circuit for delaying the input signal to provide a delayed input signal, a first transistor for receiving a signal inverted from the input signal, a second transistor coupled for receiving the delayed input signal and controlling a the first transistor, a third transistor connected in parallel to the second transistor, a fourth transistor coupled a gate of the third transistor for receiving the input signal and a charge circuit coupled between the delay circuit and the first node for supplying an electric charge to the first node. The charge circuit is activated in response to the potential level appeared on the first node and the delayed input signal.

Abstract: A semiconductor memory device according to the present invention comprises a first and second nodes, a first power supply for supplying a supply power potential to the first node, a memory cell for storing data therein; a bit line connected to the memory cell, a sense amplifier connected to the second node, for amplifying a potential of the bit line; a switching circuit connected between the first and second nodes, for coupling the first node with second node in response to a first control signal and substantial disconnecting the first node from the second node in response to a second control signal, a detecting circuit for detecting a potential of the second node and outputting a detection signal when the potential of second node is substantialy equal to the supply power potential, a control circuit applied an address signal having a first or second logic level thereto, for outputting the first control signal in response to the address signal being the first logic level and outputting the second control sign